Patent US2462933A successfully refreshed from Google Patents.
Patent US4489241A successfully refreshed from Google Patents.
US4489241A
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Exposure method with electron beam exposure apparatus
Assignee: Hitachi Ltd
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Filing: 1982-06-09
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Granted: 1984-12-18
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Expires: 2002-06-09
Abstract
Abstract An exposure method with an electron beam exposure apparatus in which an electron beam is emitted onto a substrate such as a silicon wafer on which an electron-beam sensitive resist is coated, thereby directly forming or writing patterns. A substrate having thereon a number of chips are divided into blocks, which each contain a plurality of chips. Marks are provided on each of the blocks, the positions of the marks are detected and the writing exposure positions of the chips within each block are modified on the basis of the detection results. According to this invention, efficient writing exposure can be made with high accuracy.
Inventors
- 👤 Tadahito Matsuda
- 👤 Tsuneo Okubo
- 👤 Susumu Ozasa
- 👤 Norio Saitou
- 👤 Haruo Yoda
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 10:35
CPC Classifications
H; H10; H10W; H10W46/00; H01; H01J; H01J37/00; H01J37/30; H01J37/304; H01J37/3045; H10P; H10P76/00; H10P76/20; H10P76/204; H10P76/2045; H10P95/00; H10W46/501
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
103 words
An exposure method with an electron beam exposure apparatus comprising steps of: dividing in advance a substrate having thereon a number of chips into blocks each having a plurality of chips; providing marks on each of said blocks but not on each of said chips; detecting the positions of the marks provided on said blocks upon exposing a desired block; and correcting writing exposure positions of the plurality of chips within each of said blocks on the basis of the detection results so that correction for said plurality of chips can be accomplished without having to provide marks for each of said chips.
Claim 2
Dependent Claim
103 words
An exposure method with an electron beam exposure apparatus comprising steps of: dividing in advance a substrate having thereon a number of chips into blocks each having a plurality of chips; providing marks on each of said blocks but not on each of said chips; detecting the positions of the marks provided on said blocks upon exposing a desired block; and correcting writing exposure positions of the plurality of chips within each of said blocks on the basis of the detection results so that correction for said plurality of chips can be accomplished without having to provide marks for each of said chips.
Claim 3
Dependent Claim
19 words
An exposure method according to claim 1, wherein said marks are provided on the four corners of each block.
Claim 4
Dependent Claim
24 words
An exposure method according to claim 1 or 2, wherein each of said blocks has its sides of no greater than 20 mm each.
Claim 5
Dependent Claim
57 words
An exposure method according to claim 1 or 2, wherein each of said chips is divided into a plurality of fields, and further wherein the corresponding fields of all the chips within a desired one of said blocks are all exposed in sequence before exposure of the next corresponding fields of all of the chips is begun.
Claim 6
Dependent Claim
45 words
An exposure method according to claim 1 or 2, further comprising steps of detecting in advance the height of each mark put on a desired one of said blocks, and modifying a writing exposure reference plane of said block in accordance with the detection results.
Claim 7
Dependent Claim
55 words
An exposure method according to claim 3, wherein each of said chips is divided into a plurality of fields, and further wherein the corresponding fields of all the chips within a desired one of said blocks are all exposed in sequence before exposure of the next corresponding fields of all of the chips is begun.
Claim 8
Dependent Claim
43 words
An exposure method according to claim 3, further comprising steps of detecting in advance the height of each mark put on a desired one of said blocks, and modifying a writing exposure reference plane of said block in accordance with the detection results.
Claim 9
Dependent Claim
22 words
An exposure method according to claim 1, wherein said marks are provided only along an outer periphery of each of said blocks.
Claim 10
Dependent Claim
26 words
An exposure method according to claim 8, wherein at least some of said marks are provided at one or more corners of each of said blocks.
Claim 11
Dependent Claim
31 words
An exposure method according to claim 1, 2, 8 or 9, wherein the number of marks for each block is less than the number of said chips in each respective block.
Claim 12
Dependent Claim
15 words
An exposure method according to claim 1 or 2, wherein each block comprises nine chips.
Claim 13
Dependent Claim
15 words
An exposure method according to claim 1 or 2, wherein each block comprises sixteen chips.
Claim 14
Dependent Claim
122 words
An exposure method with an electron beam exposure apparatus comprising steps of: dividing in advance a substrate having thereon a number of chips into blocks having a plurality of chips; providing marks on each of said blocks; detecting the positions of the marks provided on said blocks upon exposing a desired block; and correcting writing exposure positions of the plurality of chips within each of said blocks on the basis of the detection results, wherein each of said chips is divided into a plurality of fields, and further wherein the corresponding fields of all the chips within a desired one of said blocks are all exposed in sequence before exposure of the next corresponding fields of all of the chips is begun.
Claim 15
Dependent Claim
122 words
An exposure method with an electron beam exposure apparatus comprising steps of: dividing in advance a substrate having thereon a number of chips into blocks having a plurality of chips; providing marks on each of said blocks; detecting the positions of the marks provided on said blocks upon exposing a desired block; and correcting writing exposure positions of the plurality of chips within each of said blocks on the basis of the detection results, wherein each of said chips is divided into a plurality of fields, and further wherein the corresponding fields of all the chips within a desired one of said blocks are all exposed in sequence before exposure of the next corresponding fields of all of the chips is begun.
References Cited (Backward Citations)
US4322626A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-12-18 | 1988-06-18 | 1988-12-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-12-18 | 1992-06-18 | 1992-12-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-12-18 | 1996-06-18 | 1996-12-18 | $7700.00 | Window Closed / Lapsed |