US4686466A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof
Assignee: Siemens AG
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Filing: 1985-02-27
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Granted: 1987-08-11
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Expires: 2005-02-27
Abstract
Abstract A method for setting voltage resolution in particle beam measuring devices wherein band width of a measured signal processing is modified. In order to set a desired voltage resolution simply, reliably, and with high precision, a signal noise of the measured signal is measured. This signal noise is compared to a desired value for the measured signal resolution, and the band width of the measured signal processing is modified such that the signal noise of the measured signal is less than or equal to the desired value for the measured signal resolution.
Inventors
- 👤 Hans-Peter Feuerbaum
- 👤 Peter Fazekas
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 11:47
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/305; H; H01; H01J; H01J37/00; H01J37/26; H01J37/266
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
98 words
A method for setting voltage resolution in a particle beam measuring apparatus utilizing a particle beam probe and which produces a measured signal, and wherein band width of measured signal processing is modified, comprising steps of: creating a measured signal in a measured signal processing step; measuring signal noise in the measured signal; comparing said signal noise to a desired value for measured signal resolution; and modifying a band width of the measured signal processing such that the signal noise of the measured signal is less than or equal to said desired value for the measured signal resolution.
Claim 2
Independent Claim
98 words
A method for setting voltage resolution in a particle beam measuring apparatus utilizing a particle beam probe and which produces a measured signal, and wherein band width of measured signal processing is modified, comprising steps of: creating a measured signal in a measured signal processing step; measuring signal noise in the measured signal; comparing said signal noise to a desired value for measured signal resolution; and modifying a band width of the measured signal processing such that the signal noise of the measured signal is less than or equal to said desired value for the measured signal resolution.
Claim 3
Dependent Claim
27 words
A method according to claim 1 including a step of varying a pulse-duty factor of the particle beam probe based upon a result of said comparison step.
Claim 4
Dependent Claim
19 words
A method according to claim 1 including the step of varying a probe current of the particle beam probe.
Claim 5
Independent Claim
116 words
An apparatus for setting voltage resolution in a particle beam measuring procedure which produces a measured signal, comprising: particle beam probe means for generating a signal at a measuring location; a measured signal processing means having a specific band width and for producing a measured signal; means for modifying a probe current of said particle beam probe means; means for modifying a pulse-duty factor of said particle beam probe means; signal noise identifier means for measuring a signal noise in the measured signal; and means for comparison of said signal noise to a prescribed value for measured signal resolution and for setting at least one of the following parameters: band width, probe current, and pulse-duty factor.
Claim 6
Independent Claim
116 words
An apparatus for setting voltage resolution in a particle beam measuring procedure which produces a measured signal, comprising: particle beam probe means for generating a signal at a measuring location; a measured signal processing means having a specific band width and for producing a measured signal; means for modifying a probe current of said particle beam probe means; means for modifying a pulse-duty factor of said particle beam probe means; signal noise identifier means for measuring a signal noise in the measured signal; and means for comparison of said signal noise to a prescribed value for measured signal resolution and for setting at least one of the following parameters: band width, probe current, and pulse-duty factor.
Claim 7
Independent Claim
87 words
An apparatus for setting voltage resolution in a particle beam measuring apparatus which produces a measured signal and wherein a band width of measured signal processing is modified, comprising: means for measuring signal noise in the measured signal; means for comparing said signal noise to a desired value for measured signal resolution; and means for modifying a band width of the measured signal processing such that a signal noise of the measured signal is less than or equal to said desired value for the measured signal resolution.
Claim 8
Independent Claim
87 words
An apparatus for setting voltage resolution in a particle beam measuring apparatus which produces a measured signal and wherein a band width of measured signal processing is modified, comprising: means for measuring signal noise in the measured signal; means for comparing said signal noise to a desired value for measured signal resolution; and means for modifying a band width of the measured signal processing such that a signal noise of the measured signal is less than or equal to said desired value for the measured signal resolution.
Claim 9
Independent Claim
81 words
A method for setting voltage resolution in a particle beam measuring apparatus which produces a measuring signal based on a particle beam directed on a specimen, comprising steps of: measuring signal noise in the measuring signal; comparing said signal noise to a desired measured signal voltage resolution value; and modifying at least one of the following parameters: band width in a measuring signal processing step, particle beam probe current, or pulse-duty factor of the particle beam, based upon said comparison step.
Claim 10
Independent Claim
81 words
A method for setting voltage resolution in a particle beam measuring apparatus which produces a measuring signal based on a particle beam directed on a specimen, comprising steps of: measuring signal noise in the measuring signal; comparing said signal noise to a desired measured signal voltage resolution value; and modifying at least one of the following parameters: band width in a measuring signal processing step, particle beam probe current, or pulse-duty factor of the particle beam, based upon said comparison step.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-08-10 | 1991-02-09 | 1991-08-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-08-10 | 1995-02-09 | 1995-08-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-08-10 | 1999-02-09 | 1999-08-11 | $7700.00 | Window Closed / Lapsed |