Patent US2083264A successfully refreshed from Google Patents.
Patent US4730160A successfully refreshed from Google Patents.
US4730160A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Programmable thermal emulator test die
Assignee: Frontgrade Colorado Springs LLC
•
Filing: 1986-03-20
•
Granted: 1988-03-08
•
Expires: 2006-03-20
Abstract
Abstract A novel test die for emulating the thermal characteristics of functional product dies includes a plurality of concentric emulator ring configurations fabricated about the die center, each having a plurality of heating resistors approximately forming a rectangle, a plurality of sense diodes located in proximity to the heating resistors and a plurality of hot spot resistors located in proximity to both the heating resistors and the sense diodes. Metallic interconnections are formed on the die which selectively provide each of the heating resistors and hot spot resistors with excitation signals and present signals from the sense diodes indicative of the voltage thereacross.
Inventors
- 👤 Michael D. Cusack
- 👤 Christopher A. Freymuth
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 06:04
CPC Classifications
G; G01; G01N; G01N25/00; G01N25/18
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
218 words
A programmable die for simulating the thermal characteristics of a given product die, comprising: a die having a plurality of bond pads arrayed along the perimeter thereof; a plurality of heating resistor groups, each group including one or more linear resistive elements, said plurality of resistor groups being disposed in a lesser plurality of generally concentric rings on a major surface of said die; a plurality of sense diodes formed in said die surface at a plurality of locations in proximity to said heating resistor groups; a plurality of hot spot resistors formed in said die surface at another plurality of locations in proximity to said heating resistor groups and said sense diodes; and interconnection array, having a plurality of electrical signal conductors disposed on said die major surface, each connected between a related one of said bond pads and, alternately, to one of said heating resistor groups, said sense diodes, and said hot spot resistors, whereby said array conducts electrical signals applied to said bond pads to individual ones of said heating resistor groups, said sense diodes, and said hot spot resistors, whereby said heating resistors and said hot spot resistors provide, when excited, an actual surface temperature value for said die, and wherein said sense diodes each provide a signal indicative of said actual surface temperature.
Claim 2
Dependent Claim
218 words
A programmable die for simulating the thermal characteristics of a given product die, comprising: a die having a plurality of bond pads arrayed along the perimeter thereof; a plurality of heating resistor groups, each group including one or more linear resistive elements, said plurality of resistor groups being disposed in a lesser plurality of generally concentric rings on a major surface of said die; a plurality of sense diodes formed in said die surface at a plurality of locations in proximity to said heating resistor groups; a plurality of hot spot resistors formed in said die surface at another plurality of locations in proximity to said heating resistor groups and said sense diodes; and interconnection array, having a plurality of electrical signal conductors disposed on said die major surface, each connected between a related one of said bond pads and, alternately, to one of said heating resistor groups, said sense diodes, and said hot spot resistors, whereby said array conducts electrical signals applied to said bond pads to individual ones of said heating resistor groups, said sense diodes, and said hot spot resistors, whereby said heating resistors and said hot spot resistors provide, when excited, an actual surface temperature value for said die, and wherein said sense diodes each provide a signal indicative of said actual surface temperature.
Claim 3
Dependent Claim
84 words
The programmable die of claim 1, wherein said heating group resistors comprise a plurality of heating resistors disposed adjacent each other on said die surface to provide a substantially continuous heating surface along a respective one of said concentric rings, each said heating resistor in each said heating resistor group being connected through said interconnection array to individual ones of said bond pads, whereby said array further conducts electrical signals applied to said bond pads to individual ones of said plurality of heating resistors.
Claim 4
Dependent Claim
59 words
The programmable die of claim 2, wherein said plurality of sense diodes are each connected, alternately, to individual ones of said heating resistors, and to said hot spot resistors, for providing sense signals indicative of the magnitude of said electrical signals applied through said bond pads to the respective ones of said heating resistors and said hot spot resistors.
Claim 5
Dependent Claim
18 words
The programmable die of claim 2, wherein said heating resistors and said hot spot resistors comprise polycrystalline silicon.
Claim 6
Dependent Claim
18 words
The programmable die of claim 2, wherein said heating resistors and said hot spot resistors comprise diffused resistors.
Claim 7
Dependent Claim
17 words
The programmable die of claim 2, wherein said interconnection array is wire bonded to said bond pads.
Claim 8
Dependent Claim
20 words
The programmable die of claim 2, wherein said interconnection array is connected to said bond pads by tape automated bonding.
Claim 9
Dependent Claim
20 words
The programmable die of claim 2, wherein said interconnection array is connected to said bond pads by flip chip bonding.
Claim 10
Dependent Claim
40 words
The programmable die of claim 2, wherein the surface comprises N type silicon and wherein each of said sense diodes comprises a P well diffusion, a P+ N type diffusion, and metallization contacting selected portions of said N type diffusion.
References Cited (Backward Citations)
US3781515A
Cited
SU399086A1
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-03-08 | 1991-09-07 | 1992-03-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-03-08 | 1995-09-07 | 1996-03-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-03-08 | 1999-09-07 | 2000-03-08 | $7700.00 | Window Closed / Lapsed |