Non-volatile memory circuit

Claim 2

A non-volatile memory circuit having a power source and a high voltage application terminal for writing data, comprising: non-volatile memory means coupled between the power source and the high voltage application terminal for storing data wherein the non-volatile memory means includes at least one memory device and switch means for permitting selective writing of data into each memory device; voltage limiting means for limiting the voltage applied to the non-volatile memory means, coupled between the power source and the high voltage application terminal; and current limiting means for limiting the current applied to the non-volatile memory means, coupled between the high voltage application terminal and the non-volatile memory means; whereby the non-volatile memory means is protected from erroneous writing of data from outside noise and static noise.

Claim 3

The non-volatile memory circuit of claim 1 wherein the non-volatile memory means includes at least one memory device and switch means for permitting selective writing of data into and erasing of data from each memory device.

Claim 4

The non-volatile memory circuit of claim 2 wherein each memory device is a double-layer gate transistor.

Claim 5

The non-volatile memory circuit of claim 2 wherein the switch means includes a transistor switch for each memory device.

Claim 6

The non-volatile memory circuit of claim 1 wherein each of the memory devices is a floating-gate avalanche injection MOS device coupled between the high voltage application terminal and the switch means.

Claim 7

The non-volatile memory circuit of claim 1 wherein the switch means includes a transistor switch for each memory device.

Claim 8

The non-volatile memory circuit of claim 1 wherein the voltage limiting means includes at least one diode.

Claim 9

The non-volatile memory circuit of claim 7 wherein the voltage limiting means further includes at least one capacitor in parallel with one of said diodes.

Claim 10

The non-volatile memory circuit of claim 8 and further including at least one high break-down voltage transistor as said current limiting means.

Claim 11

A non-volatile memory circuit having a power source and a high voltage application terminal for writing data, comprising: non-volatile memory means coupled between the power source and the high voltage application terminal for storing data; voltage limiting means for limiting the voltage applied to the non-volatile memory means, coupled between the power source and the high voltage application terminal; and current limiting means for limiting the current applied to the non-volatile memory means, coupled between the high voltage application terminal and the non-volatile memory means; whereby the non-volatile memory means is protected from erroneous writing of data from outside noise and static noise, wherein the voltage limiting means includes at least one diode and at least one capacitor in parallel with one of said diodes and further including at least one high break-down voltage transistor as said current limiting means and further including at least two series connected high break-down voltage transistors and a capacitor coupled between one of the source and drain of each said high break-down transistor and said power source.

Claim 12

A non-volatile memory circuit having a power source and a high voltage application terminal for writing data, comprising: non-volatile memory means coupled between the power source and the high voltage application terminal for storing data; voltage limiting means for limiting the voltage applied to the non-volatile memory means, coupled between the power source and the high voltage application terminal; and current limiting means for limiting the current applied to the non-volatile memory means, coupled between the high voltage application terminal and the non-volatile memory means; whereby the non-volatile memory means is protected from erroneous writing of data from outside noise and static noise, wherein the voltage limiting means includes at least one diode and at least one capacitor in parallel with one of said diodes and further including at least one high break-down voltage transistor as said current limiting means and further including at least two series connected high break-down voltage transistors and a capacitor coupled between one of the source and drain of each said high break-down transistor and said power source.

Claim 13

The non-volatile memory circuit of claim 1 wherein the voltage limiting means includes a transistor adapted to have a selected break-down voltage for limiting voltage applied to the memory means.

Claim 14

The non-volatile memory circuit of claim 1 wherein the voltage limiting means includes at least one capacitor.

Claim 15

The non-volatile memory circuit of claim 1 wherein the current limiting means includes at least one resistor.

Claim 16

The non-volatile memory circuit of claim 1 wherein the current limiting means includes the break-down voltage of the drain-substrate junction of at least one transistor in which the gate and drain electrodes are tied together.

Claim 17

The non-volatile memory circuit of claim 1 wherein the voltage limiting means include a high break-down voltage transistor adapted upon break-down at a selected voltage above the desired voltage of the high voltage application terminal to prevent application of voltages higher than said selected voltage to the memory means.

Claim 18

The non-volatile memory circuit of claim 1 wherein the current limiting means includes at least one inductor.

Claim 19

The non-volatile memory circuit of claim 1 wherein the current limiting means includes at least one inductor and at least one resistor in series.

Claim 20

A non-volatile memory circuit having a power source and a high voltage application terminal for writing data, comprising: non-volatile memory means coupled between the power source and the high voltage application terminal for storing data; voltage limiting means for limiting the voltage applied to the non-volatile memory means, coupled between the power source and the high voltage application terminal; and current limiting means for limiting the current applied to the non-volatile memory means, coupled between the high voltage application terminal and the non-volatile memory means, wherein the current limiting means includes at least one inductor and at least one resistor in series wherein the resistor and inductor are respectively formed in a P - well and a parasitic inductance in integrated wiring of the circuit; whereby the non-volatile memory means is protected from erroneous writing of data from outside noise and static noise.

Claim 21

A non-volatile memory circuit having a power source and a high voltage application terminal for writing data, comprising: non-volatile memory means coupled between the power source and the high voltage application terminal for storing data; voltage limiting means for limiting the voltage applied to the non-volatile memory means, coupled between the power source and the high voltage application terminal; and current limiting means for limiting the current applied to the non-volatile memory means, coupled between the high voltage application terminal and the non-volatile memory means, wherein the current limiting means includes at least one inductor and at least one resistor in series wherein the resistor and inductor are respectively formed in a P - well and a parasitic inductance in integrated wiring of the circuit; whereby the non-volatile memory means is protected from erroneous writing of data from outside noise and static noise.

Claim 22

The non-volatile memory circuit of claim 18, wherein the voltage limiting means includes at least one capacitor to define a low-pass filter with said resistor and inductor.

Claim 23

The non-volatile memory circuit of claim 19, and including at least two of said low-pass filters.

Claim 24

A non-volatile memory circuit having a power source and a high voltage application terminal for writing data, comprising: non-volatile memory means coupled between the power source and the high voltage application terminal for storing data; voltage limiting means for limiting the voltage applied to the non-volatile memory means, coupled between the power source and the high voltage application terminal; and current limiting means for limiting the current applied to the non-volatile memory means, coupled between the high voltage application terminal and the non-volatile memory means, wherein the current limiting means includes two transistors of like conductivity type, one of the source and drain and the gate electrodes of the first transistor and one of the source and drain electrode of the second transistor being coupled to the high voltage application terminal and the gate and the other of the source and drain electrodes of the second transistor and the other of the source and drain electrode of the first transistor being coupled to the non-volatile memory means; whereby the non-volatile memory means is protected from erroneous writing of data from outside noise and static noise.

Claim 25

A non-volatile memory circuit having a power source and a high voltage application terminal for writing data, comprising: non-volatile memory means coupled between the power source and the high voltage application terminal for storing data; voltage limiting means for limiting the voltage applied to the non-volatile memory means, coupled between the power source and the high voltage application terminal; and current limiting means for limiting the current applied to the non-volatile memory means, coupled between the high voltage application terminal and the non-volatile memory means, wherein the current limiting means includes two transistors of like conductivity type, one of the source and drain and the gate electrodes of the first transistor and one of the source and drain electrode of the second transistor being coupled to the high voltage application terminal and the gate and the other of the source and drain electrodes of the second transistor and the other of the source and drain electrode of the first transistor being coupled to the non-volatile memory means; whereby the non-volatile memory means is protected from erroneous writing of data from outside noise and static noise.

Claim 26

The non-volatile memory circuit of claim 21, wherein the voltage limiting means includes at least one diode.

Claim 27

A non-volatile memory circuit having a power source and a high voltage application terminal for writing data, comprising: non-volatile memory means coupled between the power source and the high voltage application terminal for storing data; voltage limiting means for limiting the voltage applied to the non-volatile memory means, coupled between the power source and the high voltage application terminal; and current limiting means for limiting the current applied to the non-volatile memory means, coupled between the high voltage application terminal and the non-volatile memory means, wherein the current limiting means includes a resistor and a capacitor in series between the power source and the high voltage application terminal, an inverter, the input of the inverter being coupled to a point between the resistor and the capacitor, a pair of transistors of opposite conductivity type coupled with their respective source-drain paths in parallel between the high voltage application terminal and the non-volatile memory means, the gate electrode of one of the transistors being coupled to the point between the resistor and the capacitor and the gate electrode of the other transistor being coupled to the output of the inverter wherein the conductance of the transistors as a current limiting means is controlled using the resistor-capacitor time constant circuit; whereby the non-volatile memory means is protected from erroneous writing of data from outside noise and static noise.

Claim 28

A non-volatile memory circuit having a power source and a high voltage application terminal for writing data, comprising: non-volatile memory means coupled between the power source and the high voltage application terminal for storing data; voltage limiting means for limiting the voltage applied to the non-volatile memory means, coupled between the power source and the high voltage application terminal; and current limiting means for limiting the current applied to the non-volatile memory means, coupled between the high voltage application terminal and the non-volatile memory means, wherein the current limiting means includes a resistor and a capacitor in series between the power source and the high voltage application terminal, an inverter, the input of the inverter being coupled to a point between the resistor and the capacitor, a pair of transistors of opposite conductivity type coupled with their respective source-drain paths in parallel between the high voltage application terminal and the non-volatile memory means, the gate electrode of one of the transistors being coupled to the point between the resistor and the capacitor and the gate electrode of the other transistor being coupled to the output of the inverter wherein the conductance of the transistors as a current limiting means is controlled using the resistor-capacitor time constant circuit; whereby the non-volatile memory means is protected from erroneous writing of data from outside noise and static noise.

Claim 29

The non-volatile memory circuit of claim 23, wherein the time constant of the resistor-capacitor circuit is selected to be larger than the width of pulses of noise to prevent the application of such pulses to the memory means.

Claim 30

The non-volatile memory circuit of claim 24, wherein the voltage limiting means includes a transistor adapted to have a selected break-down voltage for limiting the voltage applied to the memory means.

Claim 31

The non-volatile memory circuit of claim 23 wherein the voltage limiting means includes at least one diode.

Claim 32

The non-volatile memory circuit of claim 23, wherein the voltage limiting means includes a transistor adapted to have a selected break-down voltage for limiting the voltage applied to the memory means.

Claim 33

The non-volatile memory circuit of claim 1, wherein the current and voltage limiting means are integrated on the same chip as the non-volatile memory means.

Claim 34

The non-volatile memory circuit of claim 28, wherein the circuit is integrated on the same chip as the integrated circuit of a watch.