US4605894A
Expired / Lapsed
US
⏱️ 0.0 years remaining
High density test head
Assignee: GEN RAD SEMICONDUCTOR TEST Inc
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Filing: 1983-08-29
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Granted: 1986-08-12
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Expires: 2003-08-29
Abstract
Abstract An improved automatic test equipment system for testing electronic assemblies wherein such system includes a main cabinet and a test head. Driver and load circuits are partitioned between the test head and main cabinet so that high power dissipating portions of the load circuit and drive circuit are located in the main cabinet and the low power dissipating portions of the load circuit and drive circuit are positioned in the test head. Disclosed is a structure by which the partitioning of the driver and load circuits can be achieved, the structure including a transmission line and a current buffer which permit the transmission of current pulses over long distances without degradation in the current pulse shape. The structure utilizes a common base current buffer stage with collector base clamping.
Inventors
- 👤 Gerald Cox
- 👤 Bill DeHaven
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 05:54
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/31917; G01R31/31924; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
226 words
A method of configuring a system for automatically testing electronic assemblies wherein control means provide signals to control driver, load, and comparison circuitry, which circuitry supply test signals to and receive response signals from an electronic assembly under test and evaluate the received response signals, and further wherein the driver and load circuitry consume a first total amount of power, the method comprising the steps of a. positioning the control means in a main cabinet; b. partitioning the driver and load circuitry into a first portion which dissipates substantially all of the first total amount of power and a second portion which includes the remainder of the driver and load circuitry; c. positioning substantially all of the first portion of the driver and load circuitry in the main cabinet; d. positioning the remainder of the first portion and all of the second portion of the driver and load circuitry in a test head, wherein the test head supports the electronic assembly under test, couples the test signals to the electronic assembly under test, and receives the response signals from the electronic assembly under test; and e. coupling the second portion of the load and driver circuitry in the test head to the first portion of the load and driver circuitry in the main cabinet, whereby the amount of power dissipated in the test head is minimized.
Claim 2
Independent Claim
226 words
A method of configuring a system for automatically testing electronic assemblies wherein control means provide signals to control driver, load, and comparison circuitry, which circuitry supply test signals to and receive response signals from an electronic assembly under test and evaluate the received response signals, and further wherein the driver and load circuitry consume a first total amount of power, the method comprising the steps of a. positioning the control means in a main cabinet; b. partitioning the driver and load circuitry into a first portion which dissipates substantially all of the first total amount of power and a second portion which includes the remainder of the driver and load circuitry; c. positioning substantially all of the first portion of the driver and load circuitry in the main cabinet; d. positioning the remainder of the first portion and all of the second portion of the driver and load circuitry in a test head, wherein the test head supports the electronic assembly under test, couples the test signals to the electronic assembly under test, and receives the response signals from the electronic assembly under test; and e. coupling the second portion of the load and driver circuitry in the test head to the first portion of the load and driver circuitry in the main cabinet, whereby the amount of power dissipated in the test head is minimized.
Claim 3
Dependent Claim
67 words
The method of claim 1 wherein the driver and load circuitry include current sources, current switches and voltage controlled current diverters, and further wherein partitioning step "b" includes the steps of i. placing the current sources and current switches into the first portion of the driver and load circuitry; and ii. placing the voltage controlled current diverters in the second portion of the driver and load circuitry.
Claim 4
Dependent Claim
54 words
The method of claim 2 wherein step "b" further includes the step of iii. coupling the current sources and current switches to the second portion of the driver and load circuitry by way of a transmission line; and iv. coupling the transmission line to the voltage controlled current diverters by way of current-buffer stages.
Claim 5
Independent Claim
185 words
An apparatus for testing electronic assemblies having a test head for supporting an electronic assembly under test and a main cabinet, wherein said apparatus supplies test signals to, applies loads to, and receives response signals from the electronic assembly under test, the apparatus comprising driver means for supplying the test signals wherein the driver means are organized into a first portion positioned in the main cabinet and a second portion positioned in the test head, the first portion including elements of the driver means which consume a substantial portion of the total power consumed by the driver means and the second portion including the remaining elements of the driver means; load means for supplying the test signals and load to the electronic assembly under test; comparison means for receiving and evaluating the response signals; first means for coupling the driver means, the load means and the comparison means to the electronic assembly under test; and control means positioned in the main cabinet and coupled to the comparison means, the driver means and the load means for controlling said comparison means, driver means and load means.
Claim 6
Independent Claim
185 words
An apparatus for testing electronic assemblies having a test head for supporting an electronic assembly under test and a main cabinet, wherein said apparatus supplies test signals to, applies loads to, and receives response signals from the electronic assembly under test, the apparatus comprising driver means for supplying the test signals wherein the driver means are organized into a first portion positioned in the main cabinet and a second portion positioned in the test head, the first portion including elements of the driver means which consume a substantial portion of the total power consumed by the driver means and the second portion including the remaining elements of the driver means; load means for supplying the test signals and load to the electronic assembly under test; comparison means for receiving and evaluating the response signals; first means for coupling the driver means, the load means and the comparison means to the electronic assembly under test; and control means positioned in the main cabinet and coupled to the comparison means, the driver means and the load means for controlling said comparison means, driver means and load means.
Claim 7
Dependent Claim
64 words
The apparatus of claim 4, wherein the load means is organized into a first portion positioned in the main cabinet and a second portion positioned in the test head, the first portion including elements of the load means which consume a substantial portion of the total power consumed by the load means, and the second portion including the remaining elements in the load means.
Claim 8
Dependent Claim
139 words
The apparatus of claim 4 wherein the driver means include current and voltage source means positioned in the main cabinet for supplying a test current and test voltage which are representative of the test signal; current buffer means positioned in the test head for receiving the test current from the current and voltage source means; means responsive to the test voltage from the current and voltage source means and coupled to the current buffer means and to the electronic assembly under test, for diverting current flow between the current buffer means and the electronic assembly under test so that the voltage level applied by the driver means to the electronic assembly under test corresponds to the test voltage; and second means for coupling the test voltage and test current to the diverting means and the current buffer means respectively.
Claim 9
Dependent Claim
34 words
The apparatus of claim 6 wherein the second coupling means includes transmission line means having a characteristic impedance for coupling the test voltage and test current to the diverting means and current buffer means.
Claim 10
Dependent Claim
92 words
The apparatus of claim 7 wherein the current buffer means includes common base amplifier means having an output which is connected to the diverting means and an input, for amplifying signals received from the transmission line means; and means for coupling the transmission line means to the input of the common base amplifier means and for matching the characteristic impedance of the transmission line means to the input of the common base amplifier means, wherein the common base amplifier means is operated between the fully off condition and a nonsaturated on condition.
Claim 11
Dependent Claim
102 words
The apparatus of claim 6 wherein the diverting means is a diode bridge having first and second pairs of opposing nodes in which the test voltage is coupled to one node of the first pair of opposing nodes and the electronic assembly under test is coupled to the other node of the first pair of opposing nodes, and the current buffer means are coupled to the nodes of the second pair of opposing nodes whereby current is diverted to or away from the electronic assembly under test when the nodes of the first pair of opposing nodes are at different voltage levels.
Claim 12
Dependent Claim
85 words
The apparatus of claim 8 wherein the common base amplifier means include transistor means having an emitter, a collector and a base; and diode means connected to receive the test voltage from the second coupling means and to the base of the transistor means to prevent the saturation of the transistor means, wherein the matching and coupling means are connected between the base and emitter of the transistor means and the collector of the transistor means is the output of the common base amplifier means.
Claim 13
Dependent Claim
99 words
The apparatus of claim 7 wherein the current buffer means include field effect transistor amplifier means having an output coupled to the diverting means and an input for amplifying signals received from the transmission line means; and third means for coupling the transmission line means to the input of the field effect transistor amplifier means and for matching the characteristic impedance of the transmission line means to the input of the field effect transistor amplifier means, wherein the field efect transistor amplifier means is operated between a fully off condition and an on condition which is optimized for speed.
Claim 14
Dependent Claim
60 words
The apparatus of claim 11 wherein the field effect transistor amplifier means include a field effect transistor having a drain, source and gate, wherein the third coupling means couple the transmission line means across the gate and drain, and the diverter means are connected to the source; and means for biasing the field efect transistor to optimize the speed thereof.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-08-11 | 1990-02-10 | 1990-08-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-08-11 | 1994-02-10 | 1994-08-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-08-11 | 1998-02-10 | 1998-08-12 | $7700.00 | Window Closed / Lapsed |