Patent US4692993A successfully refreshed from Google Patents.
US4692993A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Schottky barrier charge coupled device (CCD) manufacture
Assignee: The AT&T MVPD Group LLC
•
Filing: 1985-10-04
•
Granted: 1987-09-15
•
Expires: 2005-10-04
Abstract
Abstract The specification describes a planar gallium arsenide charge coupled device and process for making same wherein a first series of metal pattern forming steps are performed on the surface of a GaAs semiconductor body to form input, output and bias electrodes of a CCD in a first level or plane of the structure. In a subsequent, second series of metal pattern forming steps, a plurality of charge transfer electrodes are formed between the CCD input and output electrodes, and simultaneously an annular charge isolation electrode is deposited so as to completely surround the input, output, and charge transfer electrodes of the CCD. These electrodes deposited in this second series of metal pattern forming steps lie in a second level or plane of the structure being fabricated. Next, a dielectric mask is formed on the surface of the last named electrodes. Openings ("vias") are formed therein which are aligned with the input, output, charge transfer and charge isolation electrodes. Thereafter, a third series of metal pattern forming steps are utilized to form a plurality of crossover or lead-in electrodes which are deposited in the above openings in the dielectric mask to provide electrical signal and bias coupling to the electrodes formed in the above first and second series of metal pattern forming steps. Thus, by forming the charge isolation electrode simultaneously with the electrodes of the charge coupled device per se, the total number of device fabrication steps are minimized.
Inventors
- 👤 Marion D. Clark
- 👤 C. Lawrence Anderson
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 03:17
CPC Classifications
H; H10; H10D; H10D44/00; H10D44/40; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6326; H10P14/6328; H10W; H10W10/00; H10W10/01; H10W10/021; H10W10/051; H10W10/20; H10W10/50
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
241 words
A process for fabricating a planar charge-coupled device structure which includes the steps of (a) providing a semiconductor body having an outermost channel region suitable for coupling charge between selected locations therein under the control of electrical signals, (b) forming input, output, and bias ohmic contact electrodes at selected locations on said surface channel region and in a first level or plane above said semiconductor body, (c) forming a plurality of selectively spaced charge transfer electrodes between said input and output ohmic contacts and having upper surfaces lying in a second level or plane above said semiconductor body, while simultaneously forming a charge isolation electrode surrounding said input, output and charge transfer electrodes and also lying in said second level or plane, (d) forming an insulating mask atop said input, output, charge transfer and charge isolation electrodes and having openings therein aligned with said input, output, charge transfer and charge isolation electrodes, and (e) depositing a plurality of cross-over or lead-in electrodes in said openings in said insulating mask and having surfaces lying in a third level or plane atop said semiconductor body, whereby said charge isolation electrode is formed simultaneously with the formation of said charge transfer electrodes to thereby enable close control over the spacing between said charge isolation electrode and other electrodes in the same level of metalization and simultaneously minimize the number of levels of metalization within said structure and thereby maximize process yields and device reliability.
Claim 2
Dependent Claim
241 words
A process for fabricating a planar charge-coupled device structure which includes the steps of (a) providing a semiconductor body having an outermost channel region suitable for coupling charge between selected locations therein under the control of electrical signals, (b) forming input, output, and bias ohmic contact electrodes at selected locations on said surface channel region and in a first level or plane above said semiconductor body, (c) forming a plurality of selectively spaced charge transfer electrodes between said input and output ohmic contacts and having upper surfaces lying in a second level or plane above said semiconductor body, while simultaneously forming a charge isolation electrode surrounding said input, output and charge transfer electrodes and also lying in said second level or plane, (d) forming an insulating mask atop said input, output, charge transfer and charge isolation electrodes and having openings therein aligned with said input, output, charge transfer and charge isolation electrodes, and (e) depositing a plurality of cross-over or lead-in electrodes in said openings in said insulating mask and having surfaces lying in a third level or plane atop said semiconductor body, whereby said charge isolation electrode is formed simultaneously with the formation of said charge transfer electrodes to thereby enable close control over the spacing between said charge isolation electrode and other electrodes in the same level of metalization and simultaneously minimize the number of levels of metalization within said structure and thereby maximize process yields and device reliability.
Claim 3
Dependent Claim
66 words
The process defined in claim 1 wherein the formation of input and output electrodes of said device also includes depositing a layer of metalization over said input and output ohmic contacts simultaneously with the formation of said charge transfer and charge isolation electrodes so that said input and output electrodes have surfaces in the same level of metalization as said charge transfer and charge isolation electrodes.
Claim 4
Dependent Claim
81 words
The process defined in claims 1 or 2 above wherein the provision of said semiconductor body includes initially providing a semi-insulating substrate of gallium arsenide and thereafter exposing said substrate to sucessive epitaxial deposition processes to thereby initially form a P type gallium arsenide layer atop said semi-insulating gallium arsenide substrate and thereafter forming an N type gallium arsenide layer atop said P type gallium arsenide layer to thereby form said outermost channel region as part of said N type layer.
Claim 5
Dependent Claim
102 words
The process defined in claims 1 or 2 above wherein the formation of said insulating mask includes plasma depositing a dielectric mask of silicon oxynitride, SiO x N y , where x≃y≃1; the formation of said ohmic contacts in said first layer of metalization includes annealing germanium gold electrodes to the surface of said channel region, and the formation of said second and third levels of metalization includes evaporating patterns of aluminum to form respectively input, output, charge transfer and charge isolation electrodes in said second level of metalization and to form cross-over or lead-in electrodes in said third level of metalization.
References Cited (Backward Citations)
US3700932A
Cited
US3869572A
Cited
US3931674A
Cited
US3909925A
Cited
US4148132A
Cited
US4035906A
Cited
US4179793A
Cited
US4264915A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-09-14 | 1991-03-16 | 1991-09-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-09-14 | 1995-03-16 | 1995-09-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-09-14 | 1999-03-16 | 1999-09-15 | $7700.00 | Window Closed / Lapsed |