US4474831A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for reflow of phosphosilicate glass
Assignee: Varian Semiconductor Equipment Associates Inc
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Filing: 1982-08-27
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Granted: 1984-10-02
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Expires: 2002-08-27
Abstract
Abstract In a method for reflow of a phosphosilicate glass (PSG) layer applied to a semiconductor wafer, the wafer is placed in a processing chamber in parallel alignment with a planar blackbody source. The chamber is evacuated, and the source rapidly and uniformly heats the PSG layer to a temperature at which plastic flow occurs. The blackbody source provides significant radiation in the 7-10 micron portion of the infrared spectrum. The thermal treatment is typically completed in 8-15 seconds, thereby avoiding impurity redistribution in the semiconductor device.
Inventors
- 👤 Daniel F. Downey
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 17:50
CPC Classifications
H; H10; H10P; H10P95/00
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
118 words
A method for producing plastic flow of a glass layer applied to a surface of a semiconductor wafer, said method comprising the steps of: introducing said wafer with said glass layer into a processing chamber; reducing the pressure in said processing chamber to the range between 10 -3 Torr and 10 -7 Torr; and exposing said wafer with said glass layer in said chamber to a blackbody source having a constant planar energy flux characteristic, having substantial radiation in an absorption band of said glass layer and having a temperature in the range between 1000° C. and 1500° C. for a time between 5 and 60 seconds, said wafer being positioned in essentially parallel alignment with said source.
Claim 2
Independent Claim
118 words
A method for producing plastic flow of a glass layer applied to a surface of a semiconductor wafer, said method comprising the steps of: introducing said wafer with said glass layer into a processing chamber; reducing the pressure in said processing chamber to the range between 10 -3 Torr and 10 -7 Torr; and exposing said wafer with said glass layer in said chamber to a blackbody source having a constant planar energy flux characteristic, having substantial radiation in an absorption band of said glass layer and having a temperature in the range between 1000° C. and 1500° C. for a time between 5 and 60 seconds, said wafer being positioned in essentially parallel alignment with said source.
Claim 3
Dependent Claim
32 words
The method as defined in claim 1 wherein said glass layer is a phosphosilicate glass layer and said blackbody sourse provides substantial radiation in the spectral range between 7 and 10 microns.
Claim 4
Dependent Claim
34 words
The method as defined in claim 2 further including, after said step of exposing said wafer, the step of cooling said wafer with said phosphosilicate glass layer in said processing chamber by radiative cooling.
Claim 5
Dependent Claim
44 words
The method as defined in claim 3 wherein said blackbody source has a temperature in the range between 1100° C. and 1450° C. and said wafer with said glass layer is exposed to said blackbody source for a time between 8 and 35 seconds.
Claim 6
Dependent Claim
41 words
The method as defined in claim 1 further including the step of adjusting the spectral distribution of said blackbody source so as to substantially balance the heating rates of said glass layer and said semiconductor wafer whereby thermal stress is avoided.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-10-02 | 1988-04-02 | 1988-10-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-10-02 | 1992-04-02 | 1992-10-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-10-02 | 1996-04-02 | 1996-10-02 | $7700.00 | Window Closed / Lapsed |