US4720736A
Expired / Lapsed
US
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Amorphous silicon thin film transistor
Assignee: Sharp Corp
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Filing: 1986-01-22
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Granted: 1988-01-19
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Expires: 2006-01-22
Abstract
Abstract A thin film transistor includes: a gate electrode formed on an insulating substrate; a first insulating film for covering the gate electrode; a first conducting semiconductor film formed on the first insulating film; a second insulating film for covering the entire top surface of the semiconductor film; a pair of second conducting semiconductor layers formed, spaced from each other, in contact with the side surfaces of the semiconductor film; and first and second electrodes formed in contact with the pair of second conducting semiconductor layers, respectively. Current flows only on the sides of the semiconductor film and through the second conducting semiconductor layers.
Inventors
- 👤 Yutaka Takafuji
- 👤 Kohei Kishi
- 👤 Hirohisa Tanaka
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 23:21
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/674; H10D30/6741; C; C23; C23C; C23C14/00; C23C14/02; C23C14/024; C23C14/025; H10D30/6704; H10D30/6713; H10D30/6729; H10D30/673; H10D30/6732; H10D30/6743; H10D30/6746; H10D30/675
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
106 words
A thin film transistor comprising: a gate electrode formed on an insulating substrate, said gate electrode being the only gate electrode of the transistor; a first insulating film formed to cover said gate electrode; a first conducting semiconductor film formed on said first insulating film; a second insulating film disposed on the entire top surface of said first conducting semiconductor film; a pair of second conducting semiconductor layers formed, spaced from each other, in contact with the side surfaces of said semiconductor film and said second insulating film; and first and second electrodes formed in contact only with said pair of second conducting semiconductor layers, respectively.
Claim 2
Dependent Claim
106 words
A thin film transistor comprising: a gate electrode formed on an insulating substrate, said gate electrode being the only gate electrode of the transistor; a first insulating film formed to cover said gate electrode; a first conducting semiconductor film formed on said first insulating film; a second insulating film disposed on the entire top surface of said first conducting semiconductor film; a pair of second conducting semiconductor layers formed, spaced from each other, in contact with the side surfaces of said semiconductor film and said second insulating film; and first and second electrodes formed in contact only with said pair of second conducting semiconductor layers, respectively.
Claim 3
Dependent Claim
18 words
The thin film transistor of claim 1, wherein said first conducting semiconductor film contains non-doped amorphous silicon film.
Claim 4
Dependent Claim
29 words
The thin film transistor of claim 1 wherein said gate electrode is made of a material selected from the group consisting of Ta, Ti, Mo, W, Ni and Cr.
Claim 5
Dependent Claim
19 words
The thin film transistor of claim 1 wherein said second insulating film consists of Si 3 N 4 .
Claim 6
Dependent Claim
17 words
The thin film transistor of claim 1 wherein said second insulating film consists of SiO 2 .
Claim 7
Dependent Claim
28 words
The thin film transistor of claim 1 wherein said first conducting semiconductor film contains an amorphous silicon film lightly doped with respect to said second conducting semiconductor layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-01-18 | 1991-07-20 | 1992-01-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-01-18 | 1995-07-20 | 1996-01-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-01-18 | 1999-07-20 | 2000-01-19 | $7700.00 | Window Closed / Lapsed |