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US4488267A Expired / Lapsed US ⏱️ 0.0 years remaining

Integrated circuit chips with removable drivers and/or buffers

Assignee: Nokia Bell Labs
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Filing: 1982-05-24
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Granted: 1984-12-11
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Expires: 2002-05-24
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Abstract

Abstract The organization of a frame portion of an integrated circuit chip to include buffers and drivers as well as a power supply for testing functional elements arranged in a "framed" portion of the chip permits smaller drivers and buffers and a lower power supply to be used during later normal operation. The frame portion may be separated completely after testing.

Inventors

  • 👤 Marc L. Harrison

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 21:02
CPC Classifications
H; H10; H10P; H10P74/00; H10P74/27; H10P74/277; G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2884; G11; G11C; G11C5/00; G11C5/02; G11C5/025

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 106 words
An integrated circuit chip comprising at least first and second areas, means for defining a plurality of electrical circuit function blocks in said first area, means for defining a first set of pads and associated first electrical interface circuits in said first area for providing electrical access to said function blocks, means for defining a second set of pads and associate second electrical interface circuits in said second area, electrical conducting paths connected between said first set of pads and associated ones of said second electrical interface circuits in a manner to provide electrical access from associated ones of said second pads to said function blocks.
Claim 2
Dependent Claim 106 words
An integrated circuit chip comprising at least first and second areas, means for defining a plurality of electrical circuit function blocks in said first area, means for defining a first set of pads and associated first electrical interface circuits in said first area for providing electrical access to said function blocks, means for defining a second set of pads and associate second electrical interface circuits in said second area, electrical conducting paths connected between said first set of pads and associated ones of said second electrical interface circuits in a manner to provide electrical access from associated ones of said second pads to said function blocks.
Claim 3
Dependent Claim 29 words
An integrated circuit chip in accordance with claim 1 wherein said second electrical interface circuits comprise electrical characteristics different from the corresponding ones of said first electrical interface circuits.
Claim 4
Dependent Claim 23 words
An integrated circuit chip in accordance with claim 2 wherein each of said first and second electrical interface circuits comprise buffers and drivers.
Claim 5
Dependent Claim 39 words
An integrated semiconductor chip in accordance with claim 2 wherein said first area defines at least a partial frame encompassing said second area and said pads included in said second area are arranged about the periphery of that area.
Claim 6
Dependent Claim 125 words
An integrated semiconductor chip including means for defining first, second, third . . . n-mth, n-m+1th, . . . nth functions therein, said first through said n-mth functions being necessary for operation as a fully functional device when interconnected with other chips, said n-m+1th through said nth functions being necessary solely for testing wherein said chip includes at least first and second areas, said first area including said n-m+1th through said nth functions, said second area including said 1th through said n-mth functions, wherein each of said first and second areas include bonding pads arranged about the periphery thereof, and a pattern of fine line, electrically-conducting connections between said pads of said first area and said means for defining said 1th through said n-mth functions.
Claim 7
Dependent Claim 125 words
An integrated semiconductor chip including means for defining first, second, third . . . n-mth, n-m+1th, . . . nth functions therein, said first through said n-mth functions being necessary for operation as a fully functional device when interconnected with other chips, said n-m+1th through said nth functions being necessary solely for testing wherein said chip includes at least first and second areas, said first area including said n-m+1th through said nth functions, said second area including said 1th through said n-mth functions, wherein each of said first and second areas include bonding pads arranged about the periphery thereof, and a pattern of fine line, electrically-conducting connections between said pads of said first area and said means for defining said 1th through said n-mth functions.
Claim 8
Dependent Claim 20 words
An integrated semiconductor chip in accordance with claim 5 wherein said first area includes output drivers and a power supply.
Claim 9
Dependent Claim 15 words
An integrated semiconductor chip in accordance with claim 2 wherein said electrically-conducting paths are cut.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1987-12-11 1988-06-11 1988-12-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1991-12-11 1992-06-11 1992-12-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1995-12-11 1996-06-11 1996-12-11 $7700.00 Window Closed / Lapsed

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