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Patent US4694154A successfully refreshed from Google Patents.
US4694154A
Expired / Lapsed
US
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Instruments for measuring light pulses clocked at high repetition rate and electron tube devices therefor
Assignee: Hamamatsu Photonics KK
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Filing: 1986-05-29
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Granted: 1987-09-15
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Expires: 2006-05-29
Abstract
Abstract An electron tube device for measuring light pulses generated at a high repetition rate which includes an electron tube, power supply device and deflection voltage generator. The electron tube has a photocathode, focusing electrode, deflection electrodes, slit electrode, dynodes and a collector electrode positioned within an evacuated envelope. The power supply device supplies voltages to the dynodes and to the focusing and slit electrodes, and the deflection voltage generator supplies deflection voltages to the deflection electrodes which successively change in phase with respect to light pulses impinging on the photocathode so that different portions of the light pulses can be successively sampled.
Inventors
- 👤 Yutaka Tsuchiya
- 👤 Musubu Koishi
- 👤 Akira Takeshima
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 17:46
CPC Classifications
H; H01; H01J; H01J31/00; H01J31/08; H01J31/50; H01J31/501; H01J31/502; G; G01; G01J; G01J1/00; G01J1/42
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
162 words
An electron tube device for measuring light pulses generated at a high repetition rate comprising: an electron tube including an evacuated envelope; and a photocathode, a focusing electrode, a pair of deflection electrodes, an electrode having a slit therein extending in a direction perpendicular to an electric field applied between said electrodes, a group of dynodes for multiplying electrons passing through said slit and a collector electrode aligned within said envelope; a power supply device for supplying voltages to said focusing electrode, slit electrode and said dynodes, the voltage applied to said focusing electrode being higher than that applied to said photocathode and the voltages applied to said slit electrode being higher than that applied to said focusing electrode; and a deflection voltage generator coupled to said pair of deflection electrodes for applying deflection voltages thereto, said deflection voltages successively changing in phase with respect to light pulses impinging on said photocathode, whereby different portions of said light pulses are successively sampled.
Claim 2
Dependent Claim
162 words
An electron tube device for measuring light pulses generated at a high repetition rate comprising: an electron tube including an evacuated envelope; and a photocathode, a focusing electrode, a pair of deflection electrodes, an electrode having a slit therein extending in a direction perpendicular to an electric field applied between said electrodes, a group of dynodes for multiplying electrons passing through said slit and a collector electrode aligned within said envelope; a power supply device for supplying voltages to said focusing electrode, slit electrode and said dynodes, the voltage applied to said focusing electrode being higher than that applied to said photocathode and the voltages applied to said slit electrode being higher than that applied to said focusing electrode; and a deflection voltage generator coupled to said pair of deflection electrodes for applying deflection voltages thereto, said deflection voltages successively changing in phase with respect to light pulses impinging on said photocathode, whereby different portions of said light pulses are successively sampled.
Claim 3
Dependent Claim
204 words
An electron tube device for measuring light pulses generated at a high repetition rate comprising: a first electron tube including an evacuated envelope; and a photocathode, a focusing electrode, a pair of deflection electrodes, an electrode having a slit therein extending in a direction perpendicular to an electric field applied between said electrodes and a phosphor layer aligned within said envelope; a second electron tube comprising a secondary electron multiplier having a photocathode, said second electron tube being arranged with respect to said first electron tube so that the photocathode of said secondary electron multiplier faces said phosphor layer; a first electron tube power supply device for supplying voltages to said focusing and slit electrodes, the voltage applied to said focusing electrode being higher than that applied to said photocathode and the voltage applied to said slit electrode being higher than that applied to said focusing electrode; a second electron tube power supply for supplying power to said second electron tube; and a deflection voltage generator coupled to said pair of deflection electrodes for applying deflection voltages thereto, said deflection voltages successively changing in phase with respect to light pulse impinging on said photocathode, whereby different portions of said light pulses are successively sampled.
Claim 4
Dependent Claim
204 words
An electron tube device for measuring light pulses generated at a high repetition rate comprising: a first electron tube including an evacuated envelope; and a photocathode, a focusing electrode, a pair of deflection electrodes, an electrode having a slit therein extending in a direction perpendicular to an electric field applied between said electrodes and a phosphor layer aligned within said envelope; a second electron tube comprising a secondary electron multiplier having a photocathode, said second electron tube being arranged with respect to said first electron tube so that the photocathode of said secondary electron multiplier faces said phosphor layer; a first electron tube power supply device for supplying voltages to said focusing and slit electrodes, the voltage applied to said focusing electrode being higher than that applied to said photocathode and the voltage applied to said slit electrode being higher than that applied to said focusing electrode; a second electron tube power supply for supplying power to said second electron tube; and a deflection voltage generator coupled to said pair of deflection electrodes for applying deflection voltages thereto, said deflection voltages successively changing in phase with respect to light pulse impinging on said photocathode, whereby different portions of said light pulses are successively sampled.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-09-14 | 1991-03-16 | 1991-09-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-09-14 | 1995-03-16 | 1995-09-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-09-14 | 1999-03-16 | 1999-09-15 | $7700.00 | Window Closed / Lapsed |