Scanning electron microscope with an optical microscope

Claim 2

A scanning electron microscope comprising: (a) a specimen chamber having a removable front cover; (b) an electron gun for creating an electron beam; (c) means for coverging the electron beam to a spot on a specimen; (d) means for scanning the spot of the electron beam over the specimen; (e) a detector for generating a signal in response to the electron beam spot scanning over the specimen; (f) image means for displaying an image in response to the signal from said detector by modulating a CRT beam scanned in synchronism with the electron beam spot scanning said specimen; (g) a specimen moving mechanism for supporting and moving the specimen in the specimen chamber said mechanism being supported from said front cover; (h) slide support means for illuminating the specimen with light in the direction in which the electron beam irradiates the specimen, said detector being mounted on said slide support in said specimen chamber for detecting backscattered and/or secondary electrons from the specimen; and (i) an optical microscope having an objective lens unit disposed adjacent to the specimen moving mechanism along the optical axis in said specimen chamber for receiving light passed through the specimen, and an eyepiece unit disposed outside of said specimen chamber for receiving the light having passed through said objective lens, said objective lens unit and eyepiece unit supported from said front cover.

Claim 3

A scanning electron microscope according to claim 1, wherein said slide support is also mounted on said front cover.

Claim 4

A scanning electron microscope according to claim 1, wherein switch means for detecting a position of said slide support in said specimen chamber generates a position signal and the signal is used to prevent illumination of the specimen with light.

Claim 5

A scanning electron microscope according to claim 1, wherein said objective lens unit includes a plurality of objective lenses selectively usable under control from outside of said specimen chamber.

Claim 6

A scanning electron microscope comprising: (a) a specimen chamber having a removable front cover; (b) an electron gun for creating an electron beam; (c) condenser means for converging said electron beam to a spot on a specimen; (d) means for scanning the spot of the electron beam over the specimen; (e) a detector for generating a signal in response to the electron beam spot scanning over the specimen; (f) image means for displaying an image in response to the signal from said detector by modulating a CRT beam scanned in synchronism with the electron beam spot scanning said specimen; (g) a specimen moving mechanism for supporting and moving the specimen in the specimen chamber, said mechanism being supported from said front cover; (h) slide support means for illuminating the specimen with light in the direction in which the electron beam irradiates on the specimen, said detector being mounted on said slide support in said specimen chamber for detecting backscattered and/or secondary electrons from the specimen; (i) an optical microscope having an objective lens unit adjacent to the specimen moving mechanism along the optical axis disposed in said specimen chamber for receiving light passed through the specimen, and an eyepiece unit disposed outside of said specimen chamber for receiving the light having passed through said objective lens, said objective lens unit and said eyepiece unit mounted on said front cover; and (j) protection means comprising means for detecting a position of the specimen moving mechanism and means in response to an output from said detector means for preventing the electron beam from reaching the specimen position.

Claim 7

A scanning electron microscope comprising: (a) a specimen chamber having a removable front cover; (b) an electron gun for creating an electron beam; (c) condenser means for converging said electron beam to a spot on a specimen; (d) means for scanning the spot of the electron beam over the specimen; (e) a detector for generating a signal in response to the electron beam spot scanning over the specimen; (f) image means for displaying an image in response to the signal from said detector by modulating a CRT beam scanned in synchronism with the electron beam spot scanning said specimen; (g) a specimen moving mechanism for supporting and moving the specimen in the specimen chamber, said mechanism being supported from said front cover; (h) slide support means for illuminating the specimen with light in the direction in which the electron beam irradiates on the specimen, said detector being mounted on said slide support in said specimen chamber for detecting backscattered and/or secondary electrons from the specimen; (i) an optical microscope having an objective lens unit adjacent to the specimen moving mechanism along the optical axis disposed in said specimen chamber for receiving light passed through the specimen, and an eyepiece unit disposed outside of said specimen chamber for receiving the light having passed through said objective lens, said objective lens unit and said eyepiece unit mounted on said front cover; and (j) protection means comprising means for detecting a position of the specimen moving mechanism and means in response to an output from said detector means for preventing the electron beam from reaching the specimen position.