US4576834A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for forming trench isolation structures
Assignee: MagnaChip Semiconductor Ltd
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Filing: 1985-05-20
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Granted: 1986-03-18
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Expires: 2005-05-20
Abstract
Abstract A streamlined process for forming a fully recessed, self-planarized dielectric isolation structure involves selectively depositing organosilicon material such as orthosilicate esters or siloxane resins in substrate trenches without build-up on adjacent substrate steps, which steps are coated with a non-wetting polymer material such as fluorocarbon compounds, then converting the organosilicon material to silicon oxide by heating at about 200° C.-900° C.
Inventors
- 👤 Zbigniew P. Sobczak
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 21:21
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/69; H10P14/692; H10P14/6921; H10P14/69215; H10P14/65; H10P14/6516; H10P14/6529; H10P14/66; H10P14/662; H10P14/668; H10P14/6681; H10P14/6684; H10P14/6686; H10P14/68; H10P14/683; H10P14/687; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/014; H10W10/10; H10W10/17; H10P14/63; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/6336; H10P14/6342
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
84 words
A process for fabricating a planarized recessed silicon oxide structure in a silicon substrate trench from converted organosilicon material, comprising selectively depositing a layer of organosilicon material in a substrate trench to a height selected to provide a planar silicon oxide-substrate topography upon conversion of said material, the trench being bounded by a silicon substrate surface having thereon a coating of polymer material which is non-wetting to the layer of organosilicon material; and, heating the organosilicon material to convert said material to silicon oxide.
Claim 2
Dependent Claim
84 words
A process for fabricating a planarized recessed silicon oxide structure in a silicon substrate trench from converted organosilicon material, comprising selectively depositing a layer of organosilicon material in a substrate trench to a height selected to provide a planar silicon oxide-substrate topography upon conversion of said material, the trench being bounded by a silicon substrate surface having thereon a coating of polymer material which is non-wetting to the layer of organosilicon material; and, heating the organosilicon material to convert said material to silicon oxide.
Claim 3
Dependent Claim
107 words
A process for fabricating a planarized recessed silicon oxide structure in a silicon substrate trench from converted organosilicon material selected from orthosilicate esters or siloxane resins, comprising selectively depositing the organosilicon material in the substrate trench by spin coating to a height selected to provide a planar silicon oxide-substrate topography upon conversion of said material, the trench being bounded by a silicon substrate surface having thereon a coating of polymer material selected from fluorocarbon compounds which are non-wetting to the solution of organosilicon material; and heating the organosilicon material to a temperature within the range of about 200° C.-900° C. to convert said material to silicon oxide.
Claim 4
Dependent Claim
107 words
A process for fabricating a planarized recessed silicon oxide structure in a silicon substrate trench from converted organosilicon material selected from orthosilicate esters or siloxane resins, comprising selectively depositing the organosilicon material in the substrate trench by spin coating to a height selected to provide a planar silicon oxide-substrate topography upon conversion of said material, the trench being bounded by a silicon substrate surface having thereon a coating of polymer material selected from fluorocarbon compounds which are non-wetting to the solution of organosilicon material; and heating the organosilicon material to a temperature within the range of about 200° C.-900° C. to convert said material to silicon oxide.
Claim 5
Dependent Claim
108 words
A process for fabricating a recessed silicon oxide structure from converted organosilicon material in a silicon substrate recess, comprising: selectively forming on the substrate surface a coating of polymer material selected from fluorocarbon compounds, said polymer coating being non-wetting to the organosilicon material and being patterned in the complement of the recess area; spin coating organosilicon material selected from orthosilicate esters or siloxane resins in the trench to a height selected to provide a planar silicon oxide-substrate topography upon conversion of said organosilicon material; and heating said organosilicon material to a temperature within the range of about 200° C.-900° C. to convert said organosilicon material to silicon oxide.
Claim 6
Dependent Claim
108 words
A process for fabricating a recessed silicon oxide structure from converted organosilicon material in a silicon substrate recess, comprising: selectively forming on the substrate surface a coating of polymer material selected from fluorocarbon compounds, said polymer coating being non-wetting to the organosilicon material and being patterned in the complement of the recess area; spin coating organosilicon material selected from orthosilicate esters or siloxane resins in the trench to a height selected to provide a planar silicon oxide-substrate topography upon conversion of said organosilicon material; and heating said organosilicon material to a temperature within the range of about 200° C.-900° C. to convert said organosilicon material to silicon oxide.
Claim 7
Dependent Claim
146 words
A process for fabricating a recessed silicon oxide structure in a silicon substrate trench from converted organosilicon material selected from orthosilicate esters or siloxane resins comprising: forming in order on the silicon substrate a layered stack comprising a layer of silicon oxide, a layer of polymer material selected from fluorocarbon compounds which do not adhere to said organosilicon material, and a dielectric layer selected from silicon oxide and silicon nitride; sequentially etching the layers of the stack and the underlying substrate to define the trench in the substrate; selectively depositing said organosilicon material to a height within the trench selected to provide a silicon oxide outer surface which is substantially level with the silicon substrate outer surface upon conversion of said organosilicon material, said polymer layer preventing deposition on the silicon substrate outer surface; and heating said organosilicon material to convert said material to silicon oxide.
Claim 8
Dependent Claim
146 words
A process for fabricating a recessed silicon oxide structure in a silicon substrate trench from converted organosilicon material selected from orthosilicate esters or siloxane resins comprising: forming in order on the silicon substrate a layered stack comprising a layer of silicon oxide, a layer of polymer material selected from fluorocarbon compounds which do not adhere to said organosilicon material, and a dielectric layer selected from silicon oxide and silicon nitride; sequentially etching the layers of the stack and the underlying substrate to define the trench in the substrate; selectively depositing said organosilicon material to a height within the trench selected to provide a silicon oxide outer surface which is substantially level with the silicon substrate outer surface upon conversion of said organosilicon material, said polymer layer preventing deposition on the silicon substrate outer surface; and heating said organosilicon material to convert said material to silicon oxide.
Claim 9
Dependent Claim
19 words
The process of claim 4 wherein the heating step is done at a temperature of about 200° C.-900° C.
Claim 10
Dependent Claim
164 words
A process for fabricating a recessed silicon oxide structure in a silicon substrate trench from converted organosilicon material selected from orthosilicate esters or siloxane resins comprising: forming in order on the silicon substrate a layered stack comprising a layer of silicon oxide, a layer of polymer material selected from fluorocarbon compounds which are not wetted by said organosilicon material solution, and a dielectric layer selected from silicon oxide and silicon nitride; forming a patterned layer of resist on the dielectric layer; sequentially patterning the layers of the stack and the underlying substrate in the presence of the resist to define the trench in the substrate and remove the resist and the dielectric layer; spin coating said organosilicon material within the trench to a selected height, said polymer layer preventing deposition on the silicon substrate outer surface; removing the non-wetting polymer layer; and heating said organosilicon material to a temperature within the range of about 200° C.-900° C. to convert said material to silicon oxide.
Claim 11
Dependent Claim
164 words
A process for fabricating a recessed silicon oxide structure in a silicon substrate trench from converted organosilicon material selected from orthosilicate esters or siloxane resins comprising: forming in order on the silicon substrate a layered stack comprising a layer of silicon oxide, a layer of polymer material selected from fluorocarbon compounds which are not wetted by said organosilicon material solution, and a dielectric layer selected from silicon oxide and silicon nitride; forming a patterned layer of resist on the dielectric layer; sequentially patterning the layers of the stack and the underlying substrate in the presence of the resist to define the trench in the substrate and remove the resist and the dielectric layer; spin coating said organosilicon material within the trench to a selected height, said polymer layer preventing deposition on the silicon substrate outer surface; removing the non-wetting polymer layer; and heating said organosilicon material to a temperature within the range of about 200° C.-900° C. to convert said material to silicon oxide.
Claim 12
Dependent Claim
39 words
The process of claim 4 or 6 wherein the thickness of the silicon oxide is about 50 nm, the thickness of the polymer layer is about 10-200 nm, and the thickness of the dielectric layer is abut 50 nm.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-03-17 | 1989-09-16 | 1990-03-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-03-17 | 1993-09-16 | 1994-03-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-03-17 | 1997-09-16 | 1998-03-18 | $7700.00 | Window Closed / Lapsed |