Aperture structure for charged beam exposure

Claim 2

An aperture structure for a charged particle beam exposure apparatus which includes an electron optical system having an optical axis, said aperture structure comprising: an electrically conductive sheet having an opening therein, said opening havinq straight edges; a base having a plurality of pins projecting therefrom, said base being disposed on said optical axis of said electron optical system of said charged particle beam exposure apparatus and having an opening therein opposed to said opening of said conductive sheet for passing a charged beam therethrough; and fine wires stretched between respective pins of said base, said fine wires having side edges which are individually located inside at least two adjacent sides of the opening of the conductive sheet, said fine wires defining an opening smaller than the opening of the conductive sheet, said opening defined by said fine wires defining the cross-section of the charged particle beam; said electrically conductive sheet being disposed adjacent at least one side of said fine wires; said opening of said conductive sheet being a polygonal opening one corner of which is right-angled; and said plurality of pins being located so that the fine wires thereon define the sides of the aperture corresponding to the individual sides of said polygonal opening of said conductive sheet.

Claim 3

The aperture structure of claim 1, wherein said opening of said electrically conductive sheet has two adjacent sides intersecting at right angles, and wherein said plurality of pins comprises two pairs of pins opposed to one another with said opening of said conductive sheet being in the center of the area defined by said pins, so that two parallel sections of each fine wire define each of two opposite sides of said opening of said conductive sheet.

Claim 4

The aperture structure of claim 2, wherein said opening of said electrically conductive sheet is a square opening.

Claim 5

The aperture structure of claim 2, wherein each of said pins has a diameter shorter than the length of each side of said opening of said electrically conductive sheet.

Claim 6

The aperture structure of claim 3, wherein said plurality of pins comprises four pairs of pins which are so arranged that the fine wires stretched therebetween define individual sides of said square opening of said electrically conductive sheet.

Claim 7

The aperture structure of claim 1, wherein said opening of said electrically sheet is a square opening having two right-angled corners, and wherein at least one of said plurality of pins is different in diameter from the others of said pins, so that a fine wire wound thereon defines one side of said square opening inclined at an angle to another side of said square opening.

Claim 8

The aperture structure of claim 1, wherein said electrically conductive sheet is interposed between said base and said fine wires.

Claim 9

The aperture structure of claim 1, wherein said electrically conductive sheet is arranged on the side of said fine wires remote from said base.

Claim 10

The aperture structure of claim 1, comprising two of said electrically conductive sheets having said openings therein, one of said electrically conductive sheets being interposed between said fine wires and said base, and the other of said electrically conductive sheets being arranged on the side of said fine wires remote from said base, whereby said fine wires are sandwiched between said electrically conductive sheets.

Claim 11

The aperture structure of claim 1, wherein said electrically conductive sheet is located on said fine wires in contact therewith.

Claim 12

The aperture structure of claim 1, wherein said fine wires are spaced from said base, and wherein said electrically conductive sheet is interposed between said fine wires and said base so as to fill in said space therebetween.

Claim 13

The aperture structure of claim 1, wherein said fine wires are formed from a material selected from the group consisting of gold platinum, silver, tungsten, gilded tungsten and gilded glass fiber.

Claim 14

The aperture structure of claim 1, wherein said conductive sheet is formed from a material selected from the group consisting of molybdenum, titanium, tungsten, stainless steel, copper, aluminum, gold, and gilded versions of molybdenum, titanium, tungsten, stainless steel, copper and aluminum.

Claim 15

The aperture structure of claim 1, wherein said base is formed from a material selected from the group consisting of titantium, stainless, steel, copper, phosphor bronze, brass, beryllium copper, aluminum, aluminum alloy and gilded ceramics.

Claim 16

An aperture structure for a charged particle beam exposure apparatus which includes an electron optical system having an optical axis, said aperture structure comprising: an electrically conductive sheet having an opening therein, said opening having straight edges; a base having a plurality of pins projecting therefrom, said base being disposed on said optical axis of said electron optical system of said charged particle beam exposure apparatus and having an opening therein opposed to said opening of said conductive sheet for passing a charged particle beam therethrough; and fine wires stretched between respective pins of said base, said fine wires having side edges which are individually located inside at least two adjacent sides of the opening of the conductive sheet, said fine wires defining an opening smaller than the opening of the conductive sheet, said opening defined by said fine wires defining the cross-section of the charged particle beam; said electrically conductive sheet being disposed adjacent at least one side of said fine wires; said opening of said conductive sheet comprising a plurality of square openings arranged in at least one row; and said fine wires being stretched between selected ones of said plurality of pins so as to define respective square openings smaller than said square openings of said conductive sheet so that each fine wire section defines corresponding sides of the square openings in each row of said square openings.

Claim 17

An aperture structure for a charged particle beam exposure apparatus which includes an electron optical system having an optical axis, said aperture structure comprising: an electrically conductive sheet having an opening therein, said opening having straight edges; a base having a plurality of pins projecting therefrom, said base being disposed on said optical axis of said electron optical system of said charged particle beam exposure apparatus and having an opening therein opposed to said opening of said conductive sheet for passing a charged particle beam therethrough; and fine wires stretched between respective pins of said base, said fine wires having side edges which are individually located inside at least two adjacent sides of the opening of the conductive sheet, said fine wires defining an opening smaller than the opening of the conductive sheet, said opening defined by said fine wires defining the cross-section of the charged particle beam; said electrically conductive sheet being disposed adjacent at least one side of said fine wires; said opening of said conductive sheet comprising a plurality of square openings arranged in at least one row; and said fine wires being stretched between selected ones of said plurality of pins so as to define respective square openings smaller than said square openings of said conductive sheet so that each fine wire section defines corresponding sides of the square openings in each row of said square openings.

Claim 18

The aperture structure of claim 15, wherein said electrically conductive sheet is interposed between said base and said fine wires.

Claim 19

The aperture structure of claim 15, wherein said electrically conductive sheet is arranged on the side of said fine wires remote from said base.

Claim 20

The aperture structure of claim 15, comprising two of said electrically conductive sheets having said openings therein, one of said electrically conductive sheets being interposed between said fine wires and said base, and the other of said electrically conductive sheets being arranged on the side of said fine wires remote from said base, whereby said fine wires are sandwiched between said electrically conductive sheets.

Claim 21

The aperture structure of claim 15, wherein said electrically conductive sheet is located on said fine wires in contact therewith.

Claim 22

The aperture structure of claim 15, wherein said fine wires are spaced from said base, and wherein said electrically conductive sheet is interposed between said fine wires and said base so as to fill in said space therebetween.

Claim 23

The aperture structure of claim 15, wherein said fine wires are formed from a material selected from the group consisting of gold, platinum, silver, tungsten, gilded tungsten and gilded glass fiber.

Claim 24

The aperture structure or claim 15, wherein said conductive sheet is formed from a material selected from the group consisting of molybdenum, titanium, tungsten, stainless steel, copper, aluminum, gold, and gilded versions of molybdenum, titanium, tungsten, stainless steel, copper and aluminum.

Claim 25

The aperture structure of claim 15, wherein said base is formed from a material selected from the group consisting of titantium, stainless, steel, copper, phosphor bronze, brass, beryllium copper, aluminum, aluminum alloy and gilded ceramics.

Claim 26

An aperture structure for a charged particle beam exposure apparatus which includes an election optical system having an optical axis, said aperture structure comprising: an electronically conductive sheet having an opening therein, said opening having straight edges; fine wires arranged adjacent straight edges of said opening of said electrically conductive sheet, said fine wires having side edges which are individually located inside at least two adjacent sides of the opening of the conductive sheet, said fine wires defining an opening smaller than the opening of the conductive sheet, said opening defined by said fine wires defining the cross-section of the charged particle beam; said electrically conductive sheet being disposed adjacent at least one side of said fine wires; and winding means for supporting each of said fine wires at each end thereof, said winding means being arranged for winding said fine wires so that the aperture forming portion of said fine wires can be renewed by fresh portions of said fine wires.

Claim 27

An aperture structure for a charged particle beam exposure apparatus which includes an election optical system having an optical axis, said aperture structure comprising: an electronically conductive sheet having an opening therein, said opening having straight edges; fine wires arranged adjacent straight edges of said opening of said electrically conductive sheet, said fine wires having side edges which are individually located inside at least two adjacent sides of the opening of the conductive sheet, said fine wires defining an opening smaller than the opening of the conductive sheet, said opening defined by said fine wires defining the cross-section of the charged particle beam; said electrically conductive sheet being disposed adjacent at least one side of said fine wires; and winding means for supporting each of said fine wires at each end thereof, said winding means being arranged for winding said fine wires so that the aperture forming portion of said fine wires can be renewed by fresh portions of said fine wires.

Claim 28

The aperture structure of claim 24, further comprising: a base disposed on said optical axis of said electron optical system, and having an opening therein opposed to said opening of said conductive sheet for passing a charged particle beam therethrough; said winding means being mounted on said base.

Claim 29

The aperture structure of claim 25, further comprising guide pins on said base between edges of said opening of said electrically conductive sheet and said respective winding means for guiding and positioning said fine wires relative to said opening of said electrically conductive sheet.

Claim 30

The aperture structure of claim 25, wherein said electrically conductive sheet is located on said fine wires in contact therewith.

Claim 31

The aperture structure of claim 25, wherein said fine wires are spaced from said base and wherein said electrically conductive sheet is interposed between said fine wires and said base so as to fill in said space therebetween.