US4608657A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for testing probe calibration
Assignee: Tektronix Japan Corp
•
Filing: 1982-11-01
•
Granted: 1986-08-26
•
Expires: 2002-11-01
Abstract
Abstract In a method for testing for probe calibration, a square-wave signal is applied to a probe and a cyclic probe output signal resulting therefrom is compared to a reference level at a plurality of points along one cycle of the output signal. The reference signal is iteratively increased or decreased until it is less than or greater than a minimum or maximum peak magnitude of the probe output signal by a small amount. The probe is then determined to be calibrated according whether the magnitude of the output signal at each point is greater than or less than the reference level.
Inventors
- 👤 Teruo Manome
- 👤 Yasuhiko Miki
- 👤 Kentaro Takita
- 👤 Minoru Fukuta
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 00:38
CPC Classifications
G; G01; G01R; G01R35/00; G01R29/00; G01R29/02; G01R29/027
Claims Analysis
Total Claims: 29
Claim 1
Independent Claim
133 words
A method of testing probe calibration, comprising the steps of: applying a square-wave signal to a probe to be tested; adjusting a reference level to be within a selected range of a peak level of an output signal from said probe; comparing the reference level with the magnitude of the output signal from said probe; and determining whether a duty factor of the probe output signal is equal to a known duty factor of the square-wave signal, said duty factor of said output signal being determined in response to said comparison according to the duration of said probe output signal which exceeds said reference level in magnitude; wherein said probe is determined to be calibrated when the duty factors of the probe output signal and the square-wave signal are equal to each other.
Claim 2
Independent Claim
133 words
A method of testing probe calibration, comprising the steps of: applying a square-wave signal to a probe to be tested; adjusting a reference level to be within a selected range of a peak level of an output signal from said probe; comparing the reference level with the magnitude of the output signal from said probe; and determining whether a duty factor of the probe output signal is equal to a known duty factor of the square-wave signal, said duty factor of said output signal being determined in response to said comparison according to the duration of said probe output signal which exceeds said reference level in magnitude; wherein said probe is determined to be calibrated when the duty factors of the probe output signal and the square-wave signal are equal to each other.
Claim 3
Dependent Claim
50 words
A method of testing a probe calibration according to claim 1, wherein the reference level is adjusted to a level lower than the maximum peak level of the output signal from the probe by an amount according to which the known duty factor of said square-wave signal can be determined.
Claim 4
Dependent Claim
36 words
A method of testing a probe calibration according to claim 2, wherein the reference level is adjusted by decreasing said reference level until a portion of said probe output signal exceeds said reference level in magnitude.
Claim 5
Dependent Claim
50 words
A method of testing a probe calibration according to claim 1, wherein the reference level is adjusted to a level higher than the minimum peak level of the output signal from the probe by an amount according to which the known duty factor of said square-wave signal can be determined.
Claim 6
Dependent Claim
38 words
A method of testing a probe calibration according to claim 4, wherein the reference level is adjusted by increasing said reference level until a portion of said probe output signal is less than said reference level in magnitude.
Claim 7
Dependent Claim
25 words
A method of testing probe calibration according to claim 1 further including the step of: displaying an indication as to whether said probe is calibrated.
Claim 8
Dependent Claim
98 words
A probe calibration testing apparatus, comprising: means for generating a square-wave signal to be applied to a probe; means for generating a variable reference level; means for comparing an output signal from said probe with the reference level and for producing an output signal indicating whether or not the probe output signal exceeds the reference level; and control means for controlling said reference level to a level within a selected range of a peak level of the probe output signal, and for determining whether said probe is calibrated by repeatedly sampling the output signal from said comparison means.
Claim 9
Dependent Claim
98 words
A probe calibration testing apparatus, comprising: means for generating a square-wave signal to be applied to a probe; means for generating a variable reference level; means for comparing an output signal from said probe with the reference level and for producing an output signal indicating whether or not the probe output signal exceeds the reference level; and control means for controlling said reference level to a level within a selected range of a peak level of the probe output signal, and for determining whether said probe is calibrated by repeatedly sampling the output signal from said comparison means.
Claim 10
Dependent Claim
92 words
A probe calibration testing apparatus according to claim 7, wherein said control means controls the reference level to be lower than the maximum peak level of the output signal from said probe by an amount according to which a known duty factor of said square-wave signal can be determined, detects the duty factor of said probe output signal according to the states of said comparison means output signal, and determines said probe to be calibrated when the duty factor of the probe output signal is equal to that of the square-wave signal.
Claim 11
Dependent Claim
91 words
A probe calibration testing apparatus according to claim 7, wherein said control means controls the reference level to be higher than the minimum level of the output signal from said probe by an amount according to which a known duty factor of said square-wave signal can be determined, detects the duty factor of said probe output signal according to the states of said comparison means output signal, and determines said probe to be calibrated when the duty factor of the probe output signal is equal to that of the square-wave signal.
Claim 12
Dependent Claim
80 words
A probe calibration testing apparatus according to claim 7, wherein said control means controls the reference level to first and second levels higher and lower than a peak level of the output signal from said probe, and determines said probe is calibrated when the output signal of the means for comparing indicates that the output signal from said probe is less than the first level and greater than said second level during a selected portion of said probe output signal.
Claim 13
Dependent Claim
18 words
A probe calibration testing apparatus according to claim 7 wherein said signal generation means comprises a pulse generator.
Claim 14
Dependent Claim
19 words
A probe calibration testing apparatus according to claim 7 wherein said reference level generation means comprises a digital-to-analog converter.
Claim 15
Dependent Claim
17 words
A probe calibration testing apparatus according to claim 7 wherein said control means comprises a microprocessor system.
Claim 16
Dependent Claim
24 words
A probe calibration testing apparatus according to claim 7, further including a display device for displaying the calibration determination result of said control means.
Claim 17
Independent Claim
88 words
A method of testing calibration of a probe comprising the steps of: applying a known square-wave signal having a known duty factor to the probe to generate a probe output signal; determining a duty factor of said probe output signal by comparing said probe output signal to a reference level and detecting the relative proportion of the probe output signal exceeding the reference level; and determining the probe to be calibrated when a probe output signal duty factor substantially matches said known duty factor of said square-wave signal.
Claim 18
Independent Claim
88 words
A method of testing calibration of a probe comprising the steps of: applying a known square-wave signal having a known duty factor to the probe to generate a probe output signal; determining a duty factor of said probe output signal by comparing said probe output signal to a reference level and detecting the relative proportion of the probe output signal exceeding the reference level; and determining the probe to be calibrated when a probe output signal duty factor substantially matches said known duty factor of said square-wave signal.
Claim 19
Independent Claim
165 words
A method of testing calibration of a probe comprising the steps of: applying a square-wave signal to the probe to generate a probe output signal, each cycle of said square-wave signal having a high voltage portion and a low voltage portion; generating a reference voltage level higher than the highest magnitude of said probe output signal during a given portion of each cycle thereof generated in response to the high voltage portion of each corresponding cycle of said square-wave signal; successively decreasing said reference level by a selected amount and comparing said probe output signal magnitude with each successively decreased reference level during said given portion of said output signal generated in response to said high voltage square-wave cycle portion until said probe output signal magnitude exceeds said reference level of at least a part of its said given portion; and determining said probe to be calibrated if said probe output signal magnitude exceeds said reference level during substantially all of its said given portion.
Claim 20
Independent Claim
165 words
A method of testing calibration of a probe comprising the steps of: applying a square-wave signal to the probe to generate a probe output signal, each cycle of said square-wave signal having a high voltage portion and a low voltage portion; generating a reference voltage level higher than the highest magnitude of said probe output signal during a given portion of each cycle thereof generated in response to the high voltage portion of each corresponding cycle of said square-wave signal; successively decreasing said reference level by a selected amount and comparing said probe output signal magnitude with each successively decreased reference level during said given portion of said output signal generated in response to said high voltage square-wave cycle portion until said probe output signal magnitude exceeds said reference level of at least a part of its said given portion; and determining said probe to be calibrated if said probe output signal magnitude exceeds said reference level during substantially all of its said given portion.
Claim 21
Dependent Claim
56 words
A method of testing calibration of a probe according to claim 16 further comprising the step of: determining said probe to be overcompensated if the output signal magnitude is greater than said reference level during a first part of said given portion and less than said reference level during a subsequent part of said given portion.
Claim 22
Dependent Claim
56 words
A method of testing calibration of a probe according to claim 16 further comprising the step of: determining said probe to be undercompensated if the output signal magnitude is less than said reference level during a first part of said given portion and greater than said reference level during a subsequent part of said given portion.
Claim 23
Dependent Claim
96 words
A method of testing calibration of a probe according to claim 16 further comprising the steps of: determining said probe to be overcompensated if the output signal magnitude is greater than said reference level during a first part of said given portion and less than said reference level during a subsequent part of said given portion; and determining said probe to be undercompensated if the output signal magnitude is less than said reference level during a first part of said given portion and greater than said reference level during a subsequent part of said given portion.
Claim 24
Independent Claim
170 words
A method of testing calibration of a probe comprising the steps of: applying a square-wave signal to the probe to generate a probe output signal, each cycle of said square-wave signal having a high voltage portion and a low voltage portion; generating a reference voltage level lower than the lowest magnitude of said probe output signal during a given portion of each cycle thereof generated in response to the high voltage portion of each corresponding cycle of said square-wave signal; successively increasing said reference level by a selected amount and comparing said probe output signal magnitude with each successively increased reference level during said given portion of said output signal generated in response to said high voltage square-wave cycle portion until said probe output signal magnitude is less than said reference level for at least a part of its said given portion; and determining said probe to be calibrated if said probe output signal magnitude is less than the last said reference level during substantially all of said given portion.
Claim 25
Independent Claim
170 words
A method of testing calibration of a probe comprising the steps of: applying a square-wave signal to the probe to generate a probe output signal, each cycle of said square-wave signal having a high voltage portion and a low voltage portion; generating a reference voltage level lower than the lowest magnitude of said probe output signal during a given portion of each cycle thereof generated in response to the high voltage portion of each corresponding cycle of said square-wave signal; successively increasing said reference level by a selected amount and comparing said probe output signal magnitude with each successively increased reference level during said given portion of said output signal generated in response to said high voltage square-wave cycle portion until said probe output signal magnitude is less than said reference level for at least a part of its said given portion; and determining said probe to be calibrated if said probe output signal magnitude is less than the last said reference level during substantially all of said given portion.
Claim 26
Independent Claim
167 words
A method of testing calibration of a probe comprising the steps of: applying a square-wave signal to the probe to generate a probe output signal, each cycle of said square-wave signal having a high voltage portion and a low voltage portion; generating a reference voltage level higher than the highest magnitude of said probe output signal during a given portion of each cycle thereof generated in response to the low voltage portion of each corresponding cycle of said square-wave signal; successively decreasing said reference level by a selected amount and comparing said probe output signal magnitude with each successively decreased reference level during said given portion of said output signal generated in response to said low voltage square-wave cycle portion until said probe output signal magnitude exceeds said reference level for at least a part of its said given portion; and determining said probe to be calibrated if said probe output signal magnitude exceeds the last said reference level during substantially all of its said given portion.
Claim 27
Independent Claim
167 words
A method of testing calibration of a probe comprising the steps of: applying a square-wave signal to the probe to generate a probe output signal, each cycle of said square-wave signal having a high voltage portion and a low voltage portion; generating a reference voltage level higher than the highest magnitude of said probe output signal during a given portion of each cycle thereof generated in response to the low voltage portion of each corresponding cycle of said square-wave signal; successively decreasing said reference level by a selected amount and comparing said probe output signal magnitude with each successively decreased reference level during said given portion of said output signal generated in response to said low voltage square-wave cycle portion until said probe output signal magnitude exceeds said reference level for at least a part of its said given portion; and determining said probe to be calibrated if said probe output signal magnitude exceeds the last said reference level during substantially all of its said given portion.
Claim 28
Independent Claim
169 words
A method of testing calibration of a probe comprising the steps of: applying a square-wave signal to the probe to generate a probe output signal, each cycle of said square-wave signal having a high voltage portion and a low voltage portion; generating a reference voltage level lower than the lowest magnitude of said probe output signal during a given portion of each cycle thereof generated in response to the low voltage portion of each corresponding cycle of said square-wave signal; successively increasing said reference level by a selected amount and comparing said probe output signal magnitude with each successively increased reference level during said given portion of said output signal generated in response to said low voltage sqaure-wave cycle portion until said probe output signal magnitude is less than said reference level for at least a part of its said given portion; and determining said probe to be calibrated if said probe output signal magnitude is less than said reference level during substantially all of its said given portion.
Claim 29
Independent Claim
169 words
A method of testing calibration of a probe comprising the steps of: applying a square-wave signal to the probe to generate a probe output signal, each cycle of said square-wave signal having a high voltage portion and a low voltage portion; generating a reference voltage level lower than the lowest magnitude of said probe output signal during a given portion of each cycle thereof generated in response to the low voltage portion of each corresponding cycle of said square-wave signal; successively increasing said reference level by a selected amount and comparing said probe output signal magnitude with each successively increased reference level during said given portion of said output signal generated in response to said low voltage sqaure-wave cycle portion until said probe output signal magnitude is less than said reference level for at least a part of its said given portion; and determining said probe to be calibrated if said probe output signal magnitude is less than said reference level during substantially all of its said given portion.
References Cited (Backward Citations)
US3800236A
Cited
US4070615A
Cited
US4161029A
Cited
US4229703A
Cited
US4253057A
Cited
US4458196A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-08-25 | 1990-02-24 | 1990-08-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-08-25 | 1994-02-24 | 1994-08-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-08-25 | 1998-02-24 | 1998-08-26 | $7700.00 | Window Closed / Lapsed |