Patent US4658277A successfully refreshed from Google Patents.
US4658277A
Expired / Lapsed
US
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Two level charge imaging matrix design with stepped insulator
Assignee: Texas Instruments Inc
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Filing: 1984-05-17
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Granted: 1987-04-14
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Expires: 2004-05-17
Abstract
Abstract The disclosure relates to a charge imaging matrix wherein the floating gate level closest to the substrate is used as a storage gate and the second floating gate level is used as both a field plate and a transfer gate due to the formation of a step in the insulator thereunder which leaves an N-channel in the transfer region when the remainder of the gate is biased to flat band.
Inventors
- 👤 Richard A. Schiebel
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 16:17
CPC Classifications
H; H10; H10F; H10F39/00; H10F39/10; H10F39/12; H10F39/18; H10F39/184; Y; Y10; Y10S; Y10S257/00; Y10S257/917
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
136 words
A charge imaging matrix, comprising: (a) a doped semiconductor substrate; (b) a plurality of diodes in said substrate; (c) a first electrical insulator layer over a surface of said substrate extending over said diodes; (d) a first electrically conductive layer on a predetermined portion of said first insulator layer laterally spaced from said diodes; (e) a stepped second electrical insulator layer having a first region which is thicker than a second region thereof to form said step and disposed over said first electrically conductive layer and said first insulator layer, said stepped layer having said step disposed over an edge of said diodes; (f) a second electrically conductive layer along said step extending at both ends thereof over said first conductive layer and electrically insulated therefrom; and (g) a third insulator over said second conductive layer.
Claim 2
Dependent Claim
136 words
A charge imaging matrix, comprising: (a) a doped semiconductor substrate; (b) a plurality of diodes in said substrate; (c) a first electrical insulator layer over a surface of said substrate extending over said diodes; (d) a first electrically conductive layer on a predetermined portion of said first insulator layer laterally spaced from said diodes; (e) a stepped second electrical insulator layer having a first region which is thicker than a second region thereof to form said step and disposed over said first electrically conductive layer and said first insulator layer, said stepped layer having said step disposed over an edge of said diodes; (f) a second electrically conductive layer along said step extending at both ends thereof over said first conductive layer and electrically insulated therefrom; and (g) a third insulator over said second conductive layer.
Claim 3
Dependent Claim
22 words
A matrix as set forth in claim 1 wherein said first insulator layer is a native oxide of said semiconductor substrate material.
Claim 4
Dependent Claim
23 words
A matrix as set forth in claim 2 wherein said first insulator layer further includes a zinc sulfide layer over said native oxide.
Claim 5
Dependent Claim
23 words
A matrix as set forth in claim 2 wherein said first conductive layer is taken from the group consisting of nickel and aluminum.
Claim 6
Dependent Claim
23 words
A matrix as set forth in claim 3 wherein said first conductive layer is taken from the group consisting of nickel and aluminum.
Claim 7
Dependent Claim
56 words
A matrix as set forth in claim 1 further including vias in said second and third insulator layers extending from the surface of said third insulator to predetermined ones of said electrically conductive layers therebelow and electrically conductive material in said vias extending from said electrically conductive layers to the surface of said third insulator layer.
Claim 8
Dependent Claim
57 words
A matrix as set forth in claim 2 further including vias in said second and third insulated layers extending from the surface of said third insulator to predetermined ones of said electrically conductive layers therebelow and forming electrically conductive material in said vias extending from said electrically conductive layers to the surface of said third insulator layer.
Claim 9
Dependent Claim
57 words
A matrix as set forth in claim 3 further including vias in said second and third insulated layers extending from the surface of said third insulator to predetermined ones of said electrically conductive layers therebelow and forming electrically conductive material in said vias extending from said electrically conductive layers to the surface of said third insulator layer.
Claim 10
Dependent Claim
57 words
A matrix as set forth in claim 4 further including vias in said second and third insulated layers extending from the surface of said third insulator to predetermined ones of said electrically conductive layers therebelow and forming electrically conductive material in said vias extending from said electrically conductive layers to the surface of said third insulator layer.
Claim 11
Dependent Claim
57 words
A matrix as set forth in claim 5 further including vias in said second and third insulated layers extending from the surface of said third insulator to predetemined ones of said electrically conductive layers therebelow and forming electrically conductive material in said vias extending from said electrically conductive layers to the surface of said third insulator layer.
Claim 12
Dependent Claim
61 words
A matrix as set forth in claim 1 further including first biasing means to bias said second electrically conductive layer to a predetermined level to form a channel in said substrate below the higher portion of said step of opposite conductivity type as said substrate and to provide a substantially flat band region in said substrate under the remaining portions thereof.
Claim 13
Dependent Claim
61 words
A matrix as set forth in claim 2 further including first biasing means to bias said second electrically conductive layer to a predetermined level to form a channel in said substrate below the higher portion of said step of opposite conductivity type as said substrate and to provide a substantially flat band region in said substrate under the remaining portions thereof.
Claim 14
Dependent Claim
61 words
A matrix as set forth in claim 3 further including first biasing means to bias said second electrically conductive layer to a predetermined level to form a channel in said substrate below the higher portion of said step of opposite conductivity type as said substrate and to provide a substantially flat band region in said substrate under the remaining portions thereof.
Claim 15
Dependent Claim
61 words
A matrix as set forth in claim 4 further including first biasing means to bias said second electrically conductive layer to a predetermined level to form a channel in said substrate below the higher portion of said step of opposite conductivity type as said substrate and to provide a substantially flat band region in said substrate under the remaining portions thereof.
Claim 16
Dependent Claim
61 words
A matrix as set forth in claim 5 further including first biasing means to bias said second electrically conductive layer to a predetermined level to form a channel in said substrate below the higher portion of said step of opposite conductivity type as said substrate and to provide a substantially flat band region in said substrate under the remaining portions thereof.
Claim 17
Dependent Claim
61 words
A matrix as set forth in claim 6 further including first biasing means to bias said second electrically conductive layer to a predetermined level to form a channel in said substrate below the higher portion of said step of opposite conductivity type as said substrate and to provide a substantially flat band region in said substrate under the remaining portions thereof.
Claim 18
Dependent Claim
61 words
A matrix as set forth in claim 7 further including first biasing means to bias said second electrically conductive layer to a predetermined level to form a channel in said substrate below the higher portion of said step of opposite conductivity type as said substrate and to provide a substantially flat band region in said substrate under the remaining portions thereof.
Claim 19
Dependent Claim
61 words
A matrix as set forth in claim 8 further including first biasing means to bias said second electrically conductive layer to a predetermined level to form a channel in said substrate below the higher portion of said step of opposite conductivity type as said substrate and to provide a substantially flat band region in said substrate under the remaining portions thereof.
Claim 20
Dependent Claim
61 words
A matrix as set forth in claim 9 further including first biasing means to bias said second electrically conductive layer to a predetermined level to form a channel in said substrate below the higher portion of said step of opposite conductivity type as said substrate and to provide a substantially flat band region in said substrate under the remaining portions thereof.
Claim 21
Dependent Claim
61 words
A matrix as set forth in claim 10 further including first biasing means to bias said second electrically conductive layer to a predetermined level to form a channel in said substrate below the higher portion of said step of opposite conductivity type as said substrate and to provide a substantially flat band region in said substrate under the remaining portions thereof.
Claim 22
Dependent Claim
105 words
A charge imaging matrix, comprising (a) a doped semiconductor substrate; (b) a plurality of diodes formed at the surface of said substrate; (c) a first electrically insulating layer on said surface; (d) a first electrically conductive layer on a predetermined portion of said first insulating layer laterally disposed from said diodes; and (e) a second stepped electrically conductive layer having electrically connected upper and lower levels electrically insulated from said first conductive layer, an end portion of said upper level and and end portion of said lower level being disposed over said first conductive layer, said step being disposed over an edge of said diode.
Claim 23
Dependent Claim
105 words
A charge imaging matrix, comprising (a) a doped semiconductor substrate; (b) a plurality of diodes formed at the surface of said substrate; (c) a first electrically insulating layer on said surface; (d) a first electrically conductive layer on a predetermined portion of said first insulating layer laterally disposed from said diodes; and (e) a second stepped electrically conductive layer having electrically connected upper and lower levels electrically insulated from said first conductive layer, an end portion of said upper level and and end portion of said lower level being disposed over said first conductive layer, said step being disposed over an edge of said diode.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-04-13 | 1990-10-13 | 1991-04-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-04-13 | 1994-10-13 | 1995-04-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-04-13 | 1998-10-13 | 1999-04-14 | $7700.00 | Window Closed / Lapsed |