Ground shield apparatus for giga-hertz test jig

Claim 2

A test jig comprising: a disc of metal having two substantially planar major surfaces; a first substantially coextensive dielectric layer on one surface of the disc, said first dielectric layer having a plurality of signal traces formed on an outer surface of the layer which generally radiate outwardly from a centrally located test device receiving area, and the layer further including metallic ground means on peripheral portions thereof: a second substantially coextensive dielectric layer on an opposite major surface of the disc, said second dielectric layer having a plurality of signal traces and metallic ground means on peripheral portions of said second dielectric layer; a metallic annular member surrounding said disc and dielectric layers having a wall extending in a direction transverse thereto; means for physically and electrically connecting the wall of the annular member to edges of the disc and the metallic ground means on the first and second dielectric layers; a plurality of external connectors mounted in the wall, each connector being coupled to a given trace on one of the dielectric layers; and a ground shield means disposed between signal traces on the dielectric layers for providing electrostatic and electromagnetic isolation.

Claim 3

The jig of claim 1 wherein the signal traces on said first and second dielectric layers are essentially duplicates of each other, with the test device receiving area including means for connecting inner ends of corresponding traces on the first and second dielectric layers together thereby providing two substantially identical pathways which can be coupled to each pin of a test device.

Claim 4

The jig of claim 2 wherein said means for connecting comprises electrically conductive material extending through a hole formed through the dielectric layers and said disc, said hole being configured so as to receive a pin of the test device thereby providinb both mechanical and electrical connection to the jig.

Claim 5

The jig of claim 3 which further comprises: a plurality of plated through holes located on peripheral portions of the jig serving to electrically couple the metallic ground means on the dielectric layers to the disc.

Claim 6

The jig of claim 4 wherein the connectors are staggered about the wall.

Claim 7

The jig of claim 4 wherein said connectors each include a probe portion which extends through the wall, with the end of the probe terminating substantially above an outer end of one of the signal traces, with the connector probe portion and trace end being soldered together.

Claim 8

The test jig of claim 6 wherein said dielectric layers are discs of epoxy/glass laminate material having a dielectric constant of approximately 5.

Claim 9

The test jig of claim 1 wherein said ground shield means comprises narrow strips of metal lying between substantially all of the signal traces on said outer surfaces of the dielectric layers.

Claim 10

The test jig of claim 8 wherein said ground shield means further includes: a plurality of vertically oriented and radially extending metallic blade members, each blade member extending at least partially through said dielectric layers and being electrically coupled to said disc of metal.

Claim 11

The test jig of claim 9 wherein said blade members are provided with extensions which project above the outer surface of at least the first dielectric layer to thereby promote heat dissipation from the test device.

Claim 12

A test jig for testing an integrated circuit device, said jig comprising: a disc of metal having two substantially planar major surfaces; a first substantially coextensive dielectric layer on one surface of the disc, said first dielectric layer having a plurality of signal traces formed on an outer surface thereof which generally radiate outwardly from a centrally located receiving area for the integrated circuit device, said first dielectric layer further including a ground ring of metallic material located on peripheral portions of said outer surface; a metallic annular member having a wall surrounding and extending transverse to said disc and dielectric layer; means for physically and electrically connecting the wall of the annular member to edges of the disc and ground ring on the dielectric layer; a plurality of external connectors mounted in the wall, each connector being coupled to a given trace on the dielectric layer; a plurality of narrow strips of metal disposed on the outer surface of the dielectric layer between each of the signal traces; a plurality of metallic blade members which extend radially outwardly from the centrally located receiving area, the blade members being disposed in a generally vertical direction and having portions thereof extending above the outer surface of the dielectric layer; and means for electrically connecting the blade members to said metallic disc whereby said plurality of strips, ground ring, disc and blades cooperate to substantially reduce electromagnetic and electrostatic interference during testing of the device.

Claim 13

A test jig for testing an integrated circuit device, said jig comprising: a disc of metal having two substantially planar major surfaces; a first substantially coextensive dielectric layer on one surface of the disc, said first dielectric layer having a plurality of signal traces formed on an outer surface thereof which generally radiate outwardly from a centrally located receiving area for the integrated circuit device, said first dielectric layer further including a ground ring of metallic material located on peripheral portions of said outer surface; a metallic annular member having a wall surrounding and extending transverse to said disc and dielectric layer; means for physically and electrically connecting the wall of the annular member to edges of the disc and ground ring on the dielectric layer; a plurality of external connectors mounted in the wall, each connector being coupled to a given trace on the dielectric layer; a plurality of narrow strips of metal disposed on the outer surface of the dielectric layer between each of the signal traces; a plurality of metallic blade members which extend radially outwardly from the centrally located receiving area, the blade members being disposed in a generally vertical direction and having portions thereof extending above the outer surface of the dielectric layer; and means for electrically connecting the blade members to said metallic disc whereby said plurality of strips, ground ring, disc and blades cooperate to substantially reduce electromagnetic and electrostatic interference during testing of the device.