Patent US4638243A successfully refreshed from Google Patents.
US4638243A
Expired / Lapsed
US
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Short detector for fusible link array using single reference fuse
Assignee: Lattice Semiconductor Corp
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Filing: 1985-06-05
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Granted: 1987-01-20
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Expires: 2005-06-05
Abstract
Abstract Circuitry is provided for testing fusible link arrays for short circuits around the fusible links. Each link is electrically isolated and compared with a reference fusible link to detect the presence or absence of a short circuit.
Inventors
- 👤 Andrew K. Chan
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 08:49
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/50; G01R31/52
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
146 words
Circuitry for testing for short circuits in a fusible link array, said array having a plurality of discrete fusible links each having a nominal resistance RF, any short circuits in one of said fusible links presenting a resistance RFS which is substantially lower than RF, said circuitry comprising: means for electrically isolating one of said fusible links from the other of said links; a reference fusible link having a nominal resistance RF; a reference voltage circuit, said reference fusible link being connected in said reference voltage circuit; means for applying a voltage across the one of said fusible links under test and across said reference fusible link; and means for comparing the voltage across said fusible link under test with the voltage across said reference fusible link to provide an indication of the presence or absence of a short circuit across said fusible link under test.
Claim 2
Dependent Claim
146 words
Circuitry for testing for short circuits in a fusible link array, said array having a plurality of discrete fusible links each having a nominal resistance RF, any short circuits in one of said fusible links presenting a resistance RFS which is substantially lower than RF, said circuitry comprising: means for electrically isolating one of said fusible links from the other of said links; a reference fusible link having a nominal resistance RF; a reference voltage circuit, said reference fusible link being connected in said reference voltage circuit; means for applying a voltage across the one of said fusible links under test and across said reference fusible link; and means for comparing the voltage across said fusible link under test with the voltage across said reference fusible link to provide an indication of the presence or absence of a short circuit across said fusible link under test.
Claim 3
Dependent Claim
132 words
Circuitry for testing for short circuits in a fusible link array, said array having a plurality of discrete fusible links each having a nominal resistance RF, any short circuit in one of said fusible links presenting a resistance RFS which is substantially lower than RF, said circuitry comprising: means for electrically isolating one of said fusible links from the other of said links; a reference fusible link having a nominal resistance RF; a reference voltage circuit, said reference fusible link being connected in said reference voltage circuit; means for applying a voltage across the one of said fusible links under test and across said reference fusible link; and means for detecting whether the voltage across said fusible link under test is larger or smaller than the voltage across said reference fusible link.
Claim 4
Dependent Claim
132 words
Circuitry for testing for short circuits in a fusible link array, said array having a plurality of discrete fusible links each having a nominal resistance RF, any short circuit in one of said fusible links presenting a resistance RFS which is substantially lower than RF, said circuitry comprising: means for electrically isolating one of said fusible links from the other of said links; a reference fusible link having a nominal resistance RF; a reference voltage circuit, said reference fusible link being connected in said reference voltage circuit; means for applying a voltage across the one of said fusible links under test and across said reference fusible link; and means for detecting whether the voltage across said fusible link under test is larger or smaller than the voltage across said reference fusible link.
Claim 5
Dependent Claim
76 words
Circuitry in accordance with claim 2 in which said fusible links are arranged in an array having individually selectable orthogonal bit lines and word lines, the location of each of said fusible links being defined by the intersection of a bit line and a word line; and said means for electrically isolating one of said fusible links comprises means for selecting a given one of said bit lines and a given one of said word lines.
Claim 6
Dependent Claim
17 words
Circuitry in accordance with claim 3 including a reference fusible link for each of said word lines.
Claim 7
Dependent Claim
65 words
Circuitry in accordance with claim 3 including a voltage source; a first transistor connected to said voltage source through a selected one of said fusible links; a second transistor connected to said voltage source through said reference fusible link; and means for comparing the voltages across said first and second transistors to provide an indication of a short circuit across said fusible link under test.
References Cited (Backward Citations)
US4499579A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-01-19 | 1990-07-21 | 1991-01-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-01-19 | 1994-07-21 | 1995-01-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-01-19 | 1998-07-21 | 1999-01-20 | $7700.00 | Window Closed / Lapsed |