US4455738A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Self-aligned gate method for making MESFET semiconductor
Assignee: Texas Instruments Inc
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Filing: 1981-12-24
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Granted: 1984-06-26
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Expires: 2001-12-24
Abstract
Abstract A MESFET is fabricated using a self-aligned gate process. This process uses a vertical (anisotropic) etch to self-align the gate and source/drain. The vertical etch, in conjunction with a two-level insulator, creates a barrier between the gate and source/drain, so that when metal is deposited and reacted, and any excess removed, the gate is self-aligned with the source/drain, and contacts to the source/drain and gate are well isolated. The alignment obtained by this process is advantageous in that series channel resistance is reduced, and a more compact structure is attained for improvement in packing density.
Inventors
- 👤 Theodore W. Houston
- 👤 Al F. Tasch, Jr.
- 👤 Henry M. Darley
- 👤 Horng S. Fu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 06:28
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/061; H10D30/0612; H10D30/0616; H10D62/00; H10D62/80; H10D62/83; H10P; H10P76/00; H10P76/40
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
187 words
A method for fabrication of a MESFET device in which the gate is self-aligned in relation to the source/drain regions, comprising the steps of: providing a first-conductivity-type region on a silicon substrate; depositing on said first-type region first insulator material to define the gate area of said MESFET device, said first insulator being processed to form approximately vertical walls, said processed first insulator covering only that portion of the channel region which will underlie the gate; depositing a layer of second insulator material on the substrate and on the first insulator material; etching anisotropically to remove said second insulator material, except for a filament section adjacent to said vertical walls of said first insulator material region; introducing a first-type impurity to create highly doped first-type source and drain regions; removing said first insulator material leaving only said filament sections of second insulator material; depositing a layer of metal overall; heat treating the structure to convert said metal in contact with said substrate to a metal silicide to create gate, source and drain contacts; removing said metal not in contact with said substrate and not converted to silicide.
Claim 2
Independent Claim
187 words
A method for fabrication of a MESFET device in which the gate is self-aligned in relation to the source/drain regions, comprising the steps of: providing a first-conductivity-type region on a silicon substrate; depositing on said first-type region first insulator material to define the gate area of said MESFET device, said first insulator being processed to form approximately vertical walls, said processed first insulator covering only that portion of the channel region which will underlie the gate; depositing a layer of second insulator material on the substrate and on the first insulator material; etching anisotropically to remove said second insulator material, except for a filament section adjacent to said vertical walls of said first insulator material region; introducing a first-type impurity to create highly doped first-type source and drain regions; removing said first insulator material leaving only said filament sections of second insulator material; depositing a layer of metal overall; heat treating the structure to convert said metal in contact with said substrate to a metal silicide to create gate, source and drain contacts; removing said metal not in contact with said substrate and not converted to silicide.
Claim 3
Dependent Claim
11 words
A method as in claim 1, wherein said metal is platinum.
Claim 4
Dependent Claim
20 words
A method as in claim 1, wherein said first insulator is silicon nitride and said second insulator is silicon dioxide.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-06-26 | 1987-12-26 | 1988-06-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-06-26 | 1991-12-26 | 1992-06-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-06-26 | 1995-12-26 | 1996-06-26 | $7700.00 | Window Closed / Lapsed |