← Back to Patent Explorer
US4626690A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus for chopping a charged particle beam

Assignee: Hitachi Ltd
•
Filing: 1984-11-16
•
Granted: 1986-12-02
•
Expires: 2004-11-16
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract An apparatus for chopping a charged particle beam comprises: deflecting means for deflecting a charged particle beam by a high frequency voltage; deflecting means for deflecting the charged particle beam by a DC voltage or low frequency saw-tooth voltage in the same deflecting direction as the high frequency deflecting means does; and aperture means for taking out only a part of the charged particle beam deflected. The generation time point of the pulse beam which is generated at a high frequency is arbitrarily adjusted by the DC voltage or low frequency saw-tooth voltage.

Inventors

  • 👤 Hideo Todokoro
  • 👤 Tsutomu Komoda

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 22:12
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04; H01J37/045

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 78 words
An apparatus for chopping a charged particle beam comprising: first deflecting means for deflecting a charged particle beam in a predetermined direction by a high frequency voltage; second deflecting means for deflecting said charged particle beam by a DC voltage or low frequency saw-tooth voltage in the same deflecting direction as said predetermined direction; and aperture means for taking out only a part of the charged particle beam which was deflected by said first and second deflecting means.
Claim 2
Independent Claim 78 words
An apparatus for chopping a charged particle beam comprising: first deflecting means for deflecting a charged particle beam in a predetermined direction by a high frequency voltage; second deflecting means for deflecting said charged particle beam by a DC voltage or low frequency saw-tooth voltage in the same deflecting direction as said predetermined direction; and aperture means for taking out only a part of the charged particle beam which was deflected by said first and second deflecting means.
Claim 3
Dependent Claim 26 words
An apparatus according to claim 1, wherein said first and second deflecting means are constituted by a pair of electrostatic deflecting plates which face one another.
Claim 4
Dependent Claim 33 words
An apparatus according to claim 1, wherein said first deflecting means is constituted by an electrostatic type deflecting plate and said second deflecting means is constituted by a magnetic field type deflecting plate.
Claim 5
Independent Claim 115 words
An apparatus for chopping a charged particle beam comprising: deflecting means for deflecting a charged particle beam in a predetermined direction by a voltage which comprises a DC voltage or low frequency saw-tooth voltage added to a high frequency voltage, wherein said deflecting means is constituted by a pair of electrostatic deflecting plates which face one another, and further wherein said voltage is provided to one of said deflecting plates and the other of said deflecting plate is grounded; and aperture means receiving said charged particle beam after it has been deflected by said charged particle beam for taking out only a part of the charged particle beam which was deflected by said deflecting means.
Claim 6
Independent Claim 115 words
An apparatus for chopping a charged particle beam comprising: deflecting means for deflecting a charged particle beam in a predetermined direction by a voltage which comprises a DC voltage or low frequency saw-tooth voltage added to a high frequency voltage, wherein said deflecting means is constituted by a pair of electrostatic deflecting plates which face one another, and further wherein said voltage is provided to one of said deflecting plates and the other of said deflecting plate is grounded; and aperture means receiving said charged particle beam after it has been deflected by said charged particle beam for taking out only a part of the charged particle beam which was deflected by said deflecting means.

References Cited (Backward Citations)

US4110623A Cited
US4151417A Cited
US4169229A Cited
US4439685A Cited
US4445041A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-12-01 1990-06-02 1990-12-02 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-12-01 1994-06-02 1994-12-02 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-12-01 1998-06-02 1998-12-02 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag