Claims Analysis
Total Claims: 32
Claim 1
Independent Claim
182 words
A depletion mode thin film semiconductor photodetector comprising a crystalline silicon thin film on an insulating substrate with a source region, a drain region and a thin film light sensing channel region formed therebetween, a gate oxide formed over said channel region, a gate electrode formed on said gate oxide, a p-n junction located parallel to the surface of said substrate and within said thin film and creating a space charge separation region therein, the lower portion of said channel region being a first conductivity type region extending to said substrate and the upper portion of said channel region being a second conductivity type region extending to said gate oxide, said source and drain regions functioning as ohmic contacts with said upper portion channel region, said upper portion channel region forming a channel for majority carrier conduction, said lower portion channel region being maintained at floating potential for minority carrier collection as space charge therein, said channel region functioning as a fully depleted channel when said photodetector is operated in its OFF state providing for high dynamic range and large photocurrent operation.
Claim 2
Dependent Claim
182 words
A depletion mode thin film semiconductor photodetector comprising a crystalline silicon thin film on an insulating substrate with a source region, a drain region and a thin film light sensing channel region formed therebetween, a gate oxide formed over said channel region, a gate electrode formed on said gate oxide, a p-n junction located parallel to the surface of said substrate and within said thin film and creating a space charge separation region therein, the lower portion of said channel region being a first conductivity type region extending to said substrate and the upper portion of said channel region being a second conductivity type region extending to said gate oxide, said source and drain regions functioning as ohmic contacts with said upper portion channel region, said upper portion channel region forming a channel for majority carrier conduction, said lower portion channel region being maintained at floating potential for minority carrier collection as space charge therein, said channel region functioning as a fully depleted channel when said photodetector is operated in its OFF state providing for high dynamic range and large photocurrent operation.
Claim 3
Dependent Claim
72 words
The depletion mode thin film photodetector of claim 1 wherein said photodetector comprises n + source and drain regions functioning as ohmic contacts to said channel n region forming a thin film transistor, said photodetector having high photoconductive gain at low light intensities when said n channel region is fully pinched off by an applied gate voltage to said gate electrode sufficiently negative as compared to the threshold voltage of said photodetector.
Claim 4
Dependent Claim
30 words
The depletion mode thin film semiconductor photodetector of claim 1 wherein said lower portion channel region is doped n type and said upper portion channel region is doped p type.
Claim 5
Dependent Claim
73 words
The depletion mode thin film semiconductor photodetector of claim 3 wherein said photodetector comprises p + source and drain regions functioning as ohmic contacts to said channel p region forming a thin film transistor, said photodetector having high photoconductive gain at low light intensities when said p channel region is fully pinched off by an applied gate voltage to said gate electrode sufficiently positive as compared to the threshold voltage of said photodetector.
Claim 6
Dependent Claim
16 words
The depletion mode thin film semiconductor photodetector of claim 1 wherein said gate region is semi-transparent.
Claim 7
Dependent Claim
16 words
The depletion mode thin film semiconductor photodetector of claim 1 wherein said insulating substrate is transparent.
Claim 8
Dependent Claim
36 words
The depletion mode thin film semiconductor photodetector of claim 1 wherein the acceptor and donor concentrations and profiles are chosen to permit photoconduction in said channel region with said channel region fully depleted in the dark.
Claim 9
Dependent Claim
42 words
The depletion mode thin film semiconductor photodetector of claim 7 wherein the acceptor and donor concentrations respectively in said channel p region and said channel n region are in the range from 10 16 /cm 3 to 10 18 /cm 3 .
Claim 10
Dependent Claim
27 words
The depletion mode thin film semiconductor photodetector of claim 1 wherein the thickness of said channel region is in the range of 0.3 μm to 50 μm.
Claim 11
Dependent Claim
23 words
The depletion mode thin film semiconductor photodetector of claim 1 formed by laser melting treatment to bring about recrystallization of said thin film.
Claim 12
Dependent Claim
77 words
The depletion mode thin film semiconductor photodetector of claim 1 wherein said channel region is extended to include a plurality of linearly spaced gate electrodes formed on said gate oxide forming a plurality of spaced photodetectors, an input diode formed over said source region and adjacent to the first of said gate electrodes, an output diode formed over said drain region adjacent to the last of said gate electrodes, said photodetectors functioning as a charge coupled device.
Claim 13
Dependent Claim
13 words
The charge coupled device of claim 11 wherein said gate region is semi-transparent.
Claim 14
Dependent Claim
13 words
The charge coupled device of claim 11 wherein said insulating substrate is transparent.
Claim 15
Dependent Claim
33 words
The charge coupled device of claim 11 wherein the acceptor and donor concentrations and profiles are chosen to permit photoconduction in said channel region with said channel region fully depleted in the dark.
Claim 16
Dependent Claim
39 words
The charge coupled device of claim 14 wherein the acceptor and donor concentrations respectively in said channel p region and said channel n region are in the range from 10 16 /cm 3 to 10 18 /cm 3 .
Claim 17
Dependent Claim
24 words
The charge coupled device of claim 11 wherein the thickness of said channel region is in the range of 0.3 μm to 50 μm.
Claim 18
Dependent Claim
20 words
The charge coupled device of claim 11 formed by laser melting treatment to bring about recrystallization of said thin film.
Claim 19
Dependent Claim
27 words
The charge coupled device of claim 11 wherein said lower portion channel region is doped n type and said upper portion channel region is doped p type.
Claim 20
Dependent Claim
27 words
The charge coupled device of claim 17 wherein said source and drain regions comprise p + regions functioning as an ohmic contacts to said channel n region.
Claim 21
Dependent Claim
173 words
A depletion mode thin film semiconductor photodetector comprising a crystalline silicon thin film on an insulating substrate with a pair of terminal regions and a thin film light sensing channel region formed therebetween, a gate oxide formed over said channel region, a gate electrode formed on said gate oxide, a p-n junction located parallel to the surface of said substrate and within said thin film and functioning as a space charge separation region therein, the lower portion of said channel region being a p region extending to said substrate and the upper portion of said channel region being an n region extending to said gate oxide, one of said terminal regions functioning as an ohmic contact to said channel n region and the other of said terminal regions functioning as an ohmic contact to said channel p region, said channel region functioning as a fully depleted channel when said photodetector is operated in its OFF state providing for high dynamic range and large photocurrent operation, said photodetector forming a depletion mode gated diode.
Claim 22
Dependent Claim
173 words
A depletion mode thin film semiconductor photodetector comprising a crystalline silicon thin film on an insulating substrate with a pair of terminal regions and a thin film light sensing channel region formed therebetween, a gate oxide formed over said channel region, a gate electrode formed on said gate oxide, a p-n junction located parallel to the surface of said substrate and within said thin film and functioning as a space charge separation region therein, the lower portion of said channel region being a p region extending to said substrate and the upper portion of said channel region being an n region extending to said gate oxide, one of said terminal regions functioning as an ohmic contact to said channel n region and the other of said terminal regions functioning as an ohmic contact to said channel p region, said channel region functioning as a fully depleted channel when said photodetector is operated in its OFF state providing for high dynamic range and large photocurrent operation, said photodetector forming a depletion mode gated diode.
Claim 23
Dependent Claim
30 words
The depletion mode thin film semiconductor photodetector of claim 20 wherein said one terminal region is a n + region and the other terminal region is a p + region.
Claim 24
Dependent Claim
30 words
The depletion mode thin film semiconductor photodetector of claim 20 wherein said lower portion channel region is doped n type and said upper portion channel region is doped p type.
Claim 25
Dependent Claim
72 words
The depletion mode thin film semiconductor photodetector of claim 22 wherein said photodetector comprises p + terminal regions functioning as an ohmic contacts to said channel p region forming a thin film transistor, said photodetector having high photoconductive gain at low light intensities when said p channel region is fully pinched off by an applied gate voltage to said gate electrode sufficiently positive as compared to the threshold voltage of said photodetector.
Claim 26
Dependent Claim
16 words
The depletion mode thin film semiconductor photodetector of claim 20 wherein said gate region is semi-transparent.
Claim 27
Dependent Claim
16 words
The depletion mode thin film semiconductor photodetector of claim 20 wherein said insulating substrate is transparent.
Claim 28
Dependent Claim
36 words
The depletion mode thin film semiconductor photodetector of claim 20 wherein the acceptor and donor concentrations and profiles are chosen to permit photoconduction in said channel region with said channel region fully depleted in the dark.
Claim 29
Dependent Claim
42 words
The depletion mode thin film semiconductor photodetector of claim 26 wherein the acceptor and donor concentrations respectively in said channel p region and said channel n region are in the range from 10 16 /cm 3 to 10 18 /cm 3 .
Claim 30
Dependent Claim
27 words
The depletion mode thin film semiconductor photodetector of claim 20 wherein the thickness of said channel region is in the range of 0.3 μm to 50 μm.
Claim 31
Dependent Claim
23 words
The depletion mode thin film semiconductor photodetector of claim 20 formed by laser melting treatment to bring about recrystallization of said thin film.
Claim 32
Dependent Claim
30 words
The depletion mode thin film semiconductor photodetector of claim 1 wherein said lower portion channel region is doped p type and said upper portion channel region is doped n type.