Abstract In a scanning transmission electron microscope 1 the image of the diffraction pattern formed on a phosphor screen 6 as a result of electron beam impingement on a point on the specimen 4 is converted by a camera 7 into a video signal and digitized in an ADC convertor 9 and stored in a digital store 10. The stored signal is then modified by a weighting factor representing a notional pattern overlaying screen 6. The weighting factor may have one of two binary values, representing a notional opaque and transparent pattern, or may have a multiplicity of different values. The modified signals are then added together to provide a picture value for the point of impingement. By this means a complete picture is built up point-by-point. To speed up the picture taking operation diffraction images from different points may be displayed on different parts of screen 6 so that several images can be scanned together by camera 7.
A scanning transmission electron microscope including means for obtaining a video signal representing the image of a diffraction pattern derived from electron beam impingement on a point in a specimen, means for converting the video signal into digital form, a digital store for storing a plurality of digital values each representing a picture point in the said image modified by a weighting factor representing a notional pattern overlaying the screen, and means for integrating all the modified values to provide a picture value for the point of impingement of the electron beam.
Claim 2
Dependent Claim
92 words
A scanning transmission electron microscope including means for obtaining a video signal representing the image of a diffraction pattern derived from electron beam impingement on a point in a specimen, means for converting the video signal into digital form, a digital store for storing a plurality of digital values each representing a picture point in the said image modified by a weighting factor representing a notional pattern overlaying the screen, and means for integrating all the modified values to provide a picture value for the point of impingement of the electron beam.
Claim 3
Dependent Claim
35 words
A microscope as claimed in claim 1 and including means for causing the electron beam to scan successive points in the specimen to enable a complete picture of a specimen to be built up point-by-point.
Claim 4
Dependent Claim
36 words
A microscope as claimed in claim 1 in which the diffraction pattern in projected onto a phosphor screen and a scanning camera is provided to scan the screen for the purpose of obtaining the video signal.
Claim 5
Dependent Claim
42 words
A microscope as claimed in claim 3 in which the diffraction pattern from a point of impingement is projected to part only of the phosphor screen and patterns from different points of the specimen and formed on different parts of the screen.
Claim 6
Dependent Claim
18 words
A microscope as claimed in claim 1 in which the weighting factor has a plurality of different values.
Claim 7
Dependent Claim
16 words
A microscope as claimed in claim 5 in which the weighting factor has two possible values.