US4716564A
Expired / Lapsed
US
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Method for test generation
Assignee: Tektronix Inc
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Filing: 1985-11-15
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Granted: 1987-12-29
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Expires: 2005-11-15
Abstract
Abstract A method for providing test vectors adapted to test very large scale integrated circuit devices includes the steps of measuring testability employing a test counting procedure to provide a plurality of test count matrices. Sensitivity values are then enumerated by driving individual sensitivity values forwardly and rearwardly through the circuit, starting at the input terminals, until the test counts are accumulated. The enumerations define test vectors capable of testing the actual circuit. If the circuit includes reconvergent fanout loops, then these loops are enumerated first to provide partial solutions adopted during subsequent global enumeration.
Inventors
- 👤 Angelo C. J. Hung
- 👤 Francis C. Wang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 20:18
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3183; G01R31/318371
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
201 words
A method for determining a group of test vectors for testing an integrated circuit network including a plurality of gates interconnected at nodes including input reveal a predetpermined categoriyu of faults in said network, and output terminals of said integrated circuit network to reveal a predetermined category of faults in said network, comprising the steps of: measuring the testability of said integrated circuit network according to a test counting procedure including propagation of sensitivity test counts forwardly from input terminals to a principal output terminal and rearwardly back to said input terminals through gates between said input and output terminals of said network to provides test count matrices for the nodes of said network including said input and output terminals, enumerating the test counts from said matrices by driving individual sensitivity values from test count matrices at said input terminals forwardly to a said output terminal and rearwardly back to said input terminals in a number of successive passes in order to accumulate the test counts described by said matrices at said nodes, and separately storing a set of sensitivity values to which said input terminals are driven for each such pass, each set comprising a test vector for said network.
Claim 2
Independent Claim
201 words
A method for determining a group of test vectors for testing an integrated circuit network including a plurality of gates interconnected at nodes including input reveal a predetpermined categoriyu of faults in said network, and output terminals of said integrated circuit network to reveal a predetermined category of faults in said network, comprising the steps of: measuring the testability of said integrated circuit network according to a test counting procedure including propagation of sensitivity test counts forwardly from input terminals to a principal output terminal and rearwardly back to said input terminals through gates between said input and output terminals of said network to provides test count matrices for the nodes of said network including said input and output terminals, enumerating the test counts from said matrices by driving individual sensitivity values from test count matrices at said input terminals forwardly to a said output terminal and rearwardly back to said input terminals in a number of successive passes in order to accumulate the test counts described by said matrices at said nodes, and separately storing a set of sensitivity values to which said input terminals are driven for each such pass, each set comprising a test vector for said network.
Claim 3
Dependent Claim
53 words
The method according to claim 1 wherein enumerating the test counts includes first locally enumerating sensitivity values for reconvergent fanout loops, wherein said reconvergent fanout loops have fanout loop stems, to determine the sensitivity of the fanout loop stems, and then globally enumerating the sensitivity values for the remainder of said circuit network.
Claim 4
Independent Claim
113 words
A method for determining a group of test vectors for testing an integrated circuit network including a plurality of gates interconnected at nodes including input and output terminals of said integrated circuit network, comprising the steps of: measuring the testability of the circuit network by a test counting procedure to provide test counts for a plurality of nodes in the network, and enumerating individual sensitivity values in a plurality of passes for satisfying said test count, each pass defining an input vector for testing said circuit network, each pass including driving a sensitivity value forwardly and rearwardly through said network according to the logical determination of sensitivities appearing on driven and adjacent leads.
Claim 5
Independent Claim
113 words
A method for determining a group of test vectors for testing an integrated circuit network including a plurality of gates interconnected at nodes including input and output terminals of said integrated circuit network, comprising the steps of: measuring the testability of the circuit network by a test counting procedure to provide test counts for a plurality of nodes in the network, and enumerating individual sensitivity values in a plurality of passes for satisfying said test count, each pass defining an input vector for testing said circuit network, each pass including driving a sensitivity value forwardly and rearwardly through said network according to the logical determination of sensitivities appearing on driven and adjacent leads.
Claim 6
Dependent Claim
23 words
The method according to claim 3 wherein said test counting procedure comprises propagating test values in said network in accordance with known constraints.
Claim 7
Independent Claim
117 words
A method for determining a group of test vectors for an integrated circuit network including a plurality of gates interconnected at nodes including input and output terminals of said integrated circuit network to reveal a predetermined category of faults in said network, wherein testability information including test counts are known for said network, said method comprising: driving individual sensitivity values forwardly in said network from input terminals to an output terminal in accordance with logic determinations, and driving sensitivity and insensitivity values rearwardly in said network in accordance with logic determinations until said test counts are satisfied, sensitivity and insensitivity values on said input terminals as a result of said procedure comprising test vectors for said network.
Claim 8
Independent Claim
117 words
A method for determining a group of test vectors for an integrated circuit network including a plurality of gates interconnected at nodes including input and output terminals of said integrated circuit network to reveal a predetermined category of faults in said network, wherein testability information including test counts are known for said network, said method comprising: driving individual sensitivity values forwardly in said network from input terminals to an output terminal in accordance with logic determinations, and driving sensitivity and insensitivity values rearwardly in said network in accordance with logic determinations until said test counts are satisfied, sensitivity and insensitivity values on said input terminals as a result of said procedure comprising test vectors for said network.
References Cited (Backward Citations)
US4045736A
Cited
US3780277A
Cited
US3961250A
Cited
US4204633A
Cited
US4365334A
Cited
US4601032A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-12-28 | 1991-06-29 | 1991-12-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-12-28 | 1995-06-29 | 1995-12-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-12-28 | 1999-06-29 | 1999-12-29 | $7700.00 | Window Closed / Lapsed |