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US4171997A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of producing polycrystalline silicon components, particularly solar elements

Assignee: BBC Brown Boveri AG Germany
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Filing: 1978-05-02
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Granted: 1979-10-23
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Expires: 1998-05-02
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Abstract

Abstract A method of producing semiconductor components, particularly solar elements, in which a P- or N-semiconductor chip is subjected to an oxidation step prior to formation of the device PN junction, such that the external surface and internal grain boundaries of the wafer are covered by a passivating oxide layer. Thereafter, the oxide layer on at least a portion of the semiconductor chip is removed, and at least one PN junction is formed in the chip.

Inventors

  • 👤 Horst Irmler

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 12:34
CPC Classifications
H; H10; H10F; H10F10/00; H10F10/10; H10F10/14; H10D; H10D62/00; H10D62/40; H10P; H10P32/00; H10P32/30; H10P32/302; H10P95/00; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02E10/546; Y02E10/547; Y10; Y10S; Y10S438/00; Y10S438/914; Y10S438/92; Y10S438/922

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 138 words
In a method for producing semiconductor components, and in particular solar elements, wherein at least two layers of different conductivity types and a corresponding PN junction are formed in a P- or N-conducting semiconductor chip, the improvement comprising: subjecting said semiconductor chip to an oxidation at a temperature of 900° to 1150° C. prior to forming the PN junction such that the external surface and internal grain boundaries of said chip are covered with an oxide layer; removing partially the oxide layer from said external surface of said chip while the oxide layers at said grain boundaries are preserved intact; and, forming at least one PN junction in the semiconductor chip; wherein a portion of said oxide layer is retained at the edges of at least one external surface to cover at least one PN junction formed thereunder.
Claim 2
Dependent Claim 138 words
In a method for producing semiconductor components, and in particular solar elements, wherein at least two layers of different conductivity types and a corresponding PN junction are formed in a P- or N-conducting semiconductor chip, the improvement comprising: subjecting said semiconductor chip to an oxidation at a temperature of 900° to 1150° C. prior to forming the PN junction such that the external surface and internal grain boundaries of said chip are covered with an oxide layer; removing partially the oxide layer from said external surface of said chip while the oxide layers at said grain boundaries are preserved intact; and, forming at least one PN junction in the semiconductor chip; wherein a portion of said oxide layer is retained at the edges of at least one external surface to cover at least one PN junction formed thereunder.
Claim 3
Dependent Claim 36 words
A method according to claim 1, wherein said step of forming at least one PN junction comprises: forming a P + , weak N and N + junction layer sequence to serve as a PSN diode.

References Cited (Backward Citations)

DE1564935C3 Cited
US3649383A Cited
US4019195A Cited
US3900943A Cited
US3953876A Cited
DE2609051A1 Cited
US4062038A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1982-10-22 1983-04-23 1983-10-23 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1986-10-22 1987-04-23 1987-10-23 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1990-10-22 1991-04-23 1991-10-23 $7700.00 Window Closed / Lapsed

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