Patent US4521687A successfully refreshed from Google Patents.
US4521687A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Mass spectrometer
Assignee: Jeol Ltd
•
Filing: 1983-01-17
•
Granted: 1985-06-04
•
Expires: 2003-01-17
Abstract
Abstract A mass spectrometer and process for using same comprises an ion source, a first field, a second field and a field-free region between the first and second fields. Parent ions are mass-selected by said first field and daughter ions are formed in the field-free region by ion dissociation or ion fragmentation. The daughter ions are dispersed by the second field. Superimposed electric and magnetic fields are used as the second field, the intensity of said magnetic field being changed from a first stage to a second stage and the intensity of said electric field being swept under both stages. Both energy and mass of the daughter ions can be measured by this mass spectrometer.
Inventors
- 👤 Motohiro Naito
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 23:12
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/32; H01J49/02; H01J49/022
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
95 words
A mass spectrometer comprising an ion source, means for selecting ions produced and accelerated by said ion source according to their mass to charge ratio, a field-free region in which a part of the massselected parent ions form daughter ions, means for creating superimposed electric and magnetic fields at right angles through which parent and daughter ions passed through said field-free region pass, means for charging the intensity of said magnetic field from a first level to a second level, and means for sweeping the intensity of said electric field at both magnetic intensity levels.
Claim 2
Dependent Claim
95 words
A mass spectrometer comprising an ion source, means for selecting ions produced and accelerated by said ion source according to their mass to charge ratio, a field-free region in which a part of the massselected parent ions form daughter ions, means for creating superimposed electric and magnetic fields at right angles through which parent and daughter ions passed through said field-free region pass, means for charging the intensity of said magnetic field from a first level to a second level, and means for sweeping the intensity of said electric field at both magnetic intensity levels.
Claim 3
Dependent Claim
19 words
A mass spectrometer according to claim 1 wherein one of said two levels of magnetic field intensity is zero.
Claim 4
Dependent Claim
26 words
A mass spectrometer according to claim 1 wherein a collision chamber is arranged in said field-free region and inert gas being fed into said collision chamber.
Claim 5
Dependent Claim
110 words
A process for measuring the kinetic energy and mass of daughter ions with a mass spectrometer comprising an ion source, means for selecting ions produced and accelerated by said ion source according to their mass to charge ratio, a field-free region in which a part of the massselected parent ions form daughter ions, means for creating superimposed electric and magnetic fields at right angles through which parent and daughter ions passed through said field-free region pass, comprising the steps for changing the intensity of said magnetic field from a first level to a second level and step for sweeping the intensity of said electric field at both magnetic intensity levels.
Claim 6
Dependent Claim
110 words
A process for measuring the kinetic energy and mass of daughter ions with a mass spectrometer comprising an ion source, means for selecting ions produced and accelerated by said ion source according to their mass to charge ratio, a field-free region in which a part of the massselected parent ions form daughter ions, means for creating superimposed electric and magnetic fields at right angles through which parent and daughter ions passed through said field-free region pass, comprising the steps for changing the intensity of said magnetic field from a first level to a second level and step for sweeping the intensity of said electric field at both magnetic intensity levels.
Claim 7
Dependent Claim
17 words
A process according to claim 4 wherein one of said levels of magnetic field intensity is zero.
Claim 8
Dependent Claim
142 words
A process according to claim 4 comprising the steps for (a) establishing a mass scale with the data gathered under the first level, (b) determining the m/e ratio m o of the parent ions according to said mass scale, (c) obtaining the electric field voltage Vd 1 at which the daughter ions are detected, (d) determining with the data gathered under the second level the virtual m/e ratio of the parent ions M xo according to said mass scale, (e) determining the virtual m/e ratio of the daugher ions M x1 according to said mass scale, (f) determining the value of A according to the equation m.sub.o /M.sub.xo =A.sup.2 (g) determining the value of K according to the equation M.sub.x1 =M.sub.oo /[1-(1-A)K-AVd.sub.1 /V.sub.oo ].sup.2, and (h) determining the value of m 1 according to the equation m.sub.1 /K=m.sub.o =M.sub.oo /k.sup.2 (1-Vd.sub.1 /KV.sub.oo).sup.2.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-06-03 | 1988-12-03 | 1989-06-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-06-03 | 1992-12-03 | 1993-06-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-06-03 | 1996-12-03 | 1997-06-04 | $7700.00 | Window Closed / Lapsed |