Patent US4612085A successfully refreshed from Google Patents.
US4612085A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Photochemical patterning
Assignee: Texas Instruments Inc
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Filing: 1985-04-10
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Granted: 1986-09-16
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Expires: 2005-04-10
Abstract
Abstract Formation of a plasma etch mask on a film on a substrate by photodecomposition of a gas at selective portions of the film's surface to deposit etch mask material and form the etch mask is disclosed. The photodecomposition by blanket illumination through a photomask and by direct write with a computer controlled laser are both disclosed. The formation of the etch mask can be immediately followed by the plasma etch without breaking vacuum.
Inventors
- 👤 Edward C. Jelks
- 👤 Michael R. Melloch
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 17:55
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/44; C23C16/48; C23C16/483; C23C16/04; C23C16/047; G; G03; G03F; G03F7/00; G03F7/004; H; H10; H10P; H10P34/00; H10P34/40; H10P34/42; Y; Y10; Y10S; Y10S438/00; Y10S438/98
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
71 words
A method of forming a mask of a first material on a selected region on a surface of a substrate, comprising the steps of: (a) introducing a gas over said surface, said gas characterized by photodecomposition into said first material plus volatile other material; and (b) illuminating said surface only at said selected region, whereby said gas decomposes and deposits said first material on said selected region and forms said mask.
Claim 2
Independent Claim
71 words
A method of forming a mask of a first material on a selected region on a surface of a substrate, comprising the steps of: (a) introducing a gas over said surface, said gas characterized by photodecomposition into said first material plus volatile other material; and (b) illuminating said surface only at said selected region, whereby said gas decomposes and deposits said first material on said selected region and forms said mask.
Claim 3
Dependent Claim
21 words
The method of claim 1 wherein: (a) said illuminating is performed by passing light through a photomask and onto said surface.
Claim 4
Dependent Claim
21 words
The method of claim 1, wherein: (a) said illuminating is performed by moving a spot of light on said selected region.
Claim 5
Dependent Claim
21 words
The method of claim 1, wherein: (a) the pressure of said gas over said surface is much less than atmospheric pressure.
Claim 6
Independent Claim
75 words
A method of forming a mask of a first material on a selected region on a surface of a substrate, comprising the steps of: (a) introducing a gas over said surface, said gas characterized by thermal decomposition into said first material plus volatile other material; and (b) illuminating and thereby heating said surface only at said selected region, whereby said gas decomposes and deposits said first material on said selected region and forms said mask.
Claim 7
Independent Claim
75 words
A method of forming a mask of a first material on a selected region on a surface of a substrate, comprising the steps of: (a) introducing a gas over said surface, said gas characterized by thermal decomposition into said first material plus volatile other material; and (b) illuminating and thereby heating said surface only at said selected region, whereby said gas decomposes and deposits said first material on said selected region and forms said mask.
Claim 8
Dependent Claim
21 words
The method of claim 5, wherein: (a) said illuminating is performed by passing light through a photomask and onto said surface.
Claim 9
Dependent Claim
21 words
The method of claim 5, wherein: (a) said illuminating is performed by moving a spot of light on said selected region.
Claim 10
Independent Claim
76 words
A method of forming a patterned film of first material on a substrate surface, comprising the steps of: (a) depositing a film of said first material on said surface; (b) introducing a gas over said first material, said gas characterized by photodecomposition into a second material plus volatile material; and (c) illuminating said film in a pattern, said illumination characterized by photodecomposition of said gas, whereby said gas decomposition forms said pattern of said second material.
Claim 11
Independent Claim
76 words
A method of forming a patterned film of first material on a substrate surface, comprising the steps of: (a) depositing a film of said first material on said surface; (b) introducing a gas over said first material, said gas characterized by photodecomposition into a second material plus volatile material; and (c) illuminating said film in a pattern, said illumination characterized by photodecomposition of said gas, whereby said gas decomposition forms said pattern of said second material.
Claim 12
Independent Claim
93 words
A method of patterning and plasma etching a film of first material on a substrate, comprising the steps of: (a) depositing a film of said first material on said surface; (b) introducing a gas over said first material, said gas characterized by photodecomposition into a second material plus volatile material; (c) illuminating said film in a pattern, said illumination characterized by photodecomposition of said gas, whereby said gas decomposition forms said pattern of said second material; and (d) plasma etching of said first material using said patterned second material as an etch mask.
Claim 13
Independent Claim
93 words
A method of patterning and plasma etching a film of first material on a substrate, comprising the steps of: (a) depositing a film of said first material on said surface; (b) introducing a gas over said first material, said gas characterized by photodecomposition into a second material plus volatile material; (c) illuminating said film in a pattern, said illumination characterized by photodecomposition of said gas, whereby said gas decomposition forms said pattern of said second material; and (d) plasma etching of said first material using said patterned second material as an etch mask.
Claim 14
Dependent Claim
22 words
The method of claim 9, wherein: (a) said illuminating decomposition step and said plasma etching step are both performed at below-atmospheric pressures.
Claim 15
Dependent Claim
22 words
The method of claim 10, wherein: (a) said substrate remains at below-atmospheric pressure between said illuminating decomposition and said plasma etching steps.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-09-15 | 1990-03-17 | 1990-09-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-09-15 | 1994-03-17 | 1994-09-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-09-15 | 1998-03-17 | 1998-09-16 | $7700.00 | Window Closed / Lapsed |