Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
157 words
In an analytical instrument of the type having a source of analytical radiation, having means for detecting said analytical radiation and having means for supporting a sample to be analyzed, an improved beam condenser system having optical elements directing said analytical radiation along an optical path to said sample supporting means, including first means for focusing said analytical radiation relative to said sample supporting means, and from said sample supporting means to said radiation detecting means, including second means for focusing said analytical radiation relative to said radiation detecting means, said optical elements further comprising means for collimating analytical radiation focused by said first means and means for deflecting analytical radiation collimated by said collimating means to said second means, said collimating means and deflecting means being supported for common movement in a first direction and said collimating means being supported for movement, independently of said deflecting means, in a second direction orthogonal to said first direction.
Claim 2
Dependent Claim
157 words
In an analytical instrument of the type having a source of analytical radiation, having means for detecting said analytical radiation and having means for supporting a sample to be analyzed, an improved beam condenser system having optical elements directing said analytical radiation along an optical path to said sample supporting means, including first means for focusing said analytical radiation relative to said sample supporting means, and from said sample supporting means to said radiation detecting means, including second means for focusing said analytical radiation relative to said radiation detecting means, said optical elements further comprising means for collimating analytical radiation focused by said first means and means for deflecting analytical radiation collimated by said collimating means to said second means, said collimating means and deflecting means being supported for common movement in a first direction and said collimating means being supported for movement, independently of said deflecting means, in a second direction orthogonal to said first direction.
Claim 3
Dependent Claim
16 words
The analytical instrument of claim 1 wherein said collimating and deflecting means each comprise reflecting elements.
Claim 4
Dependent Claim
17 words
The analytical instrument of claim 2 wherein said sample supporting means is movable in said second direction.
Claim 5
Dependent Claim
30 words
The analytical instrument of claim 2 wherein said sample supporting means is movable in said second direction and movable in a third direction orthogonal to said first and second directions.
Claim 6
Dependent Claim
20 words
The analytical instrument of claim 1 wherein said collimating means comprises refracting means and said deflecting means comprises reflecting means.
Claim 7
Dependent Claim
16 words
The analytical instrument of claim 5 wherein said supporting means is movable in said first direction.
Claim 8
Dependent Claim
30 words
The analytical instrument of claim 5 wherein said sample supporting means is movable in said first direction and movable in a third direction orthogonal to said first and second directions.
Claim 9
Dependent Claim
42 words
The analytical instrument of claim 1 wherein said collimating means is carried for movement in said second direction by first support means, said first support means and said deflecting means being carried for movement in said first direction by second support means.
Claim 10
Dependent Claim
18 words
The analytical instrument of claim 1 wherein said sample supporting means comprises means for supporting an ATR crystal.
Claim 11
Dependent Claim
28 words
The analytical instrument of claim 1 wherein said sample supporting means and beam condenser system are contained in a dedicated sample compartment forming a part of said instrument.
Claim 12
Dependent Claim
58 words
The analytical instrument of claim 1 wherein movement of said collimating means in one of said first and second directions compensates for differences in the thickness of samples supported by said sample supporting means and movement in the other of said directions compensates for differences in optical path to and from samples supported by said sample supporting means.