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US4544470A Expired / Lapsed US ⏱️ 0.0 years remaining

Electrochemical photocatalytic structure

Assignee: Ford Motor Co
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Filing: 1984-05-31
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Granted: 1985-10-01
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Expires: 2004-05-31
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Abstract

Abstract A planar photoelectrochemical structure includes a thin, porous layer of semiconductor powder material on a catalytic film. Using incident light absorbed by the semiconductor, the structure is suited to photosensitizing redox reactions of substrates introduced to the structure in an aqueous gas-phase environment. Conducting catalyst films allow significant external electrical interaction with the photoelectrochemical process occurring in the layer.

Inventors

  • 👤 Robert E. Hetrick

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 18:17
CPC Classifications
B; B01; B01J; B01J35/00; B01J35/30; B01J35/33; C; C25; C25B; C25B1/00; C25B1/50; C25B1/55; Y; Y02; Y02P; Y02P20/00; Y02P20/10; Y02P20/133; Y10; Y10S; Y10S204/00; Y10S204/03

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 181 words
An electrochemical photocatalytic structure for photosensitizing chemical reduction-oxidation reactions including: a substrate means for providing physical support for said structure; a film of catalyst material deposited on said substrate means; a porous layer of semiconductor powder adjacent said catalyst material, and adapted for photoactivity wherein said semiconductor powder layer has a porosity of about 50% to about 75% and has a grain size less than about 1 micrometer to 0.02 micrometer, at least some of said semiconductor powder grains are in contact with said film of catalyst material, and at least a portion of said film of catalyst material is uncovered by said semiconductor powder grains so as to be exposed for electrochemical reaction; and said semiconductor powder including spaced grains of semiconductor material to provide a pore volume so as to pass a chemical reactant which is subjected to a photochemical reduction-oxidation reaction when said structure is illuminated with light having a wavelength with an energy above the electron bandgap energy of said semiconductor material so that both electron and hole carriers are created in said layer of semiconductor powder.
Claim 2
Dependent Claim 181 words
An electrochemical photocatalytic structure for photosensitizing chemical reduction-oxidation reactions including: a substrate means for providing physical support for said structure; a film of catalyst material deposited on said substrate means; a porous layer of semiconductor powder adjacent said catalyst material, and adapted for photoactivity wherein said semiconductor powder layer has a porosity of about 50% to about 75% and has a grain size less than about 1 micrometer to 0.02 micrometer, at least some of said semiconductor powder grains are in contact with said film of catalyst material, and at least a portion of said film of catalyst material is uncovered by said semiconductor powder grains so as to be exposed for electrochemical reaction; and said semiconductor powder including spaced grains of semiconductor material to provide a pore volume so as to pass a chemical reactant which is subjected to a photochemical reduction-oxidation reaction when said structure is illuminated with light having a wavelength with an energy above the electron bandgap energy of said semiconductor material so that both electron and hole carriers are created in said layer of semiconductor powder.
Claim 3
Dependent Claim 38 words
An electrochemical photocatalytic structure as recited in claim 1 further including: an electrolyte material added to said porous layer of semiconductor powder so that said pore volume becomes ionically conducting in the presence of an appropriate chemical reactant.
Claim 4
Dependent Claim 62 words
An electrochemical photocatalytic structure as recited in claim 2 wherein: said grains of semiconductor material are an n-type semiconductor material with a surface adapted to promote an oxidation half reaction of the chemical reactant adjacent said grains of semiconductor material; and said film of catalyst material is adapted to promote a reduction half reaction of the chemical reactant adjacent said catalyst material.
Claim 5
Dependent Claim 56 words
An electrochemical photocatalytic structure as recited in claim 3 where said semiconductor powder layer is n-type TiO 2 , said catalyst material film is platinum, said electrolyte in the pore volume is an alkali hydroxide, and said chemical reactant is water so that upon illumination, the water is converted into H 2 and O 2 .
Claim 6
Dependent Claim 35 words
A structure as recited in claim 3 wherein said semiconductor powder layer portion is n-type TiO 2 , said reactant is formic acid, said electrolyte is sodium formate and said catalyst material film is platinum.
Claim 7
Dependent Claim 61 words
An electrochemical photocatalytic structure as recited in claim 2 wherein: said grains of semiconductor material are a p-type semiconductor with a surface adapted to promote a reduction half reaction of the chemical reactant adjacent said grains of semiconductor material; and said film of catalyst material is adapted to promote an oxidation half reaction of the chemical reactant adjacent said catalyst material.
Claim 8
Dependent Claim 26 words
An electrochemical photocatalytic structure as recited in claim 2 wherein the thickness of said semiconductor powder layer is in the range of about 1μ to 20μ.

References Cited (Backward Citations)

US4094751A Cited
JPS5377188A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-09-30 1989-04-01 1989-10-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-09-30 1993-04-01 1993-10-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-09-30 1997-04-01 1997-10-01 $7700.00 Window Closed / Lapsed

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