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US4684884A
Expired / Lapsed
US
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Universal test circuit for integrated circuit packages
Assignee: AG Communication Systems Corp
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Filing: 1985-07-02
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Granted: 1987-08-04
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Expires: 2005-07-02
Abstract
Abstract An integrated circuit which facilitates measurement of various integrated circuit packaging parameters, including atmospheric moisture content, impurity content, water vapor transmission rate of encapsulant, corrosion of metallization, temperature, thermal impedance, and strain sensing. This circuit can be interconnected via both wire bonding and mass bonding, and it functions as a test vehicle for the tape automated bonding process. This circuit includes a plurality of subcircuits arranged in a square array such that the test capabilities of both the complete circuit and each individual subcircuit is identical.
Inventors
- 👤 Ernest E. Soderlund
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 08:05
CPC Classifications
H; H10; H10P; H10P74/00; H10P74/27; H10P74/277; G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2884
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
164 words
A testing arrangement for use in integrated circuit packages, said testing arrangement comprising: testing means effective to facilitate testing of a plurality of integrated circuit packaging parameters; a first plurality of bonding pads connected to said testing means, effective to facilitate connection of said testing means via wire bonding techniques; and a second plurality of bonding pads connected to said first plurality of bonding pads, effective to connect said testing means; a plurality of test circuits, each having a heating element of the same characteristic resistance and each connected to a different portion of said first plurality of bonding pads; said test circuits being arranged in a square array of parallel connected groups of series connected test circuits, wherein the number of parallel connected groups is equal to the number of series connected test circuits in each of said groups; whereby the heating resistance of said testing arrangement is equal to the characteristic resistance of the heating element of each of said test circuits.
Claim 2
Dependent Claim
164 words
A testing arrangement for use in integrated circuit packages, said testing arrangement comprising: testing means effective to facilitate testing of a plurality of integrated circuit packaging parameters; a first plurality of bonding pads connected to said testing means, effective to facilitate connection of said testing means via wire bonding techniques; and a second plurality of bonding pads connected to said first plurality of bonding pads, effective to connect said testing means; a plurality of test circuits, each having a heating element of the same characteristic resistance and each connected to a different portion of said first plurality of bonding pads; said test circuits being arranged in a square array of parallel connected groups of series connected test circuits, wherein the number of parallel connected groups is equal to the number of series connected test circuits in each of said groups; whereby the heating resistance of said testing arrangement is equal to the characteristic resistance of the heating element of each of said test circuits.
Claim 3
Dependent Claim
51 words
A testing arrangement as claimed in claim 1, wherein said test circuit comprises: a temperature sensor; a strain gauge; a corrosion sensor; a leakage current sensor; and a moisture sensor, each of said sensors and said strain gauge, each connected to a different portion of said first plurality of bonding pads.
Claim 4
Dependent Claim
15 words
A test circuit as claimed in claim 2, wherein said heating element comprises a resistor.
Claim 5
Dependent Claim
18 words
A test circuit as claimed in claim 2, wherein said heating element comprises a parallel combination of resistors.
Claim 6
Dependent Claim
15 words
A test circuit as claimed in claim 2, wherein said temperature sensor comprises a transistor.
Claim 7
Dependent Claim
34 words
A test circuit as claimed in claim 2, wherein said strain gauge comprises a piezo-resistive material operated to provide a variable resistance as a function of the degree of strain applied to said piezo-resistor.
Claim 8
Dependent Claim
26 words
A test circuit as claimed in claim 6, wherein said piezo-resistive material comprises a plurality of piezo-resistors connected to each other and oriented in different directions.
Claim 9
Dependent Claim
23 words
A test circuit as claimed in claim 2, wherein said corrosion sensor comprises a strip of metallized material effective for metallization conductivity measurement.
Claim 10
Dependent Claim
20 words
A test circuit as claimed in claim 2, wherein leakage current sensor comprises an interdigitated finger pattern of metallized material.
Claim 11
Dependent Claim
20 words
A test circuit as claimed in claim 2, wherein said moisture sensor comprises an interdigitated finger pattern of metallized material.
Claim 12
Dependent Claim
23 words
A test circuit as claimed in claim 9, wherein said moisture sensor is also comprised of said interdigitated finger pattern of metallized material.
References Cited (Backward Citations)
US4140967A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-08-03 | 1991-02-02 | 1991-08-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-08-03 | 1995-02-02 | 1995-08-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-08-03 | 1999-02-02 | 1999-08-04 | $7700.00 | Window Closed / Lapsed |