US4651192A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Ceramic packaged semiconductor device
Assignee: Hitachi Ltd
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Filing: 1985-07-03
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Granted: 1987-03-17
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Expires: 2005-07-03
Abstract
Abstract A semiconductor device with a semiconductor element encased in a hollow ceramic package. The portion of the package at which the semiconductor element is disposed is formed from SiC admixed with Be or a compound of Be.
Inventors
- 👤 Yasuo Matsushita
- 👤 Kousuke Nakamura
- 👤 Mitsuru Ura
- 👤 Fumiyuki Kobayashi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 13:38
CPC Classifications
H; H10; H10W; H10W76/00; H10W76/10; H10W76/12; H10W76/15; H10W76/157; H10W70/00; H10W70/60; H10W70/67; H10W70/69; H10W70/692; H10W70/68; H10W70/682; H10W72/00; H10W72/50; H10W72/531; H10W72/536; H10W72/551; H10W72/552; H10W72/851; H10W72/874; H10W72/884; H10W90/00; H10W90/701; H10W90/731; H10W90/737; H10W90/751; H10W90/756
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
176 words
A semiconductor device comprising: an insulating substrate comprising a SiC ceramic containing 0.05 to 5% by weight of at least one of Be and a compound of Be in terms of Be element on the basis of total ceramic and having a relative density of not lower than 90% to the theoretical density, a coefficient of thermal expansion approximating that of a semiconductor material and a thermal conductivity not smaller than 0.2 cal/sec.cm. °C. at room temperature. at least one semiconductor element disposed at a predetermined location on one surface of said insulating substrate; a cap member made of alumina ceramic bonded to a preselected portion on one surface of the insulating substrate by a solder glass layer, thereby forming a package hermetically enclosing the semiconductor element together with the insulating substrate; and a terminal means having one end that is electrically connected to the semiconductor element within the package and another end that is exposed at the outside of said package, said terminal means being bonded to said insulating substrate by a sealing glass layer.
Claim 2
Dependent Claim
176 words
A semiconductor device comprising: an insulating substrate comprising a SiC ceramic containing 0.05 to 5% by weight of at least one of Be and a compound of Be in terms of Be element on the basis of total ceramic and having a relative density of not lower than 90% to the theoretical density, a coefficient of thermal expansion approximating that of a semiconductor material and a thermal conductivity not smaller than 0.2 cal/sec.cm. °C. at room temperature. at least one semiconductor element disposed at a predetermined location on one surface of said insulating substrate; a cap member made of alumina ceramic bonded to a preselected portion on one surface of the insulating substrate by a solder glass layer, thereby forming a package hermetically enclosing the semiconductor element together with the insulating substrate; and a terminal means having one end that is electrically connected to the semiconductor element within the package and another end that is exposed at the outside of said package, said terminal means being bonded to said insulating substrate by a sealing glass layer.
Claim 3
Dependent Claim
21 words
The semiconductor device according to claim 1, wherein a cooling fin is mounted on the other surface of the insulating substrate.
Claim 4
Dependent Claim
41 words
The semiconductor device according to claim 1, wherein a cooling fin is formed at the other surface of the insulating substrate integrally with the insulating substrate, the cooling fin being made of the same material as that of the insulating substrate.
Claim 5
Dependent Claim
22 words
A semiconductor device according to claim 1 wherein the insulating substrate exhibits a high thermal conductivity of at least 0.4 cal/sec.cm. °C.
Claim 6
Dependent Claim
26 words
A semiconductor device according to claim 1 wherein the insulating substrate exhibits a coefficient of thermal expansion on the order of 4×10 -6 /°C. or less.
Claim 7
Dependent Claim
31 words
A semiconductor device according to claim 1 wherein the SiC ceramic contains 0.05 to 5% by weight of beryllium oxide in terms of beryllium on the basis of the total ceramic.
References Cited (Backward Citations)
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US4142203A
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US4352120A
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US4517584A
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-03-16 | 1990-09-15 | 1991-03-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-03-16 | 1994-09-15 | 1995-03-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-03-16 | 1998-09-15 | 1999-03-17 | $7700.00 | Window Closed / Lapsed |