Method and apparatus for suppressing disturbances in the measurement of signals with a particle probe

Claim 3

The method of claim 1, wherein the step of feeding back the secondary electron reference signal is further defined as: applying the measured secondary electron signal to a device in a feedback circuit to set the operating point of the feedback circuit to a predetermined operating point.

Claim 4

The method of claim 1, wherein the step of detecting secondary electrons and generating a measured secondary electron signal is performed with a scintillator detector followed by a photomultiplier, and further comprising the steps of: sensing whether the measured secondary electron voltage deviates from a predetermined value; and altering the supply voltage of the photomultiplier upon sensing such deviations.

Claim 5

The method of claim 1, wherein the feedback circuit comprises an amplifier, and further comprising the steps of: sensing whether the measured secondary electron signal deviates from a predetermined value; and adjusting the gain of the amplifier upon sensing such deviations.

Claim 6

The method of claim 1, wherein the primary electron beam is controlled by a pulsing system, and further comprising the steps of: sensing whether the measured secondary electron signal deviates from a predetermined value; and adjusting the pulsing system to adjust the pulse width in response to such deviations until such deviations disappear.

Claim 7

The method of claim 1, and further comprising the step of: regulating a reference value for the secondary electron signal with the measured secondary electron signal.

Claim 8

The method of claim 1, and further comprising the step of: subtracting the measured secondary electron signal from a reference value to suppress background noise.

Claim 9

Apparatus for suppressing a disturbance in measuring signals, in which a primary electron beam is directed onto test points of a specimen and secondary electrons are emitted from the specimen and measured as representing signals at those test points, said apparatus comprising: means for applying a known reference voltage to a reference test point to produce a known test signal at the reference test point; beam control means operable to direct a primary electron beam onto the reference test point, at least one time during a reference phase, to cause secondary electron emission; retarding field generator means adjacent the specimen operable to produce a control field; detection means adjacent said retarding field generator means for detecting secondary electrons which permeate the control field, including detecting means and generator means for generating a respective measured secondary electron signal; and feedback means connected between said detection means and said retarding field generator for applying the measured secondary electron signal as a reference signal to control field intensity during measurement of unknown signals at other test points on the specimen during a measuring phase to compensate for operating point shifts due to electron beam fluctuations and specimen containination and maintain a specific operating point.

Claim 10

Apparatus for suppressing a disturbance in measuring signals, in which a primary electron beam is directed onto test points of a specimen and secondary electrons are emitted from the specimen and measured as representing signals at those test points, said apparatus comprising: means for applying a known reference voltage to a reference test point to produce a known test signal at the reference test point; beam control means operable to direct a primary electron beam onto the reference test point, at least one time during a reference phase, to cause secondary electron emission; retarding field generator means adjacent the specimen operable to produce a control field; detection means adjacent said retarding field generator means for detecting secondary electrons which permeate the control field, including detecting means and generator means for generating a respective measured secondary electron signal; and feedback means connected between said detection means and said retarding field generator for applying the measured secondary electron signal as a reference signal to control field intensity during measurement of unknown signals at other test points on the specimen during a measuring phase to compensate for operating point shifts due to electron beam fluctuations and specimen containination and maintain a specific operating point.

Claim 11

The apparatus of claim 8, wherein: said detection means comprises a scintillator detector, a photomultiplier connected to said scintillator detector and an amplifier connected between said photomultiplier and said feedback means.

Claim 12

The apparatus of claim 9, wherein: said beam control means comprises a beam blanking system and a pulse generator connected to and operable to control said beam blanking system to provide a pulsed primary electron beam; and further comprising control means connected between said amplifier and said pulse generator, including comparison means for comparing the measured secondary electron signal with a reference for deviations therebetween, and operable to control said pulse generator to change the pulse width of said primary electron beam until such deviations disappear.

Claim 13

The apparatus of claim 10, wherein said control means comprises: a sample and hold circuit connected between said amplifier and said pulse generator for sampling and temporarily storing the measured secondary electron signal.

Claim 14

The apparatus of claim 9, and further comprising: a voltage supply connected to said photomultiplier; and control means connected between said amplifier and said voltage supply, including comparison means for comparing the measured secondary electron signal with a reference for deviations therebetween, and operable to adjust the voltage supplied to said photomultiplier in response to such deviations.

Claim 15

The apparatus of claim 12, wherein said control means comprises: a sample and hold circuit for sampling and temporarily storing the measured secondary electron signal.

Claim 16

The apparatus of claim 9, wherein said feedback circuit comprises: a further amplifier connected between said detection means and said field generator.

Claim 17

The apparatus of claim 14, and further comprising: a sample and hold circuit connected between said amplifier and said further amplifier, including comparison means for comparing the measured secondary electron signal with respect to a reference value to determine deviations therebetween; and control means connected to said detection means for controlling the gain of said further amplifier.