Incident illumination apparatus for a microscope

Claim 2

An illumination apparatus for a microscope defining an observation beam path and an object plane disposed in said beam path, the apparatus comprising: first optical means for conducting an illuminating bright-field light beam along a first optical axis for a bright-field illumination of an object; second optical means for conducting an illuminating dark-field light beam along a second optical axis for a dark-field illumination of an object; switching means for switching one of said light beams into said observation beam path and the other one of said light beams out of said observation beam path; bright-field reflector means for reflecting at least one of said illuminating light beams into said observation beam path; said first optical means and said second optical means being separate optical systems and being disposed relative to the microscope so as to cause said axes to intersect each other in the vicinity of said bright-field reflector means; said first optical means including a first light source for supplying said bright-field light beam; and, said second optical means including a second light source for supplying said dark-field light beam; and, said switching means including movable mirror means mounted at the point of intersection of said axes for switching between said bright-field illumination and said dark-field illumination.

Claim 3

The illumination apparatus of claim 1, said first optical means being a Kohler system including an aperture diaphragm and an illuminating field diaphragm both mounted along said first optical axis; and, said second optical means including lens means for imaging said second light source close to the object plane.

Claim 4

The illumination apparatus of claim 1, at least one of said light sources having a light conductor, said light conductor having an end face directed toward said switching means and being configured as a homogeneous secondary light source of increased surface area.

Claim 5

The illumination apparatus of claim 3, the other one of said light sources also having a light conductor configured as a secondary light source, said apparatus further comprising a primary light source for supplying both of said secondary light sources.

Claim 6

An illumination appartus for a microscope defining an observation beam path and an object plane disposed in said beam path, the apparatus comprising: first optical means for conducting an illuminating bright-field light beam along a first optical axis for a bright-field illumination of an object; second optical means for conducting an illuminating dark-field light beam along a second optical axis for a dark-field illumination of an object; switching means for switching one of said light beams into said observation beam path and the other one of said light beams out of said observation beam path; bright-field reflector means for reflecting at least one of said illuminating light beams into said observation beam path; said first optical means and said second optical means being separate optical systems and being disposed relative to the microscope so as to cause said axes to intersect each other in the vicinity of said bright-field reflector means; said first optical means including a first light source for supplying said bright-field light beam; and, said second optical means including a second light source for supplying said dark-field light beam; said first optical system and said second optical system being mounted relative to the microscope so as to cause said axes to inersect at said bright-field reflector; and, said switching means including a movable switching structure for accommodating said bright-field reflector means therein, said switching means further including mirror means mounted in said switching structure, said switching structure being movably mounted for movement between a bright-filed position whereat said bright-field reflector is disposed at the intersection of said axes for reflecting said bright-field beam into said observation beam path and a dark-field position whereat said mirror means reflects said dark-field beam along said observation beam path.

Claim 7

An illumination appartus for a microscope defining an observation beam path and an object plane disposed in said beam path, the apparatus comprising: first optical means for conducting an illuminating bright-field light beam along a first optical axis for a bright-field illumination of an object; second optical means for conducting an illuminating dark-field light beam along a second optical axis for a dark-field illumination of an object; switching means for switching one of said light beams into said observation beam path and the other one of said light beams out of said observation beam path; bright-field reflector means for reflecting at least one of said illuminating light beams into said observation beam path; said first optical means and said second optical means being separate optical systems and being disposed relative to the microscope so as to cause said axes to intersect each other in the vicinity of said bright-field reflector means; said first optical means including a first light source for supplying said bright-field light beam; and, said second optical means including a second light source for supplying said dark-field light beam; said first optical system and said second optical system being mounted relative to the microscope so as to cause said axes to inersect at said bright-field reflector; and, said switching means including a movable switching structure for accommodating said bright-field reflector means therein, said switching means further including mirror means mounted in said switching structure, said switching structure being movably mounted for movement between a bright-filed position whereat said bright-field reflector is disposed at the intersection of said axes for reflecting said bright-field beam into said observation beam path and a dark-field position whereat said mirror means reflects said dark-field beam along said observation beam path.

Claim 8

An illumination apparatus for a microscope defining an observation beam path and an object plane disposed in said beam path, the apparatus comprising: first optical means for conducting an illuminating bright-field light beam along a first optical axis for a bright-field illumination of an object; second optical means for conducting an illuminating dark-field light beam along a second optical axis for a dark-field illumination of an object; switching means for switching one of said light beams into said observation beam path and the other one of said light beams out of said observation beam path; bright-field reflector means for reflecting at least one of said illuminating light beams into said observation beam path; said first optical means and said second optical means being separate optical systems and being disposed relative to the microscope so as to cause said axes to intersect each other in the vicinity of said bright-field reflector means; said first optical means including a first light source for supplying said bright-field light beam; and, said second optical means including a second light source for supplying said dark-field light beam; said bright-field reflector means including stationary reflecting means and a stationary ring reflector disposed in surrounding reltionship to said reflecting means; and, said switching means including mirror means mounted ahead of said bright-field reflector means for movement between a first position whereat said bright-field light beam is directed to said reflecting means and a second position whereat said dark-field light beam is directed to said reflecting means.

Claim 9

An illumination apparatus for a microscope defining an observation beam path and an object plane disposed in said beam path, the apparatus comprising: first optical means for conducting an illuminating bright-field light beam along a first optical axis for a bright-field illumination of an object; second optical means for conducting an illuminating dark-field light beam along a second optical axis for a dark-field illumination of an object; switching means for switching one of said light beams into said observation beam path and the other one of said light beams out of said observation beam path; bright-field reflector means for reflecting at least one of said illuminating light beams into said observation beam path; said first optical means and said second optical means being separate optical systems and being disposed relative to the microscope so as to cause said axes to intersect each other in the vicinity of said bright-field reflector means; said first optical means including a first light source for supplying said bright-field light beam; and, said second optical means including a second light source for supplying said dark-field light beam; said bright-field reflector means including stationary reflecting means and a stationary ring reflector disposed in surrounding reltionship to said reflecting means; and, said switching means including mirror means mounted ahead of said bright-field reflector means for movement between a first position whereat said bright-field light beam is directed to said reflecting means and a second position whereat said dark-field light beam is directed to said reflecting means.

Claim 10

The illumination apparatus of claim 6, said first light source and said second light source both being secondary light sources, the apparatus comprising a primary light source for supplying said secondary light sources; and, regulating means for regulating the luminous density from said primary light source in response to a switch-over from said bright-field illumination to said dark-field illumination.