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US4714911A Expired / Lapsed US ⏱️ 0.0 years remaining

Technique for treating manufactured thick film resistors

Assignee: ADM Tronics Unlimited Inc
•
Filing: 1987-05-11
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Granted: 1987-12-22
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Expires: 2007-05-11
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Abstract

Abstract A technique for treating a thick film resistor subsequent to manufacture to correct its value and at the same time enhance its electrical characteristics, such as its resistance stability. Use is made for this purpose of a generating unit in which a radio-frequency carrier is overmodulated by a sonic signal to produce periodic bursts of radio-frequency energy at a repetition rate determined by the frequency of the signal. Coupled to the unit is an UP probe whose tip when brought into contact with the surface of the resistor and scanned thereacross acts to bring about an increase in its ohmic value. Also coupled to the unit is a DOWN probe from whose tip is projected a corona discharge beam which when directed toward the resistor and scanned thereacross to irradiate the resistor acts to decrease its ohmic value. By first raising the value of the manufactured resistor above the desired target value with the UP probe and then decreasing its value with the DOWN probe until the target value is attained, this treatment serves not only to correct the value of the resistor but also to enhance its electrical characteristics.

Inventors

  • 👤 Alfonso Di Mino
  • 👤 Andre Di Mino

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 23:58
CPC Classifications
H; H01; H01C; H01C17/00; H01C17/22; H01C17/24; H01C17/2404; H03; H03H; H03H3/00; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49082

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 121 words
A technique for enhancing the electrical characteristics of a thick film resistor which is manufactured to tolerances of about ±20% while correcting ohmic value so that its final resistance has a desired target value, said technique comprising the steps of: A. measuring the resistor to determine its manufactured value; B. conducting a heating current through the resistor to cause its resistance to rise to a peak value well above the target value; and C. subjecting the resistor to a corona discharge beam irradiating the body thereof to cause its resistance value to decrease from the peak to the target value whereby the combined effect of heating and irradiation enhances the characteristics of the resistor and imparts thereto the desired final value.
Claim 2
Dependent Claim 121 words
A technique for enhancing the electrical characteristics of a thick film resistor which is manufactured to tolerances of about ±20% while correcting ohmic value so that its final resistance has a desired target value, said technique comprising the steps of: A. measuring the resistor to determine its manufactured value; B. conducting a heating current through the resistor to cause its resistance to rise to a peak value well above the target value; and C. subjecting the resistor to a corona discharge beam irradiating the body thereof to cause its resistance value to decrease from the peak to the target value whereby the combined effect of heating and irradiation enhances the characteristics of the resistor and imparts thereto the desired final value.
Claim 3
Dependent Claim 25 words
A technique as set forth in claim 2, wherein said thick film resistor is produced by an electrically resistive ink printed on a ceramic substrate.
Claim 4
Dependent Claim 27 words
A technique as set forth in claim 2, wherein said resistor has a manufactured value in a range from about 100 ohms to at least one megohm.
Claim 5
Dependent Claim 48 words
A technique as set forth in claim 1, wherein said heating current is derived from the tip of an UP probe which makes contact with the surface of the resistor, to which probe is applied periodic bursts of radio-frequency energy whose repetition rate is at a sonic frequency.
Claim 6
Dependent Claim 49 words
A technique as set forth in claim 4, wherein said corona discharge beam is derived from the tip of the DOWN probe which is brought near the surface of the resistor, to which probe is applied periodic bursts of radio-frequency energy whose repetition rate is at a sonic frequency.

References Cited (Backward Citations)

US3308528A Cited
US3676633A Cited
US3649801A Cited
US4210996A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-12-21 1991-06-22 1991-12-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-12-21 1995-06-22 1995-12-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-12-21 1999-06-22 1999-12-22 $7700.00 Window Closed / Lapsed

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