Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
177 words
A system for programming an EPROM including at least one bit line having a parasitic capacitance and a plurality of memory cell MOS transistors each having a gate and a pair of source/drain regions one of which is commonly connected to said bit line, said system comprising: switching means responsive to a first control signal for connecting a programming voltage to said bit line for a first predetermined time period for carrying out programming of a selected MOS transistor; and applying means for selectively applying said programming voltage to a selected one of said plurality of memory cell MOS transistors for said first predetermined time period, to thereby cause a charge to be stored in said parasitic capacitance of said bit line, and for a second predetermined time period immediately following said first predetermined time period, to thereby cause said charge stored in said parasitic capacitance of said bit line during said first predetermined time period to be discharged through said selected one of said plurality of memory cell MOS transistors during said second predetermined time period.
Claim 2
Independent Claim
177 words
A system for programming an EPROM including at least one bit line having a parasitic capacitance and a plurality of memory cell MOS transistors each having a gate and a pair of source/drain regions one of which is commonly connected to said bit line, said system comprising: switching means responsive to a first control signal for connecting a programming voltage to said bit line for a first predetermined time period for carrying out programming of a selected MOS transistor; and applying means for selectively applying said programming voltage to a selected one of said plurality of memory cell MOS transistors for said first predetermined time period, to thereby cause a charge to be stored in said parasitic capacitance of said bit line, and for a second predetermined time period immediately following said first predetermined time period, to thereby cause said charge stored in said parasitic capacitance of said bit line during said first predetermined time period to be discharged through said selected one of said plurality of memory cell MOS transistors during said second predetermined time period.
Claim 3
Dependent Claim
64 words
The system of claim 1 wherein said applying means includes an X-decoder and a plurality of first driver circuits each connected between said X-decoder and the corresponding one of said plurality of memory cell MOS transistors, each of said first driver circuits receiving a supply voltage whose level changes between first and second levels in accordance with the state of a second control signal.
Claim 4
Dependent Claim
27 words
The system of claim 2 wherein said first level is at the level of said programming voltage and said second level is at a higher level voltage.
Claim 5
Dependent Claim
32 words
The system of claim 3 further comprising a second driver circuit connected to said switching means, whereby said first control signal is supplied to said switching means through said second driver circuit.
Claim 6
Dependent Claim
16 words
The system of claim 4 wherein said first and second driver circuits are identical in structure.
Claim 7
Dependent Claim
76 words
The system of claim 5 wherein each of said first and second driver circuits includes a CMOS inverter having an input terminal and output terminal and connected between said supply voltage and a reference voltage, and a first conductivity MOS transistor having its first source/drain region connected to said supply voltage, its second drain/source region connected to the input terminal of samd CMOS inverter and its gate connected to the output terminal of said CMOS inverter.
Claim 8
Dependent Claim
51 words
The system of claim 6 wherein each of said first and second driver circuits further comprises a second conductivity MOS transistor which is connected between said input terminal of said CMOS inverter and an input terminal of said driver circuit and which has its gate connected to said high level voltage.
Claim 9
Dependent Claim
42 words
The system of claim 1 wherein said switching means includes a MOS transistor having its first source/drain region connected to said programming voltage, its second source/drain region connected to said bit line, and its gate connected to receive said first control signal.
Claim 10
Independent Claim
205 words
A method for programming an EPROM including at least one bit line having a parasitic capacitance, a plurality of memory cell MOS transistors each of which has a drain, a source, and a gate and has its drain commonly connected to said bit line, a switching transistor for selectively applying a first predetermined voltage to said bit line, and selecting means for selecting one of said plurality of memory cell MOS transistors for programming, said method comprising the steps of: selecting one of said plurality of memory cell MOS transistors by applying a second predetermined voltage to the gate of said selected transistor while at the same time applying said first predetermined voltage to said bit line through said switching transistor, to thereby carry out programming of said selected transistor, wherein a charge is stored in said parasitic capacitance of said bit line; and continuously applying said second predetermined voltage to the gate of said selected transistor for a predetermined time period after termination of application of said first predetermined voltage to said bit line through said switching transistor, to thereby allow said charge stored in said parasitic capacitance of said bit line to be discharged through said selected transistor during said predetermined time period.
Claim 11
Independent Claim
205 words
A method for programming an EPROM including at least one bit line having a parasitic capacitance, a plurality of memory cell MOS transistors each of which has a drain, a source, and a gate and has its drain commonly connected to said bit line, a switching transistor for selectively applying a first predetermined voltage to said bit line, and selecting means for selecting one of said plurality of memory cell MOS transistors for programming, said method comprising the steps of: selecting one of said plurality of memory cell MOS transistors by applying a second predetermined voltage to the gate of said selected transistor while at the same time applying said first predetermined voltage to said bit line through said switching transistor, to thereby carry out programming of said selected transistor, wherein a charge is stored in said parasitic capacitance of said bit line; and continuously applying said second predetermined voltage to the gate of said selected transistor for a predetermined time period after termination of application of said first predetermined voltage to said bit line through said switching transistor, to thereby allow said charge stored in said parasitic capacitance of said bit line to be discharged through said selected transistor during said predetermined time period.
Claim 12
Dependent Claim
17 words
The method of claim 9 wherein said first and second predetermined voltages are at the same level.