Abstract Hillock formation as a result of heating uncapped polycrystalline silicon layers can be avoided by first implanting the uncapped poly layers with silicon, oxygen, or nitrogen prior to heating. Equivalent mono-atomic oxygen or nitrogen doses in the range of about 10 15 to about 5×10 16 ions/cm 2 at energies in the range 10-50 keV are useful with good results being obtained with equivalent oxygen doses of 2×10 15 ions/cm 2 at 30 keV. When polysilicon layers with this oxygen implant are heated to about 1150 degrees C., a temperature which would ordinarily produce pronounced hillock formation in un-capped, un-treated poly layers, it is found that hillock formation is suppressed. The implanted oxygen concentrations are far below what is required to produce a separate oxide layer or phase. Some effect on poly layer sheet resistance is observed for implanted oxygen but the implanted layers have sheet resistances within a factor of two of those without the oxygen implants.
A method for preventing hillock formation in polycrystalline semiconductor layers comprising: providing a substrate having thereon a polycrystalline semiconductor layer with an exposed surface; implanting oxygen into said exposed surface only to a predetermined depth and dose in the range about 10 15 oxygen ions/cm 2 to 5×10 16 oxygen ions/cm 2 at energy in the range about 10-50 keV, O + equivalent, without implanting oxygen deeper into said layer than said predetermined depth; and thereafter heating said layer.
Claim 2
Independent Claim
79 words
A method for preventing hillock formation in polycrystalline semiconductor layers comprising: providing a substrate having thereon a polycrystalline semiconductor layer with an exposed surface; implanting oxygen into said exposed surface only to a predetermined depth and dose in the range about 10 15 oxygen ions/cm 2 to 5×10 16 oxygen ions/cm 2 at energy in the range about 10-50 keV, O + equivalent, without implanting oxygen deeper into said layer than said predetermined depth; and thereafter heating said layer.
Claim 3
Dependent Claim
44 words
The method of claim 1 wherein said implanting step comprises implanting oxygen only to said predetermined depth and dose in the range about 2×10 15 ions/cm 2 to about 10 16 ions/cm 2 at energies in the range about 20-40 keV, O + equivalent.
Claim 4
Independent Claim
84 words
A method for preventing hillock formation in polycrystalline semiconductor layers comprising: providing a substrate having thereon a polycrystalline semiconductor layer with an exposed surface; implanting oxygen into said exposed surface only in a near surface region of said polycrystalline layer corresponding to an implant energy in the range about 10-50 keV, O + equivalent, and to a peak concentration within the polycrystalline semiconductor layer in the range of about 7×10 19 atoms/cm 3 to 3×10 20 atoms/cm 3 ; and thereafter heating said layer.
Claim 5
Independent Claim
84 words
A method for preventing hillock formation in polycrystalline semiconductor layers comprising: providing a substrate having thereon a polycrystalline semiconductor layer with an exposed surface; implanting oxygen into said exposed surface only in a near surface region of said polycrystalline layer corresponding to an implant energy in the range about 10-50 keV, O + equivalent, and to a peak concentration within the polycrystalline semiconductor layer in the range of about 7×10 19 atoms/cm 3 to 3×10 20 atoms/cm 3 ; and thereafter heating said layer.