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US4529618A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of photolithographically treating a substrate

Assignee: US Philips Corp
•
Filing: 1983-10-03
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Granted: 1985-07-16
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Expires: 2003-10-03
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Abstract

Abstract The invention relates to a method of photolithographically treating a substrate, in which a surface of the substrate is treated at least at the area at which it consists of an inorganic material with an organosilicon compound. In order to improve the adhesion of a photolacquer layer to be applied, the organosilicon compound used is a 3-aminopropyl-trialkoxysilane in the form of an aqueous solution.

Inventors

  • 👤 Johannes J. Ponjee
  • 👤 Franciscus J. B. Smolders
  • 👤 Christiaan J. A. Verwijlen

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 20:34
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/075; G03F7/0751; Y; Y10; Y10S; Y10S430/00; Y10S430/136; Y10S438/00; Y10S438/942; Y10S438/948; Y10S438/974

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 127 words
A method of photolithographically treating a substrate, at least part of the surface area of which consists of an inorganic material, in which said surface of the substrate is treated, at least at the area at which the substrate consists of an inorganic material, with an organosilicon compound in order to improve the adhesion of a photolacquer layer to be applied, characterized in that the substrate is treated with an aqueous solution containing less than 30 g per liter of a 3-aminopropyltrialkoxysilane corresponding to the formula R.sup.2 NH(CH.sub.2).sub.3 Si(OR.sup.1).sub.3, in which R 1 is CH 3 or C 2 H 5 and R 2 =H, an alkyl group or (CH 2 ) m NHR 3 , where m=1, 2 or 3 and R 3 =H or alkyl.
Claim 2
Independent Claim 127 words
A method of photolithographically treating a substrate, at least part of the surface area of which consists of an inorganic material, in which said surface of the substrate is treated, at least at the area at which the substrate consists of an inorganic material, with an organosilicon compound in order to improve the adhesion of a photolacquer layer to be applied, characterized in that the substrate is treated with an aqueous solution containing less than 30 g per liter of a 3-aminopropyltrialkoxysilane corresponding to the formula R.sup.2 NH(CH.sub.2).sub.3 Si(OR.sup.1).sub.3, in which R 1 is CH 3 or C 2 H 5 and R 2 =H, an alkyl group or (CH 2 ) m NHR 3 , where m=1, 2 or 3 and R 3 =H or alkyl.
Claim 3
Dependent Claim 28 words
A method as claimed in claim 1, characterized in that in the aqueous solution at least 2.5 g of the 3-aminopropyltrialkoxysilane are dissolved in 1 liter of water.
Claim 4
Dependent Claim 17 words
A method as claimed in claim 2, characterized in that the organosilicon compound used is N-(2-amino ethyl)-3-aminopropyltrialkoxysilane.
Claim 5
Dependent Claim 17 words
A method as claimed in claim 2, characterized in that the organosilicon compound used is unsubstituted 3-aminopropyltrialkoxysilane.
Claim 6
Dependent Claim 43 words
A method as claimed in claim 1, characterized in that the substrate comprises at the area of the treated surface a substance belonging to the group consisting of silicon dioxide, silicon nitride, aluminum, monocrystalline silicon, polycrystalline silicon, indium oxide, tin oxide and glass.

References Cited (Backward Citations)

US3788895A Cited
US4103045A Cited
US3827908A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-07-15 1989-01-14 1989-07-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-07-15 1993-01-14 1993-07-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-07-15 1997-01-14 1997-07-16 $7700.00 Window Closed / Lapsed

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