Apparatus for controlling thermal transfer in a cyclic vacuum processing system

Claim 2

In a vacuum processing chamber which is vented during one portion of a cycle and is vacuum pumped to a low pressure during another portion of said cycle, apparatus for providing thermal transfer between a workpiece and a heat sink or source comprising: a workpiece mounting location including a platen against which said workpiece is sealed to define a thermal transfer region therebetween, said platen including a passage for gas flow between said chamber and said thermal transfer region and a conduit for circulation of a cooling fluid, said mounting location further including fluid-actuated valve means responsive to the pressure of said cooling fluid for controllably opening and closing said passage; and means for controlling the pressure of said cooling fluid such that said valve means is closed during vacuum pumping when the pressure in said chamber reaches a predetermined intermediate pressure, whereby gas at said intermediate pressure is trapped in said thermal transfer region during processing and conducts thermal energy between said workpiece and said platen.

Claim 3

The apparatus as defined in claim 1 wherein said control means includes means for sensing the pressure in said vacuum chamber and for providing a control signal when said chamber reaches said intermediate pressure.

Claim 4

The apparatus as defined in claim 2 wherein said control means further includes means responsive to said control signal for varying the pressure of said cooling fluid.

Claim 5

The apparatus as defined in claim 3 wherein said means responsive to said control signal includes a valve for controlling the flow of said cooling fluid.

Claim 6

The apparatus as defined in claim 1 wherein said fluid-actuated valve includes a flexible member which isolates said cooling fluid conduit from said gas passage and transmits motion for controlling said fluid-actuated valve.

Claim 7

The apparatus as defined in claim 1 wherein said fluid-actuated valve includes a movable plunger for sealing said gas passage.

Claim 8

The apparatus as defined in claim 1 wherein said vacuum processing chamber is an ion implantation chamber and said workpiece is a semiconductor wafer.

Claim 9

The apparatus as defined in claim 7 wherein a plurality of said workpiece mounting locations are positioned on a movable workpiece support and said cooling fluid is circulated to each of said locations.

Claim 10

The apparatus as defined in claim 8 wherein said workpiece support comprises a disc adapted for rotation about a central axis.

Claim 11

Apparatus for providing thermal transfer with semiconductor wafers in an ion implantation system including a vacuum chamber which is vented during one portion of an operating cycle and is vacuum pumped to a low pressure during another portion of said cycle, said apparatus comprising: a wafer support adapted for movement relative to an ion beam and having locations for mounting a plurality of semiconductor wafers, said wafer support being provided with a conduit for circulation of a cooling fluid to each of said locations, each of said locations including a platen against which a wafer is sealed to define a thermal transfer region therebetween, a passage providing gas flow between said thermal transfer region and said chamber, and fluid-actuated valve means responsive to said cooling fluid for controllably opening and closing said passage; means for controlling said cooling fluid such that each of said valve means is closed during vacuum pumping when the pressure in said chamber reaches a predetermined intermediate pressure; and means for circulating and cooling said cooling fluid, whereby gas at said intermediate pressure is trapped in said thermal transfer region during ion implantation and conducts thermal energy between said wafer and said platen.

Claim 12

Apparatus for providing thermal transfer with semiconductor wafers in an ion implantation system including a vacuum chamber which is vented during one portion of an operating cycle and is vacuum pumped to a low pressure during another portion of said cycle, said apparatus comprising: a wafer support adapted for movement relative to an ion beam and having locations for mounting a plurality of semiconductor wafers, said wafer support being provided with a conduit for circulation of a cooling fluid to each of said locations, each of said locations including a platen against which a wafer is sealed to define a thermal transfer region therebetween, a passage providing gas flow between said thermal transfer region and said chamber, and fluid-actuated valve means responsive to said cooling fluid for controllably opening and closing said passage; means for controlling said cooling fluid such that each of said valve means is closed during vacuum pumping when the pressure in said chamber reaches a predetermined intermediate pressure; and means for circulating and cooling said cooling fluid, whereby gas at said intermediate pressure is trapped in said thermal transfer region during ion implantation and conducts thermal energy between said wafer and said platen.

Claim 13

The apparatus as defined in claim 10 wherein said fluid-actuated valve includes a flexible member which isolates said cooling fluid conduit from said passage in said platen and transmits motion for controlling said fluid-actuated valve.

Claim 14

The apparatus as defined in claim 11 wherein said fluid-actuated valve includes means for opening upon reduction of the pressure of said cooling fluid below a prescribed value.

Claim 15

The apparatus as defined in claim 11 wherein said flexible member comprises a metal diaphragm.

Claim 16

The apparatus as defined in claim 11 wherein said flexible member comprises a bellows.

Claim 17

The apparatus as defined in claim 10 wherein said control means includes means for sensing the pressure in said vacuum chamber and for providing a control signal when said chamber reaches said intermediate pressure.

Claim 18

The apparatus as defined in claim 15 wherein said control means further includes means responsive to said control signal for varying the pressure of said cooling fluid.

Claim 19

The apparatus as defined in claim 16 wherein said means responsive to said control signal includes a valve for controlling the flow of said cooling fluid.

Claim 20

The apparatus as defined in claim 10 wherein said fluid-actuated valve includes a movable plunger for sealing said passage.

Claim 21

The apparatus as defined in claim 10 wherein said wafer support comprises a disc adapted for rotation about a central axis.

Claim 22

The apparatus as defined in claim 19 wherein each of said platens includes a surface with a convex contour for contacting said wafer.

Claim 23

The apparatus as defined in claim 20 wherein said intermediate pressure is in the range of 0.5 to 100 Torr.

Claim 24

The apparatus as defined in claim 10 wherein said passage runs from said thermal transfer region to the backside of said platen and said fluid-actuated valve means is mounted in said platen.