Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
201 words
A semiconductor device, comprising: an insulating substrate; a first semiconductor region of a first conductive type formed on said insulating substrate and comprising a conductive bit line; A second semiconductor region of the first conductive type formed on said insulating substrate and operatively connected to a power supply; a third semiconductor region of a second and opposite conductive type formed on said insulating substrate and situated between said first and second semiconductor regions; an insulating layer formed on said first, second and third semiconductor regions, said insulating layer having first and second thicknesses, said second thickness being thinner than said first thickness, said first thickness being associated with said first and second semiconductor regions, and said second thickness being associated with said third semiconductor region; and metal wiring comprising a word line formed on said insulating layer, said first and second semiconductor regions being aligned in parallel with each other, said metal wiring being aligned perpendicular to the direction in which said first and second semiconductor regions are aligned and said third semiconductor region being positioned directly under only said metal wiring, thereby providing self-aligned holes adjacent laterally to said third semiconductor region in a direction perpendicular to said metal wiring.
Claim 2
Dependent Claim
201 words
A semiconductor device, comprising: an insulating substrate; a first semiconductor region of a first conductive type formed on said insulating substrate and comprising a conductive bit line; A second semiconductor region of the first conductive type formed on said insulating substrate and operatively connected to a power supply; a third semiconductor region of a second and opposite conductive type formed on said insulating substrate and situated between said first and second semiconductor regions; an insulating layer formed on said first, second and third semiconductor regions, said insulating layer having first and second thicknesses, said second thickness being thinner than said first thickness, said first thickness being associated with said first and second semiconductor regions, and said second thickness being associated with said third semiconductor region; and metal wiring comprising a word line formed on said insulating layer, said first and second semiconductor regions being aligned in parallel with each other, said metal wiring being aligned perpendicular to the direction in which said first and second semiconductor regions are aligned and said third semiconductor region being positioned directly under only said metal wiring, thereby providing self-aligned holes adjacent laterally to said third semiconductor region in a direction perpendicular to said metal wiring.
Claim 3
Dependent Claim
23 words
A semiconductor device according to claim 1, wherein said insulating substrate is selected from the group consisting of sapphire, gallium-arsenide, spinel and silicon-dioxide.
Claim 4
Dependent Claim
25 words
A semiconductor device according to claim 1 or 2, wherein said metal wiring is selected from the group consisting of aluminum, molybdenum, tungsten and silicide.
Claim 5
Dependent Claim
112 words
A semiconductor device according to claim 1, further comprising: a fourth semiconductor region of the second conductive type formed on said insulating substrate and adjacent to said second semiconductor region; and a fifth semiconductor region of the first conductive type formed on said insulating substrate and adjacent to said fourth semiconductor region and comprising a conductive bit line, said fifth semiconductor region being aligned parallel with said first and second semiconductor regions, and said fourth semiconductor region being aligned under said metal wiring, said first, second and third semiconductor regions forming a first charge pumped memory cell and said second, fourth and fifth semiconductor regions forming a second charge pumped memory cell.
Claim 6
Dependent Claim
22 words
A semiconductor device according to claim 1, wherein said first thickness is approximately 0.6μ and said second thickness is approximately 500 Å.
Claim 7
Dependent Claim
15 words
A semiconductor device according to claim 1, wherein said insulating layer comprises only silicon dioxide.
Claim 8
Dependent Claim
28 words
A semiconductor device according to claim 1, wherein said first and second semiconductor regions are continuous and said third semiconductor region is discontinuous due to the self-aligned holes.