Transistor test fixture

Claim 2

A transistor test fixture for testing transistor means, comprising: housing means having a disc-receiving area; coaxial connector means provided by said housing means adjacent said disc-receiving area; disc means having reference circuit means and data circuit means thereon, said disc means positionable within said disc-receiving area; retaining means provided by said housing means and said disc means for retaining said disc means within said disc-receiving area and to permit said disc means to be removed therefrom; and maintaining means provided by said disc means and said housing means for maintaining said disc means in a selected position so that said reference circuit means or said data circuit means is electrically connected to said coaxial connector means.

Claim 3

A transistor test fixture according to claim 1 wherein said disc means has means for receiving transistor means therein associated with said data circuit means and hold-down means provided by said housing means to hold leads of the transistor means in electrical engagement with said data circuit means when said data circuit means is electrically connected to said coaxial connector means.

Claim 4

A transistor test fixture according to claim 1 wherein said retaining means comprises an aperture in said disc means and spring-biased shaft means in said housing means with said shaft means having beveled surface means on its outer surface.

Claim 5

A transistor test fixture according to claim 3 wherein said shaft means has a beveled hole, spring-biased pin means mounted in said housing means in engagement with said beveled hole and upon inward movement of said pin means, said shaft means is biased within said housing means to permit removal of said disc means from said disc-receiving area.

Claim 6

A transistor test fixture according to claim 1 wherein said maintaining means comprises spring-biased detent means disposed in said housing means and indent area located at selected positions in said disc means.

Claim 7

A transistor test fixture according to claim 1 wherein said reference circuit means comprise through circuit means and short circuit means.

Claim 8

A transistor test fixture for testing transistor means, comprising: housing means having a disc-receiving area; transmission line means provided by said housing means including outer and inner coaxial connector means connected thereto, said inner coaxial connector means being positioned adjacent said disc-receiving area; disc means positionable within said disc-receiving area and including through circuit means, short circuit means and transistor circuit means with which leads of the transistor means are to be engaged; retaining means provided by said housing means and said disc means for retaining said disc means within said disc-receiving area and to permit said disc means to be removed therefrom; maintaining means provided by said housing means and said disc means for maintaining said disc means in one of selected positions so that one of said through circuit means, short circuit means and transistor circuit means is electrically connected to said inner coaxial connector means; and hold-down means provided by said housing means for holding the leads of the transistor means in electrical engagement with said transistor circuit means when said transistor circuit means is electrically connected to said inner coaxial connector means.

Claim 9

A transistor test fixture for testing transistor means, comprising: housing means having a disc-receiving area; transmission line means provided by said housing means including outer and inner coaxial connector means connected thereto, said inner coaxial connector means being positioned adjacent said disc-receiving area; disc means positionable within said disc-receiving area and including through circuit means, short circuit means and transistor circuit means with which leads of the transistor means are to be engaged; retaining means provided by said housing means and said disc means for retaining said disc means within said disc-receiving area and to permit said disc means to be removed therefrom; maintaining means provided by said housing means and said disc means for maintaining said disc means in one of selected positions so that one of said through circuit means, short circuit means and transistor circuit means is electrically connected to said inner coaxial connector means; and hold-down means provided by said housing means for holding the leads of the transistor means in electrical engagement with said transistor circuit means when said transistor circuit means is electrically connected to said inner coaxial connector means.

Claim 10

A transistor test fixture according to claim 7 wherein said hold-down means comprises cover means hingeably connected onto said housing means for covering an opening in said housing means in communication with said disc-receiving area, and dielectric means secured to an inside surface of said cover means for engaging the leads of the transistor means when said cover means is in a closed position.