US4553029A
Expired / Lapsed
US
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Mass spectrometer
Assignee: Jeol Ltd
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Filing: 1984-05-17
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Granted: 1985-11-12
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Expires: 2004-05-17
Abstract
Abstract A mass spectrometer has a uniform magnetic field and an electric field. Further, the spectrometer is equipped with three spaced electrostatic quadrupole lenses. The deflection angle phi m of the beam in the magnetic field, the radius rm of the circle described by the beam in the magnetic field, the deflection angle phi e of the beam in the electric field, and the radius re of the circle described by the beam in the electric field are so set as to satisfy the following relations: 82 DEG </= phi e</=88 DEG ; 39 DEG </= phi m</=41 DEG 0.715</=re/rm</=0.755. The spectrometer can measure masses over a wide range even if it is built as a small-sized instrument. Thus, the instrument is able to measure molecular ions of large masses.
Inventors
- 👤 Hisashi Matsuda
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 10:10
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/02; H01J49/06; H01J49/26; H01J49/28; H01J49/32
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
194 words
A mass spectrometer having an ion source, an ion detector for detecting the ions emitted from the ion source, a uniform magnetic field set up between the ion source and the ion detector, an electric field set up between the magnetic field and the ion detector, and two electrostatic quadrupole lenses disposed between the ion source and the magnetic field in spaced relation to each other for converging the beam of the ions in a direction perpendicular to the plane of the orbit of the beam and for diverging the beam radially of the beam, another electrostatic quadrupole lens disposed between the magnetic field and the electric field to converge the beam in the direction of the plane of said orbit, such that the deflection angle φ m of the beam in the magnetic field, the radius r m of the circle described by the beam in the magnetic field, the deflection angle φ e of the beam in the electric field, and the radius r e of the circle described by the beam in the electric field are so set as to satisfy the following relations: 82°≦φ.sub.e ≦88° 39°≦φ.sub.m ≦41° 0.715≦r.sub.e /r.sub.m ≦0.755
Claim 2
Dependent Claim
194 words
A mass spectrometer having an ion source, an ion detector for detecting the ions emitted from the ion source, a uniform magnetic field set up between the ion source and the ion detector, an electric field set up between the magnetic field and the ion detector, and two electrostatic quadrupole lenses disposed between the ion source and the magnetic field in spaced relation to each other for converging the beam of the ions in a direction perpendicular to the plane of the orbit of the beam and for diverging the beam radially of the beam, another electrostatic quadrupole lens disposed between the magnetic field and the electric field to converge the beam in the direction of the plane of said orbit, such that the deflection angle φ m of the beam in the magnetic field, the radius r m of the circle described by the beam in the magnetic field, the deflection angle φ e of the beam in the electric field, and the radius r e of the circle described by the beam in the electric field are so set as to satisfy the following relations: 82°≦φ.sub.e ≦88° 39°≦φ.sub.m ≦41° 0.715≦r.sub.e /r.sub.m ≦0.755
Claim 3
Dependent Claim
54 words
Apparatus according to claim 1 wherein the quadrupole lenses have Py electrodes spaced from the ion beam path in the y-direction and Px poles spaced from the ion beam path in the x-direction and the polarity of the voltage applied to the Py electrodes is the same as that of the ions being analyzed.
Claim 4
Dependent Claim
34 words
Apparatus according to claim 2 wherein the entrance end surface and the exit end surface of the magnetic field are tilted to cause the beam of ions to enter and leave the field obliquely.
Claim 5
Dependent Claim
12 words
Apparatus according to claim 3 wherein the entrance end surface is curved.
References Cited (Backward Citations)
US4418280A
Cited
US4480187A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-11-11 | 1989-05-13 | 1989-11-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-11-11 | 1993-05-13 | 1993-11-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-11-11 | 1997-05-13 | 1997-11-12 | $7700.00 | Window Closed / Lapsed |