Abstract This invention relates to an image display system for a stroboscopic scanning electron microscope. In a stroboscopic scanning electron microscope having a pulse gate mechanism for chopping an electron beam and a mechanism for arbitrarily changing the phase relation between a voltage applied to a sample and the chopping, the phase change of chopping is carried out periodically and continuously and a gate circuit provided between a detector for detecting scondary electrons or deflected electrons and an image display for displaying a video signal of the secondary electron or the reflected electron to be in synchronism with the phase change allows the video signal to pass therethrough only during a certain period of phase change and to be displayed.
An image display system for a stroboscopic scanning electron microscope comprising: means for generating a pulse for chopping an electron beam emitted from an electron gun; means for allowing said chopped electron beam to scan a sample; phase circuit means for periodically changing the phase relation between a voltage supplied to said sample and said chopping pulse; and gate circuit means provided between a detector for detecting secondary electrons or reflected electrons generated by scanning said electron beam on said sample and image display means for displaying a video signal of the secondary electrons or the reflected electrons, so as to pass said video signal therethrough only during a certain period of phase relation in synchronism with said phase change by said phase circuit means.
Claim 2
Dependent Claim
125 words
An image display system for a stroboscopic scanning electron microscope comprising: means for generating a pulse for chopping an electron beam emitted from an electron gun; means for allowing said chopped electron beam to scan a sample; phase circuit means for periodically changing the phase relation between a voltage supplied to said sample and said chopping pulse; and gate circuit means provided between a detector for detecting secondary electrons or reflected electrons generated by scanning said electron beam on said sample and image display means for displaying a video signal of the secondary electrons or the reflected electrons, so as to pass said video signal therethrough only during a certain period of phase relation in synchronism with said phase change by said phase circuit means.