Patent US4566193A successfully refreshed from Google Patents.
US4566193A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Use of an electronic vernier for evaluation of alignment in semiconductor processing
Assignee: Avago Technologies International Sales Pte Ltd
•
Filing: 1984-07-31
•
Granted: 1986-01-28
•
Expires: 2004-07-31
Abstract
Abstract An electronic vernier is presented which detects and quantifies misalignment between layers of material deposited upon a semiconducting wafer. Verniers may be constructed which evaluate alignment between two conducting layers, between two conducting layers and an insulating layer and between a semiconducting layer and a capacitive layer. Circuitry is described which shows how output from a vernier may be detected and quantified in order to evaluate the amount of misalignment.
Inventors
- 👤 David E. Hackleman
- 👤 Richard F. Adams
- 👤 Wayne P. Richling
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 20:58
CPC Classifications
G; G01; G01B; G01B7/00; G01B7/30; G01B7/31
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
205 words
A device for evaluating alignment of a first layer on an integrated circuit with a second layer on the integrated circuit, the device comprising: a detecting means for electrically detecting misalignment between the first layer and the second layer, the detecting means including, a first plurality of conducting material sections on the first layer, and a second plurality of conducting material sections on the second layer, wherein each section of a first group of the first plurality of conducting material sections is electrically coupled to a corresponding section of a first group of the second plurality of conducting material sections, and each section of a second group of the first plurality of conducting material sections is electrically insulated from a corresponding section of a second group of the second plurality of conducting material sections; and an output means, coupled to the detecting means for producing an output which is an encoded representation of a quantity of misalignment, wherein the output means detects which sections are within the first group of the first plurality of conducting material sections and which sections are within the second group of the first plurality of conducting material sections in order to produce the encoded representation of the quantity of misalignment.
Claim 2
Independent Claim
205 words
A device for evaluating alignment of a first layer on an integrated circuit with a second layer on the integrated circuit, the device comprising: a detecting means for electrically detecting misalignment between the first layer and the second layer, the detecting means including, a first plurality of conducting material sections on the first layer, and a second plurality of conducting material sections on the second layer, wherein each section of a first group of the first plurality of conducting material sections is electrically coupled to a corresponding section of a first group of the second plurality of conducting material sections, and each section of a second group of the first plurality of conducting material sections is electrically insulated from a corresponding section of a second group of the second plurality of conducting material sections; and an output means, coupled to the detecting means for producing an output which is an encoded representation of a quantity of misalignment, wherein the output means detects which sections are within the first group of the first plurality of conducting material sections and which sections are within the second group of the first plurality of conducting material sections in order to produce the encoded representation of the quantity of misalignment.
Claim 3
Dependent Claim
75 words
A device as in claim 1 wherein the first plurality of conducting material sections are arranged in a sequence so that when the first layer is aligned with the second layer, consecutive sections from the second group of the first plurality of conducting material sections separate some sections in the first group of the first plurality of conducting material sections from other sections in the first group of the first plurality of conducting material sections.
Claim 4
Independent Claim
205 words
A device for evaluating alignment of a first layer on an integrated circuit with a second layer on the integrated circuit, wherein the first layer comprises conducting material and the second layer comprises insulating material, wherein the integrated circuit has a third layer comprising conducting material, and wherein the second layer overlays the third layer and the first layer overlays the second layer, the device comprising: detecting means for electrically detecting misalignment between the first layer and the second layer, the detecting means including, a first plurality of conducting material sections on the first layer; a second plurality of conducting material sections on the third layer; output means, coupled to the detecting means for producing an output which is an encoded representation of a quantity of misalignment; wherein each section of a first group of the first plurality of conducting material sections is electrically coupled through windows within the insulating material to a corresponding section of a first group of the second plurality of conducting material sections, and each section of a second group of the first plurality of conducting material sections is electrically insulated by the insulating material from a corresponding section of a second group of the second plurality of conducting material sections.
Claim 5
Independent Claim
205 words
A device for evaluating alignment of a first layer on an integrated circuit with a second layer on the integrated circuit, wherein the first layer comprises conducting material and the second layer comprises insulating material, wherein the integrated circuit has a third layer comprising conducting material, and wherein the second layer overlays the third layer and the first layer overlays the second layer, the device comprising: detecting means for electrically detecting misalignment between the first layer and the second layer, the detecting means including, a first plurality of conducting material sections on the first layer; a second plurality of conducting material sections on the third layer; output means, coupled to the detecting means for producing an output which is an encoded representation of a quantity of misalignment; wherein each section of a first group of the first plurality of conducting material sections is electrically coupled through windows within the insulating material to a corresponding section of a first group of the second plurality of conducting material sections, and each section of a second group of the first plurality of conducting material sections is electrically insulated by the insulating material from a corresponding section of a second group of the second plurality of conducting material sections.
Claim 6
Dependent Claim
54 words
A device as in claim 3 wherein the output means determines which sections are within the first group of the first plurality of conducting material sections and which sections are within the second group of the first plurality of conducting material sections in order to produce the encoded representation of the quantity of misalignment.
Claim 7
Dependent Claim
75 words
A device as in claim 4 wherein the first plurality of conducting material sections are arranged in a sequence so that when the first layer is aligned with the second layer, consecutive sections from the second group of the first plurality of conducting material sections separate some sections in the first group of the first plurality of conducting material sections from other sections in the first group of the first plurality of conducting material sections.
Claim 8
Independent Claim
164 words
A device for evaluating alignment of a first layer on an integrated circuit with a second layer on the integrated circuit, the device comprising: detecting means for electrically detecting misalignment between the first layer and the second layer, the detecting means comprising, a plurality of capacitive material sections on the second layer, and, a plurality of semiconducting material sections on the first layer, each semiconducting material section having a first end, a second end, and a channel, each channel in a first group of the plurality of semiconducting material sections having a first conductivity value and each channel in a second group of the plurality of semiconducting material having a second conductivity value, the conductivity value of each channel depending upon the relative position of the semiconducting material section containing each channel with capacitive material sections associated with each semiconducting material section; and, output means, coupled to the detecting means for producing an output which is an encoded representation of a quantity of misalignment.
Claim 9
Independent Claim
164 words
A device for evaluating alignment of a first layer on an integrated circuit with a second layer on the integrated circuit, the device comprising: detecting means for electrically detecting misalignment between the first layer and the second layer, the detecting means comprising, a plurality of capacitive material sections on the second layer, and, a plurality of semiconducting material sections on the first layer, each semiconducting material section having a first end, a second end, and a channel, each channel in a first group of the plurality of semiconducting material sections having a first conductivity value and each channel in a second group of the plurality of semiconducting material having a second conductivity value, the conductivity value of each channel depending upon the relative position of the semiconducting material section containing each channel with capacitive material sections associated with each semiconducting material section; and, output means, coupled to the detecting means for producing an output which is an encoded representation of a quantity of misalignment.
Claim 10
Dependent Claim
65 words
A device as in claim 6 wherein the detecting means additionally comprises a current source coupled to the first end of each of the semiconducting material sections, and a plurality of current detection means each current detecting means coupled to the second end of the semiconducting material sections, for detecting whether each semiconducting material section has the first conductivity value or the second conductivity value.
Claim 11
Dependent Claim
71 words
A device as in claim 7 wherein the plurality of semiconducting material sections are arranged in a sequence so that when the first layer is aligned with the second layer, consecutive sections from the second group of the plurality of semiconducting material sections separate some sections in the first group of the plurality of semiconducting material sections from other sections in the first group of the plurality of semiconducting material sections.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-01-27 | 1989-07-29 | 1990-01-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-01-27 | 1993-07-29 | 1994-01-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-01-27 | 1997-07-29 | 1998-01-28 | $7700.00 | Window Closed / Lapsed |