Patent US4676827A successfully refreshed from Google Patents.
US4676827A
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US
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Wire for bonding a semiconductor device and process for producing the same
Assignee: Mitsubishi Metal Corp
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Filing: 1986-03-26
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Granted: 1987-06-30
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Expires: 2006-03-26
Abstract
Abstract The present invention eliminates the problems associated with the use of oxygen-free copper and other high-purity copper materials as bonding wires. At least one rare earth element, or at least one element selected from the group consisting of Mg, Ca, Ti, Zr, Hf, Li, Na, K, Rb and Cs, or the combination of at least one rare earth element and at least one elemented selected from the above-specified group is incorporated in high-purity copper as a refining component in an amount of 0.1-100 ppm on a weight basis, and the high-purity copper is subsequently refined by zone melting. The very fine wire drawn from the so refined high-purity copper has the advantage that it can be employed in high-speed ball bonding of a semiconductor chip with a minimum chance of damaging the bonding pad on the chip by the ball forming at the tip of the wire.
Inventors
- 👤 Naoyuki Hosoda
- 👤 Masaki Morikawa
- 👤 Naoki Uchiyama
- 👤 Hideaki Yoshida
- 👤 Toshiaki Ono
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 08:52
CPC Classifications
C; C22; C22C; C22C9/00; C30; C30B; C30B13/00; C30B29/00; C30B29/02; H; H01; H01B; H01B1/00; H01B1/02; H01B1/026; H10; H10W; H10W72/00; H10W72/01; H10W72/015; H10W72/071; H10W72/075; H10W72/07551; H10W72/07555; H10W72/50; H10W72/551; H10W72/552; H10W72/5522; H10W72/5525; H10W72/59; H10W72/90; H10W72/951; H10W72/952; H10W74/00; Y; Y10; Y10T; Y10T428/00; Y10T428/12; Y10T428/12431
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
66 words
A process for producing a very fine wire for use in the bonding of a semiconductor device, said process comprising providing a copper ingot made of high-purity copper containing at least one rare earth metal as a refining component in an amount of 0.1-100 ppm on a weight basis, refining said copper ingot by zone melting and then drawing to form a very fine copper wire.
Claim 2
Dependent Claim
66 words
A process for producing a very fine wire for use in the bonding of a semiconductor device, said process comprising providing a copper ingot made of high-purity copper containing at least one rare earth metal as a refining component in an amount of 0.1-100 ppm on a weight basis, refining said copper ingot by zone melting and then drawing to form a very fine copper wire.
Claim 3
Dependent Claim
75 words
A process for producing a very fine wire for use in the bonding of a semiconductor device, said process comprising providing a copper ingot made of high-purity copper containing 0.1-100 ppm, on a weight basis, of at least one refining component selected from the group consisting of Mg, Ca, Ti, Zr, Hf, Li, Na, K, Rb and Cs, refining said copper ingot by zone melting and then drawing to form a very fine copper wire.
Claim 4
Dependent Claim
75 words
A process for producing a very fine wire for use in the bonding of a semiconductor device, said process comprising providing a copper ingot made of high-purity copper containing 0.1-100 ppm, on a weight basis, of at least one refining component selected from the group consisting of Mg, Ca, Ti, Zr, Hf, Li, Na, K, Rb and Cs, refining said copper ingot by zone melting and then drawing to form a very fine copper wire.
Claim 5
Dependent Claim
89 words
A process for producing a very fine wire for use in the bonding of a semiconductor device, said process comprising providing a copper ingot made of high-purity copper containing 0.1-100 ppm, on a weight basis, of a refining component which is the combination of at least one rare earth element and at least one element selected from the group consisting of Mg, Ca, Ti, Zr, Hf, Li, Ma, K, Rb and Cs, refining said copper ingot by zone melting and then drawing to form a very fine copper wire.
Claim 6
Dependent Claim
89 words
A process for producing a very fine wire for use in the bonding of a semiconductor device, said process comprising providing a copper ingot made of high-purity copper containing 0.1-100 ppm, on a weight basis, of a refining component which is the combination of at least one rare earth element and at least one element selected from the group consisting of Mg, Ca, Ti, Zr, Hf, Li, Ma, K, Rb and Cs, refining said copper ingot by zone melting and then drawing to form a very fine copper wire.
Claim 7
Dependent Claim
105 words
A process for producing a very fine wire for use in the bonding of a semiconductor device, said process comprising providing a copper ingot made of high-purity copper containing 0.1-100 ppm, on a weight basis, of at least one refining component which is selected from the group consisting of Mg, Ca, Ti, Zr, Hf, Li, Na, K, Rb and Cs, refining said copper ingot by zone melting, incorporating in the resulting refined high-purity copper 0.5-3 ppm of at least one selected from the group consisting of rare earth elements and Y as an alloying component and then drawing to form a very fine copper wire.
Claim 8
Dependent Claim
105 words
A process for producing a very fine wire for use in the bonding of a semiconductor device, said process comprising providing a copper ingot made of high-purity copper containing 0.1-100 ppm, on a weight basis, of at least one refining component which is selected from the group consisting of Mg, Ca, Ti, Zr, Hf, Li, Na, K, Rb and Cs, refining said copper ingot by zone melting, incorporating in the resulting refined high-purity copper 0.5-3 ppm of at least one selected from the group consisting of rare earth elements and Y as an alloying component and then drawing to form a very fine copper wire.
Claim 9
Dependent Claim
58 words
A very fine wire for use in the bonding of a semiconductor device which is made of high-purity copper that contains no more than 0.1 ppm of each of S, Se and Te as an incidental impurity, with the total content of these and any other incidental impurities present being held at a level not exceeding 0.3 ppm.
Claim 10
Dependent Claim
58 words
A very fine wire for use in the bonding of a semiconductor device which is made of high-purity copper that contains no more than 0.1 ppm of each of S, Se and Te as an incidental impurity, with the total content of these and any other incidental impurities present being held at a level not exceeding 0.3 ppm.
Claim 11
Dependent Claim
88 words
A very fine wire for use in the bonding of a semiconductor device which is made of high-purity copper that contains 0.5-3 ppm of at least one alloying component selected from the group consisting of a rare earth element and Y, with the balance being Cu and incidental impurities which include no more than 0.2 ppm of S and no more than 0.1 ppm of Se or Te, the total content of these and any other incidental impurities present being held at a level not exceeding 1 ppm.
Claim 12
Dependent Claim
88 words
A very fine wire for use in the bonding of a semiconductor device which is made of high-purity copper that contains 0.5-3 ppm of at least one alloying component selected from the group consisting of a rare earth element and Y, with the balance being Cu and incidental impurities which include no more than 0.2 ppm of S and no more than 0.1 ppm of Se or Te, the total content of these and any other incidental impurities present being held at a level not exceeding 1 ppm.
Claim 13
Dependent Claim
48 words
The process of claim 1 wherein said fine copper wire contains no more than 0.1 ppm of each of S, Se and Te as an incidental impurity, with the total content of these and any other incidental impurities present being held at a level not exceeding 0.3 ppm.
Claim 14
Dependent Claim
48 words
The process of claim 2 wherein said fine copper wire contains no more than 0.1 ppm of each of S, Se and Te as an incidental impurity, with the total content of these and any other incidental impurities present being held at a level not exceeding 0.3 ppm.
Claim 15
Dependent Claim
48 words
The process of claim 3 wherein said fine copper wire contains no more than 0.1 ppm of each of S, Se and Te as an incidental impurity, with the total content of these and any other incidental impurities present being held at a level not exceeding 0.3 ppm.
Claim 16
Dependent Claim
78 words
The process of claim 4 wherein said fine copper wire contains 0.5-3 ppm of at least one alloying component selected from the group consisting of a rare earth element and Y, with the balance being Cu and incidental impurities which include no more than 0.2 ppm of S and no more than 0.1 ppm of Se or Te, the total content of these and any other incidental impurities present being held at a level not exceeding 1 ppm.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-06-29 | 1990-12-29 | 1991-06-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-06-29 | 1994-12-29 | 1995-06-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-06-29 | 1998-12-29 | 1999-06-30 | $7700.00 | Window Closed / Lapsed |