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US4635091A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device having overload protection

Assignee: US Philips Corp
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Filing: 1984-08-10
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Granted: 1987-01-06
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Expires: 2004-08-10
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Abstract

Abstract The transistor includes a semiconductor body having a surface on which are disposed metallic connection contact areas, including means for protection from overloads. At least one of the metallic area comprises a material, such as Al, susceptible to forming a eutectic with the substrate, which is made, for example, of Si. The metallic area is formed from an alloy of the material, such as the Al-Si eutectic, having a melting point whose temperature is lower than the formation temperature of the Al-Si eutectic and higher than the temperature of soldering the semiconductor body on a support.

Inventors

  • 👤 Bernard P. Roger

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 17:51
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/41; H10W20/44; H10W20/4403; H10W20/4405; H10W20/4407; H10W42/00; H10W42/80; H01; H01H; H01H85/00; H01H85/02; H01H85/0241; H01H2085/0275; H01H2085/0283; H10W72/00; H10W72/50; H10W72/531; H10W72/5363; H10W72/59; H10W72/90; H10W72/921; H10W72/923; H10W72/926; H10W72/951; H10W72/952

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 121 words
A semiconductor device comprising a support, a semiconductor body soldered on said support and comprising a surface, metallic connection contact areas on said surface, at least one contact wire connected to one of said contact areas, and means for protecting said device from overloads, at least one of said metallic areas comprising a material capable of forming a eutectic with the semiconductor body formed from an alloy of said material having a melting point whose temperature is lower than the temperature of formation of said eutectic and higher than the temperature of soldering the semiconductor body on its support so that said at least one metallic area will melt prior to the formation of said eutectic upon overload of said device.
Claim 2
Dependent Claim 121 words
A semiconductor device comprising a support, a semiconductor body soldered on said support and comprising a surface, metallic connection contact areas on said surface, at least one contact wire connected to one of said contact areas, and means for protecting said device from overloads, at least one of said metallic areas comprising a material capable of forming a eutectic with the semiconductor body formed from an alloy of said material having a melting point whose temperature is lower than the temperature of formation of said eutectic and higher than the temperature of soldering the semiconductor body on its support so that said at least one metallic area will melt prior to the formation of said eutectic upon overload of said device.
Claim 3
Dependent Claim 16 words
A device as claimed in claim 1, characterized in that said alloy comprises an aluminum-germanium eutectic.
Claim 4
Dependent Claim 25 words
A device as claimed in claim 2, characterized in that said alloy comprises at least one element of the group consisting of magnesium and antimony.
Claim 5
Dependent Claim 16 words
A device as claimed in claim 1, characterized in that said alloy comprises an aluminum-zinc eutectic.
Claim 6
Dependent Claim 17 words
A device as claimed in claim 1, characterized in that the said alloy comprises an aluminum-magnesium eutectic.
Claim 7
Dependent Claim 34 words
A device as claimed in claim 1 or 2, characterized in that at least said metallic area comprises a subjacent layer of aluminum having a substantially smaller thickness than that of said metallic area.
Claim 8
Dependent Claim 35 words
A device as claimed in claim 1 or 2, characterized in that at least said metallic area is coated with a layer of aluminum having a substantially smaller thickness than that of said metallic area.
Claim 9
Dependent Claim 16 words
A device as claimed in claim 1 or 2, wherein said device is a power transistor.

References Cited (Backward Citations)

US3987480A Cited
US3925808A Cited
US4151545A Cited
US4392010A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-01-05 1990-07-07 1991-01-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-01-05 1994-07-07 1995-01-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-01-05 1998-07-07 1999-01-06 $7700.00 Window Closed / Lapsed

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