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Process for the production of a multicomponent thin film

Assignee: National Institute of Advanced Industrial Science and Technology
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Filing: 1984-03-29
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Granted: 1985-01-29
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Expires: 2004-03-29
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Abstract

Abstract A multicomponent amorphous silicon film suitable for a solar cell is produced at a higher deposition rate by a novel process comprising using jointly a sputtering method and a plasma CVD method within a pressure range of not lower than a pressure at which the maximum film formation rate is given in the sputtering method.

Inventors

  • 👤 Hajime Hitotsuyanagi
  • 👤 Nobuhiko Fujita
  • 👤 Hideo Itozaki
  • 👤 Hiromu Kawai

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 22:08
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/0021; C23C14/0036; C23C14/0057; C23C14/22; C23C14/34; C23C16/00; C23C16/44; C23C16/50; C23C16/505; C23C16/509; C23C16/5096; H; H10; H10D; H10D62/00; H10D62/40; H10D62/402; H10D62/80; H10D62/83; H10P; H10P14/00; H10P14/20; H10P14/22; H10P14/24; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3414; H10P14/3422; H10P14/3438; H10P14/3441; H10P14/3442; H10P14/3444

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 44 words
A process for the production of a multicomponent thin film, characterized by using jointly a sputtering method and a plasma CVD method at a pressure of not lower than a pressure capable of giving the maximum rate of film formation in the sputtering method.
Claim 2
Dependent Claim 44 words
A process for the production of a multicomponent thin film, characterized by using jointly a sputtering method and a plasma CVD method at a pressure of not lower than a pressure capable of giving the maximum rate of film formation in the sputtering method.
Claim 3
Dependent Claim 16 words
The process of claim 1, wherein a magnetron sputtering method is used as the sputtering method.
Claim 4
Dependent Claim 18 words
The process of claim 1, wherein the thin film consists of an amorphous material containing at least silicon.
Claim 5
Dependent Claim 29 words
The process of claim 3, wherein the thin film consisting of the silicon-containing amorphous material is formed by the use of a silicon-containing compound gas and a rare gas.
Claim 6
Dependent Claim 20 words
The process of claim 3, wherein the thin film consisting of the silicon-containing amorphous material is formed by sputtering silicon.
Claim 7
Dependent Claim 10 words
The process of claim 5, wherein the silicon is doped.
Claim 8
Dependent Claim 25 words
The process of claim 3, wherein the thin film consisting of the silicon-containing amorphous material is formed by sputtering at least one dopant or modifier.
Claim 9
Dependent Claim 20 words
The process of claim 7, wherein the modifier is selected from the group consisting of carbon, germanium, tin and lead.
Claim 10
Dependent Claim 29 words
The process of claim 2, wherein the magnetron sputtering method is carried out with a magnetic flux density of at least 50 gauss on the surface of a target.
Claim 11
Dependent Claim 31 words
The process of claim 1, wherein a raw material gas containing at least one of monosilane and silicon tetrafluoride, diluted with at least one of hydrogen, helium and argon is used.
Claim 12
Dependent Claim 27 words
The process of claim 1, wherein at least one selected from the group consisting of carbon, silicon, germanium, tin and lead is used as a target material.
Claim 13
Dependent Claim 18 words
The process of claim 1, wherein the pressure is in the range of 5×10 -3 to 1 Torr.
Claim 14
Dependent Claim 16 words
The process of claim 2, wherein the magnetron sputtering method is carried out using an electromagnet.
Claim 15
Dependent Claim 17 words
The process of claim 2, wherein the magnetron sputtering method is carried out using a permanent magnet.
Claim 16
Dependent Claim 20 words
The process of claim 7, wherein the dopant is selected from the group consisting of boron, aluminum, phosphorus and arsenic.

References Cited (Backward Citations)

US3485666A Cited
US3991229A Cited
US4058638A Cited
US4056642A Cited
US4234622A Cited
US4452828A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-01-29 1988-07-30 1989-01-29 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-01-29 1992-07-30 1993-01-29 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-01-29 1996-07-30 1997-01-29 $7700.00 Window Closed / Lapsed

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