Abstract According to the method of the invention, samples undergoing analysis for sorting are irradiated one by one in order to excite X-ray fluorescence. In order to take into account the background radiation, the quality whereof varies according to the frequency of the excited radiation, the radiation peak intensity I 1 is measured, as well as the respective intensity I 2 is measured at the same point of the radiation spectrum but in an essentially wider frequency range than the radiation peak. On the basis of the measured intensities I 1 and I 2 are defined the intensities of the X-ray fluorescence F and the background radiation T, and the ratio of these two is used as the selective criterion when sorting the analyzed samples.
A method for taking the radiation background into account in the determination of radiation intensities of samples undergoing analysis for sorting, comprising the steps of: irradiating samples under analysis by at least one radiation source in order to excite X-ray fluorescence, measuring a radiation intensity peak I 1 , measuring radiation intensity I 2 at the same point as the intensity peak I 1 , but in a wider frequency range than the intensity peak I 1 , using the measured intensities I 1 and I 2 to define the respective intensities of the X-ray fluorescence F and the background radiation T, and then comparing the intensities F and T to determine the precious metal contents at the surface of the sample.
Claim 2
Independent Claim
122 words
A method for taking the radiation background into account in the determination of radiation intensities of samples undergoing analysis for sorting, comprising the steps of: irradiating samples under analysis by at least one radiation source in order to excite X-ray fluorescence, measuring a radiation intensity peak I 1 , measuring radiation intensity I 2 at the same point as the intensity peak I 1 , but in a wider frequency range than the intensity peak I 1 , using the measured intensities I 1 and I 2 to define the respective intensities of the X-ray fluorescence F and the background radiation T, and then comparing the intensities F and T to determine the precious metal contents at the surface of the sample.
Claim 3
Dependent Claim
30 words
The method of claim 1, comprising choosing the ratio of the X-ray fluorescence F to the background radiation T as the quality ratio T o , describing the sorting results.
Claim 4
Dependent Claim
30 words
The method of claim 2 or 1, wherein the detector comprises two channels, one for measuring the intensity I 1 and the other for measuring the intensity I 2 .
Claim 5
Dependent Claim
18 words
The method of claim 2 or 1, comprising employing at least one energy-dispersive scintillation detector as the detector.
Claim 6
Dependent Claim
19 words
The method of claim 1, wherein the energy level of the radiation source is between 300 and 660 keV.