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US4597165A
Expired / Lapsed
US
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Method of making integrated circuits employing ion-bombarded InP layers
Assignee: Nokia Bell Labs
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Filing: 1983-11-28
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Granted: 1986-07-01
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Expires: 2003-11-28
Abstract
Abstract The property of materials in the InP system, whereby helium ion or deuteron bombarded p-type material becomes highly resistive but n-type material remains relatively conductive, is utilized to fabricate integrated circuits which include buried semiconductor interconnections or bus bars between devices.
Inventors
- 👤 Federico Capasso
- 👤 Marlin W. Focht
- 👤 Albert T. Macrander
- 👤 Bertram Schwartz
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 13:27
CPC Classifications
H; H10; H10P; H10P30/00; H10P30/20; H10P30/202; H10P30/206; H10D; H10D84/00; H10D84/01; H10D84/02; H10D84/05; H10P30/208; H10P30/22; H10P95/00; H10P95/90; H10P95/904; H10W; H10W10/00; H10W10/01; H10W20/00; H10W20/01; H10W20/021; Y; Y10; Y10S; Y10S148/00; Y10S148/084
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
74 words
A method of manufacturing a device comprising the steps of (a) providing a multilayered structure having n-type and p-type Group III-V compound layers which contain InP, and (b) bombarding at least one of said n-type layers and one of said p-type layers with ions at a dose and energy so that only said at least one p-type layer becomes highly resistive, said ions being selected from the group consisting of helium ions and deuterons.
Claim 2
Independent Claim
74 words
A method of manufacturing a device comprising the steps of (a) providing a multilayered structure having n-type and p-type Group III-V compound layers which contain InP, and (b) bombarding at least one of said n-type layers and one of said p-type layers with ions at a dose and energy so that only said at least one p-type layer becomes highly resistive, said ions being selected from the group consisting of helium ions and deuterons.
Claim 3
Dependent Claim
27 words
A method of claim 1 wherein said bombarding step (b) is performed at a dose in the range of approximately 10 12 -10 15 /cm 2 .
Claim 4
Dependent Claim
39 words
The method of claim 1 including, between steps (a) and (b), the additional step of forming a patterned mask on a surface of said structure, and wherein said bombarding step (b) takes place through the openings of said mask.
Claim 5
Independent Claim
117 words
A method of manufacturing an integrated circuit comprising the steps of (a) providing a multilayered structure having layers of n-type and p-type Group III-V compound semiconductor material which contain InP, (b) bombarding at least one of said n-type layers and one of said p-type layers with ions at a dose and energy so that only said at least one p-type layer becomes highly resistive, said ions being selected from the group consisting of helium ions and deuterons, and (c) forming at least two separated devices in said structure so that said highly resistive p-type layer electrically isolates said devices from one another and said at least one n-type layer forms a relatively conductive path between said devices.
Claim 6
Independent Claim
117 words
A method of manufacturing an integrated circuit comprising the steps of (a) providing a multilayered structure having layers of n-type and p-type Group III-V compound semiconductor material which contain InP, (b) bombarding at least one of said n-type layers and one of said p-type layers with ions at a dose and energy so that only said at least one p-type layer becomes highly resistive, said ions being selected from the group consisting of helium ions and deuterons, and (c) forming at least two separated devices in said structure so that said highly resistive p-type layer electrically isolates said devices from one another and said at least one n-type layer forms a relatively conductive path between said devices.
Claim 7
Dependent Claim
75 words
The method of claim 4 wherein step (a) includes providing a structure comprising a relatively conductive n-type layer sandwiched between a pair of high resistivity p-type layers, step (b) renders said pair of p-type layers highly resistive but leaves said n-type layer relatively conductive, and step (c) at least partially embeds said devices in said layers so that said pair of p-type layers bound said n-type layer which forms said conductive path between said devices.
Claim 8
Dependent Claim
42 words
The method of claim 4 wherein said devices are at least partially embedded in said at least one p-type layer and are formed upon said at least one n-type layer which forms a buried bus bar connecting said devices to one another.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-06-30 | 1989-12-30 | 1990-07-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-06-30 | 1993-12-30 | 1994-07-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-06-30 | 1997-12-30 | 1998-07-01 | $7700.00 | Window Closed / Lapsed |