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Process for the manufacture of semiconductor wafers with a rear side having a gettering action

Assignee: Siltronic AG
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Filing: 1983-10-19
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Granted: 1985-09-03
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Expires: 2003-10-19
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Abstract

Abstract For the manufacture of semiconductor wafers with a rear side having a gettering action in subsequent oxidation processes by means of the action of light, especially laser, radiation ("laser damage"), there are advantageously chosen wafers with a fine surface structure that contains faces that are inclined by at least 15 DEG in the actual profile by comparison with the geometrically ideal profile of the surface according to known standards. As a result, in comparison to smooth surfaces, considerable savings in energy and time are achieved.

Inventors

  • 👤 Josef Kramler
  • 👤 Franz Kuhn-Kuhnenfeld
  • 👤 Hans-Adolf Gerber

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 01:22
CPC Classifications
H; H10; H10P; H10P36/00; H10P36/03; H10P34/00; H10P34/40; H10P34/42; Y; Y10; Y10S; Y10S148/00; Y10S148/06

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 144 words
A process for the manufacture of semiconductor wafers with a rear side having a gettering action by the action of light radiation so as to induce a gettering dislocation network in subsequent high-temperature processes, comprising the steps of: selecting semiconductor wafers each having a rear side that contains in its fine surface structure faces that are inclined by at least 15° with respect to the geometrically ideal surface of the wafer; and melting parts of the rear sides of said wafers by the action of light radiation so as to induce a gettering dislocation network in the surface region of the rear side of the wafers, the incident energy density of said light radiation employed in said melting step being 20 to 80% of the energy density that is necessary for producing a similarly dense dislocation network in a mirror-polished surface of a wafer.
Claim 2
Dependent Claim 144 words
A process for the manufacture of semiconductor wafers with a rear side having a gettering action by the action of light radiation so as to induce a gettering dislocation network in subsequent high-temperature processes, comprising the steps of: selecting semiconductor wafers each having a rear side that contains in its fine surface structure faces that are inclined by at least 15° with respect to the geometrically ideal surface of the wafer; and melting parts of the rear sides of said wafers by the action of light radiation so as to induce a gettering dislocation network in the surface region of the rear side of the wafers, the incident energy density of said light radiation employed in said melting step being 20 to 80% of the energy density that is necessary for producing a similarly dense dislocation network in a mirror-polished surface of a wafer.
Claim 3
Dependent Claim 14 words
The process of claim 1, wherein laser light is used as said light radiation.
Claim 4
Dependent Claim 11 words
The process of claim 1, wherein alkaline-etched semiconductor wafers are selected.
Claim 5
Dependent Claim 17 words
The process of claim 1, wherein said selected semiconductor wafers are subjected to a stacking fault-inducing treatment.
Claim 6
Dependent Claim 11 words
The process of claim 1, wherein said wafers selected are damage-free.
Claim 7
Dependent Claim 28 words
The process of claim 1, wherein said light radiation employed in said melting step is of an intensity which avoids vaporization of said rear side of said wafers.
Claim 8
Dependent Claim 107 words
A process for the manufacture of semiconductor wafers with a rear side having a gettering action by the action of light radiation so as to induce a gettering dislocation network in subsequent high-temperature processes, comprising the steps of: selecting damage-free semiconductor wafers each having a rear side that contains in its fine surface structure faces that are inclined by at least 15° with respect to the geometrically ideal surface of the wafer; and melting parts of the rear sides of said wafers by the action of light radiation so as to induce a gettering dislocation network in the surface region of the rear side of the wafers.
Claim 9
Dependent Claim 107 words
A process for the manufacture of semiconductor wafers with a rear side having a gettering action by the action of light radiation so as to induce a gettering dislocation network in subsequent high-temperature processes, comprising the steps of: selecting damage-free semiconductor wafers each having a rear side that contains in its fine surface structure faces that are inclined by at least 15° with respect to the geometrically ideal surface of the wafer; and melting parts of the rear sides of said wafers by the action of light radiation so as to induce a gettering dislocation network in the surface region of the rear side of the wafers.
Claim 10
Dependent Claim 36 words
The process of claim 7, wherein the incident energy density of said light radiation employed in said melting step is 20 to 80% of the energy density that is necessary for producing a of a wafer.
Claim 11
Dependent Claim 14 words
The process of claim 7, wherein laser light is used as said light radiation.
Claim 12
Dependent Claim 11 words
The process of claim 7, wherein alkaline-etched semiconductor wafers are selected.
Claim 13
Dependent Claim 17 words
The process of claim 7, wherein said selected semiconductor wafers are subjected to a stacking fault-inducing treatment.
Claim 14
Dependent Claim 28 words
The process of claim 7, wherein said light radiation employed in said melting step is of an intensity which avoids vaporization of said rear side of said wafers.

References Cited (Backward Citations)

US3905162A Cited
US4131487A Cited
US4144099A Cited
US4276114A Cited
US4319119A Cited
DE2927220A1 Cited
US4257827A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-09-02 1989-03-04 1989-09-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-09-02 1993-03-04 1993-09-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-09-02 1997-03-04 1997-09-03 $7700.00 Window Closed / Lapsed

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