← Back to Patent Explorer
US4418280A Expired / Lapsed US ⏱️ 0.0 years remaining

Double focusing mass spectrometer

Assignee: Jeol Ltd
•
Filing: 1981-06-05
•
Granted: 1983-11-29
•
Expires: 2001-06-05
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A double focusing mass spectrometer having a diverging electrostatic field, a converging electrostatic field and a converging magnetic field. The two electrostatic fields are connected with each other without substantial free space therebetween. The ion beam passes through the electrostatic fields coming to an intermediate focus point adjacent to the ion exit boundary of said converging electrostatic field. The beam then passes through the magnetic field to satisfy the double focusing condition in combination with the electrostatic field. Very small image magnification and aberration free focusing are obtained by this mass spectrometer.

Inventors

  • 👤 Hisashi Matsuda

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 17:05
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/32

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 141 words
A double focusing mass spectrometer comprising: an ion source for producing an ion beam; first inner and outer electrodes for producing a diverging electrostatic field so as to diverge the ions emitted from said source; second inner and outer electrodes for producing a converging electrostatic field so as to converge the ions delivered from said diverging electrostatic field at an intermediate focus point; means for producing a converging magnetic field so as to re-converge the ions once converged at said intermediate focus point by said converging electrostatic field; and means for detecting the ions converged by the magnetic field; such that said two electrostatic fields are connected with each other without substantial free space therebetween, and that said intermediate focus point of the ion beam is formed at a position adjacent to the ion exit boundary of said converging electrostatic field.
Claim 2
Dependent Claim 141 words
A double focusing mass spectrometer comprising: an ion source for producing an ion beam; first inner and outer electrodes for producing a diverging electrostatic field so as to diverge the ions emitted from said source; second inner and outer electrodes for producing a converging electrostatic field so as to converge the ions delivered from said diverging electrostatic field at an intermediate focus point; means for producing a converging magnetic field so as to re-converge the ions once converged at said intermediate focus point by said converging electrostatic field; and means for detecting the ions converged by the magnetic field; such that said two electrostatic fields are connected with each other without substantial free space therebetween, and that said intermediate focus point of the ion beam is formed at a position adjacent to the ion exit boundary of said converging electrostatic field.
Claim 3
Dependent Claim 34 words
The double focusing mass spectrometer of claim 1 wherein the first and second inner electrodes are electrically connected with each other, and the first and second outer electrodes are electrically connected with each other.
Claim 4
Dependent Claim 27 words
The double focusing mass spectrometer of claim 1 wherein the radii of curvature of the central orbits of the ions in said two electrostatic fields are equal.
Claim 5
Dependent Claim 37 words
The double focusing mass spectrometer of claim 1, 2 or 3 further comprising a quadrupole lens means disposed between said intermediate focus point and said converging magnetic field for converging the ion beam in the Z direction.
Claim 6
Dependent Claim 142 words
A mass spectrometer comprising: an ion source for producing an ion beam; means for producing a diverging electrostatic field so as to diverge the ions emitted from said source; means for producing a converging electrostatic field so as to converge the ions delivered from said diverging electrostatic field at an intermediate focus point; means for producing a converging magnetic field so as to re-converge the ions once converged at said intermediate focus point and to satisfy the double focusing condition in combination with said means for producing electrostatic fields; and means for detecting the ions converged by the magnetic field; such that said two electrostatic fields are connected with each other without substantial free space therebetween, and that said intermediate focus point of the ion beam is formed at a position adjacent to the ion exit boundary of said converging electrostatic field.
Claim 7
Dependent Claim 142 words
A mass spectrometer comprising: an ion source for producing an ion beam; means for producing a diverging electrostatic field so as to diverge the ions emitted from said source; means for producing a converging electrostatic field so as to converge the ions delivered from said diverging electrostatic field at an intermediate focus point; means for producing a converging magnetic field so as to re-converge the ions once converged at said intermediate focus point and to satisfy the double focusing condition in combination with said means for producing electrostatic fields; and means for detecting the ions converged by the magnetic field; such that said two electrostatic fields are connected with each other without substantial free space therebetween, and that said intermediate focus point of the ion beam is formed at a position adjacent to the ion exit boundary of said converging electrostatic field.
Claim 8
Dependent Claim 27 words
The double focusing mass spectrometer of claim 5 wherein the radii of curvature of the central orbits of the ions in said two electrostatic fields are equal.
Claim 9
Dependent Claim 27 words
The double focusing mass spectrometer of claim 5 or 6 further comprising a quadrupole lens means disposed between said intermediate focus point and said converging magnetic field.

References Cited (Backward Citations)

US3061720A Cited
US3202817A Cited
US3920988A Cited
DE2440138A1 Cited
US3944827A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-11-28 1987-05-30 1987-11-29 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-11-28 1991-05-30 1991-11-29 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-11-28 1995-05-30 1995-11-29 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag