Method for taking the radiation background into account in the determination of radiation intensities of analyzed samples
Abstract
Abstract According to the method of the invention, samples undergoing analysis for sorting are irradiated one by one in order to excite X-ray fluorescence. In order to take into account the background radiation, the quality whereof varies according to the frequency of the excited radiation, the radiation peak intensity I 1 is measured, as well as the respective intensity I 2 is measured at the same point of the radiation spectrum but in an essentially wider frequency range than the radiation peak. On the basis of the measured intensities I 1 and I 2 are defined the intensities of the X-ray fluorescence F and the background radiation T, and the ratio of these two is used as the selective criterion when sorting the analyzed samples.
Inventors
- 👤 Heikki J. Sipila
- 👤 Kai J. Laamanen
Bibliographic Details
Claims Analysis
Total Claims: 6References Cited (Backward Citations)
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