Semiconductor apparatus

Claim 1

A semiconductor device having a first semiconductor junction therein intersecting a surface at which a selected surface current can flow from one side of said first semiconductor junction to another, said device comprising: a semiconductor material body of a first conductivity type at least in a first portion thereof forming a first body portion, but being other than of said first conductivity type in at least one selected region in said first body portion including a first selected region which is of a second conductivity type, said first semiconductor junction separating said first selected region from that part remaining of said first body portion, and said semiconductor material body having a first major surface with (i) said first body portion intersecting said major surface to form a first major surface portion, and (ii) with said first selected region also intersecting said first major surface to form a first selected region surface portion contained in said first major surface portion, such that said first selected region surface portion is separated from that part remaining of said first major surface portion by said first semiconductor junction where said first semiconductor junction intersects said first major surface to thereby form a first semiconductor junction surface intersection peripheral to said first selected region where said first selected region intersects said first major surface; and first and second electrical insulating layers disposed at least in part on said semiconductor material body at said first major surface portion in such a manner that said first electrically insulating layer is directly on and covers a selected portion of said first semiconductor junction surface intersection and said second electrical insulating layer is directly on and substantially covers at least some of those portions remaining of said first semiconductor junction surface intersection, said second electrical insulating layer being a passivating layer which leads to reduced surface current flowing across portions of said first semiconductor junction surface intersection thereunder relative to surface currents flowing across portions of said first semiconductor junction surface intersection under said first electrical insulating layer if a voltage potential difference is maintained between said first selected region and those portions of said first body portion immediately across said first semiconductor junction surface intersection from said first selected region.